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48 records (took 0.024 seconds)

    32.
    发明专利
    未知

    公开(公告)号：BR9201678A

    公开(公告)日：1992-12-15

    申请号：BR9201678

    申请日：1992-05-05

    Applicant: HOECHST AG

    Inventor： SCHMIDT HUGO ,  RUCKSZIO MANFRED ,  HAAS RAIMUND ,  MACKERT WALTER

    IPC: G01B11/30

    Abstract: An infrared emitter 2 whose surface temperature is kept constant during measurement is used to irradiate a measurement region 4 on a roughened material surface with heat with an oblique angle of incidence of the rays. The temperature of the reflected thermal radiation is measured by means of an infrared thermometer 3 which is arranged above the measurement region in such a way that the reflected radiation impinges in the field of view of the infrared thermometer. The overall measurement region of the material surface, which is situated in the field of view of the infrared thermometer, must be irradiated with heat. The measured temperature characteristic of the reflected radiation as a function of the known surface roughness of the material is stored in a comparator 7. This comparator 7 is fed a desired value for the desired surface roughness. The infrared temperature of a material surface which is at first unknown with regard to its surface roughness is measured and compared with the stored temperature characteristic in order to determine the magnitude of the surface roughness. The value thus obtained is used in conjunction with the desired value fed in to form a difference signal which is fed via the output 8 of the comparator 7 to a control unit 9 of a processing device for the material.

    37.
    发明专利
    未知

    公开(公告)号：FI892292A0

    公开(公告)日：1989-05-11

    申请号：FI892292

    申请日：1989-05-11

    Applicant: HOECHST AG

    Inventor： DURST FRANZ ,  HAAS RAIMUND ,  HULTZSCH GUENTER ,  DAMMANN MANFRED ,  MACK GERHARD ,  INTERTHAL WERNER ,  STROSZYNSKI JOACHIM ,  LEHMANN PETER

    IPC: F26B3/02 ,  B05C9/14 ,  B05D3/02 ,  B05D3/04 ,  F26B13/10 ,  F26B21/00 ,  F26B21/12 ,  F26B

    Abstract: An apparatus for drying a liquid layer deposited on a carrier material which is moved through a drying zone, which liquid layer contains evaporable solvent components and non-evaporable components, comprises a drying apparatus (1) with a drying channel (2), through which the carrier material band (4) runs in the longitudinal direction, on which band the liquid layer to be dried is deposited. The drying channel has a gas/air permeable channel covering surface (7), through which a gas flow, in particular a heated air flow, flows into the drying channel. The channel covering surface (7) is inclined in relation to the channel bottom surface (3) which runs horizontally. The drying channel (2) is adjoined by a gas exchange chamber (15) which contains a fan (12), the fan outlet (16) of which is directed towards a heat exchanger in a partition wall (10) between the gas exchange chamber (15) and a drying chamber (5) situated above the drying channel (2). The gas exchange chamber (15) contains a choke device (13 and 14 respectively) in its bottom surface (18) and in its upper gas inlet (19) respectively. The drying apparatus (1) further contains an exhausting fan (9) which is arranged above the covering surface of a through-channel (20) and is connected to the through-channel via a suction opening. In the outlet (11) of the exhausting fan (9) there is also a choke device (8). … …

    Radiation-sensitive recording material for the production of planographic printing plates.
    39.
    发明专利
    Radiation-sensitive recording material for the production of planographic printing plates. 未知

    公开(公告)号：ZA969602B

    公开(公告)日：1998-05-15

    申请号：ZA969602

    申请日：1996-11-15

    Applicant: HOECHST AG

    Inventor： HAAS RAIMUND ,  ELSAESSER ANDREAS ,  HULTZSCH GUENTER ,  LEHMANN PETER ,  NEUBAUER RUDOLF ,  ZERTANI RUDOLF

    IPC: B41N1/14 ,  G03F7/004 ,  B41N3/03 ,  G03F7/00 ,  G03F7/022 ,  G03F7/023 ,  G03F

    Abstract: Disclosed is a positive-working, radiation-sensitive recording material for the production of planographic printing plates, comprising an aluminum support and a radiation-sensitive layer coated thereon, wherein the aluminum support has been grained in nitric acid, then pickled in sulfuric acid, anodized in sulfuric acid, and subsequently hydrophilized with a compound comprising at least one unit with a phosphonic acid or phosphonate group and the radiation-sensitive layer comprises a) a radiation-sensitive ester of 1,2-naphthoquinone-2-diazide-4- or -5-sulfonic acid and a polycondensate having phenolic hydroxy groups, said polycondensate being obtained by reacting a phenolic compound with an aldehyde or ketone, b) a novolak or a polycondensation product obtained by reacting a polyphenol with an aldehyde or ketone, as an alkali-soluble resin, c) a vinyl-type polymer comprising at least one unit having a lateral hydroxyphenyl group, d) a clathrate, e) a low-molecular weight compound which comprises at least one acidic hydrogen atom, and f) silica gel particles having a maximum diameter of 15 mu m. e

    METHOD OF AND MEASURING ARRANGEMENT FOR CONTACTLESS ON-LINE MEASUREMENT
    40.
    发明专利
    METHOD OF AND MEASURING ARRANGEMENT FOR CONTACTLESS ON-LINE MEASUREMENT 未知

    公开(公告)号：CA2067999A1

    公开(公告)日：1992-11-07

    申请号：CA2067999

    申请日：1992-05-05

    Applicant: HOECHST AG

    Inventor： SCHMIDT HUGO ,  RUCKSZIO MANFRED ,  HAAS RAIMUND

    IPC: G01B11/06 ,  G01B11/30 ,  G01B21/30

    Abstract: With an infrared radiator, the surface temperature of which is kept constant during measurement, a measuring area on a material surface is thermally irradiated with oblique incidence of the rays. The temperature of the reflected thermal radiation is measured by an infrared thermometer, which is arranged above the measuring area in such a way that the reflected radiation falls into the area of coverage of the infrared thermometer. The entire measuring area of the material surface which lies in the field of coverage of the infrared thermometer must be thermally irradiated. The measured temperature variation of the reflected radiation in dependence on the surface condition of the material is stored in a comparison device. A set value for the desired surface condition is fed to this comparison device. The infrared temperature of a material surface, initially unknown with respect to its surface condition, is measured and compared with the stored temperature variation in order to determine the magnitude of the surface parameter. From the value thus obtained and the set value fed in, a differential signal is formed, which is fed via the output of the comparison device to a control of a treatment device for the material. A:\\APP¦4/7/92¦ALEX839¦TEN:lynn/ags

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