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公开(公告)号:DE69125231D1
公开(公告)日:1997-04-24
申请号:DE69125231
申请日:1991-09-04
Applicant: CANON KK
Inventor: YOSHII MINORU , SAITOH KENJI , SUDA SHIGEYUKI , ABE NAOTO
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公开(公告)号:DE69207657T2
公开(公告)日:1996-10-17
申请号:DE69207657
申请日:1992-07-09
Applicant: CANON KK
Inventor: MATSUMOTO TAKAHIRO , YOSHII MINORU , SAITO KENJI , NOSE HIROYASU , SENTOKU KOICHI , TAKEUCHI SEIJI
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公开(公告)号:DE69211086D1
公开(公告)日:1996-07-04
申请号:DE69211086
申请日:1992-10-02
Applicant: CANON KK
Inventor: TAKEUCHI SEIJI , NISHIMURA TETSUHARU , YOSHII MINORU , NOSE HIROYASU , ISHIZUKA KOH
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公开(公告)号:DE68925142T2
公开(公告)日:1996-06-13
申请号:DE68925142
申请日:1989-02-16
Applicant: CANON KK
Inventor: SAITOH KENJI , MATSUGU MASAKAZU , SUDA SHIGEYUKI , NIWA YUKICHI , KURODA RYO , NOSE NORIYUKI , YOSHII MINORU , ABE NAOTO , OHWADA MITSUTOSHI
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公开(公告)号:CA2078731A1
公开(公告)日:1993-03-28
申请号:CA2078731
申请日:1992-09-21
Applicant: CANON KK
Inventor: NOSE NORIYUKI , YOSHII MINORU , SAITOH KENJI , OSAWA HIROSHI , SENTOKU KOICHI , TSUJI TOSHIHIKO , MATSUMOTO TAKAHIRO
IPC: H01L21/027 , G03F7/20 , G03F9/00 , G01B9/02
Abstract: A device and method for measuring the positional deviation between a plurality of diffraction gratings (2a,2b) formed on the same object (1) include an illumination optical system (3,6,20,21) for illuminating the plurality of diffraction gratings with a light beam, the illumination by the optical system generating a plurality of diffracted light beams from the plurality of diffraction gratings, an interference optical system (22,23,10) for forming at least one interference light beam from the plurality of diffracted light beams, a detector (12,14) for detecting the at least one interference light beam, the result of the detection serving as the basis for measuring the positional deviation between the plurality of diffraction gratings, and a measuring portion (31-33,41-44) for measuring the relative positional relation between the illumination optical system and the plurality of diffraction gratings.
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公开(公告)号:CA2078726A1
公开(公告)日:1993-03-28
申请号:CA2078726
申请日:1992-09-21
Applicant: CANON KK
Inventor: MATSUMOTO TAKAHIRO , NOSE NORIYUKI , YOSHII MINORU , SAITOH KENJI , HASEGAWA MASANOBU , SENTOKU KOICHI
IPC: G03F7/20 , G03F9/00 , H01L21/027 , H01L21/30 , G01B9/00
Abstract: A position detector includes a diffraction grating provided on the surface of an object, an illumination system for illuminating the diffraction grating, a detection system for detecting diffracted light diffracted from the diffraction grating, and a processing system for detecting positional information relating to the object, The illumination system emits a first pair of beams which are diffracted by the diffraction grating and interfere with each other, and emits a second pair of beams which are diffracted by the diffraction grating and also interfere with each other. The first pair of beams are incident upon the diffraction grating along a plane extending in a first direction in which the diffraction grating extends. The second pair of beams are incident upon the diffraction grating along a plane extending in a second direction in which the diffraction grating extends. The first and second directions are different from a grating line direction. The detection system detects the interfering light and generates first and second beat signals therefrom. The processing system detects positional information with respect to the first direction from the phase state of the first beat signal and with respect to the second direction from the phase state of the second beat signal.
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公开(公告)号:GB2241780B
公开(公告)日:1992-01-15
申请号:GB9104933
申请日:1991-03-08
Applicant: CANON KK
Inventor: NOSE NORIYUKI , YOSHII MINORU , NIWA YUKICHI , KURODA RYO
IPC: G01D5/38
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公开(公告)号:CA2039257A1
公开(公告)日:1991-09-28
申请号:CA2039257
申请日:1991-03-27
Applicant: CANON KK
Inventor: NOSE NORIYUKI , SAITOH KENJI , SENTOKU KOICHI , YOSHII MINORU
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公开(公告)号:FR2615281A1
公开(公告)日:1988-11-18
申请号:FR8806317
申请日:1988-05-10
Applicant: CANON KK
Inventor: NOSE NORIYUKI , YOSHII MINORU , NIWA YUKICHI , KURODA RYO
Abstract: A device for measuring a moving distance of two relatively moving objects includes a first diffraction grating provided on one of the two objects and disposed along the relatively moving direction of the two objects, and a measuring portion provided on the other object. The measuring portion includes a second diffraction grating, a light source and a photodetecting system, wherein the light source provides lights which are projected upon two points on the second diffraction grating so that they emanate from the two points in the form of diffraction lights having different diffraction orders. The diffraction lights are directed to the same point on the first diffraction grating and are diffracted again by the first diffraction grating so that they are emitted in the same direction, and the photodetecting system is operable to detect a change in the light intensity caused due to the interference of the two lights emanating from the first diffraction grating. The device further includes a detecting system for detecting the relative moving distance of the two objects on the basis of the detection by the photodetecting.
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公开(公告)号:DE3856296T2
公开(公告)日:1999-07-15
申请号:DE3856296
申请日:1988-08-24
Applicant: CANON KK
Inventor: YANAGISAWA YOSHIHIRO , MORIKAWA YUKO , MATSUDA HIROSHI , KAWADA HARUKI , SAKAI KUNIHIRO , KAWADE HISAAKI , EGUCHI KEN , KAWAKAMI EIGO , KAWASE TOSHIMITSU , YOSHII MINORU , SAITOH KENJI , YAMANO AKIHIKO , NOSE HIROYASU
IPC: G01B7/00 , G01D5/244 , G01D5/245 , G01Q10/00 , G01Q20/04 , G01Q60/00 , G01Q60/10 , G01Q70/06 , G11B9/00 , G01N27/00
Abstract: An encoder includes an electrically conductive reference scale having surface steps formed at predetermined positions; an electrically conductive probe having a tip disposed opposed to the reference scale; wherein the reference scale and the probe are relatively movable in a direction different from the opposing direction of the tip of the probe and the reference scale; a portion for applying an electric voltage to between the reference scale and the probe; a portion for detecting a change in a tunnel current between the reference scale and the probe, to between which the electric voltage is applied by the voltage applying portion at the time of the relative movement between the scale and the probe, the detecting portion detecting the change in the tunnel current when the probe passes a position opposed to a surface step of the reference scale; and portion for detecting the amount of the relative movement between the scale and probe, on the basis of the detection by the change detecting portion.
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