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公开(公告)号:GB2494603A
公开(公告)日:2013-03-13
申请号:GB201300361
申请日:2011-06-08
Applicant: IBM
Inventor: DESPONT MICHEL , SEBASTIAN ABU , HAGLEITNER CHRISTOPH , POZIDIS CHARALAMPOS
Abstract: The invention relates to an electromechanical switch device (100, 200), comprising a first switch portion (111, 112, 211, 212), a second switch portion (121, 122, 220) and an actuator device (130, 230). The actuator device (130, 230) is configured to provide an actuation force, thereby actuating the first and second switch portion (111, 112, 121, 122, 211, 212, 220) relative to each other in order to change from a disconnected to a connected state. The actuator device (130, 230) is further configured to provide the actuation force with a modulation at least when the first and second switch portion (111, 112, 121, 122, 211, 212, 220) are in the connected state. The invention furthermore relates to a method of operating an electromechanical switch device (100, 200).
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公开(公告)号:DE60325864D1
公开(公告)日:2009-03-05
申请号:DE60325864
申请日:2003-08-22
Applicant: IBM
Inventor: BINNIG GERD K , DESPONT MICHEL , LANTZ MARK A , VETTIGER PETER
Abstract: A transducer for detecting movement of an article mounted for movement in a plane, the transducer comprising: a heater facing the plane of movement of the article and having a temperature dependent resistance; and, an edge defined in the article between regions of different thermal conductivity; wherein, as the article describes the movement, the edge moves relative to the heater producing a corresponding variation in heat loss from the heater and a corresponding variation in resistance of the heater.
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公开(公告)号:DE69821206T2
公开(公告)日:2004-06-17
申请号:DE69821206
申请日:1998-11-20
Applicant: SEIKO INSTR INC , IBM
Inventor: TAKAHASHI HIROSHI , SHIRAKAWABE YOSHIHARU , SHIMIZU NOBUHIRO , DESPONT MICHEL
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公开(公告)号:AU2002348934A1
公开(公告)日:2003-07-30
申请号:AU2002348934
申请日:2002-11-21
Applicant: IBM
Inventor: CROSS GRAHAM , DESPONT MICHEL , DURIG URS T , GENOLET GREGOIRE , SCHLITTLER RETO , VETTIGER PETER
IPC: B81B3/00 , B82B3/00 , C01B31/02 , G01B7/34 , G01Q70/12 , G01Q70/16 , G11B9/00 , G11C23/00 , G12B21/00 , G12B21/02
Abstract: A method for forming a microstructures is described. The method comprises: depositing a seed material on a substrate; growing a nanotube from the seed material; depositing microstructure material on the substrate to embed the nanotube in the microstructure material; and, detaching the substrate to release the microstructure. The resulting mictostructure comprises a body portion and a nanotube embedded in the body portion.
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公开(公告)号:AU8615601A
公开(公告)日:2002-05-15
申请号:AU8615601
申请日:2001-09-17
Applicant: IBM
Inventor: BINNIG GERD K , DESPONT MICHEL , VETTIGER PETER
Abstract: Read/write components for AFM-based data storage devices are provided. In particular embodiments, a read/write component (30, 45, 50, 65, 80) comprises lever means (31, 51, 66, 82) and a support structure (32, 52, 67, 81), the lever means being connected to the support structure for substantially pivotal movement. The lever means (31, 51, 66, 82) provides first and second current paths between a pair of electrical supply lines (R, C) on the support structure via which the lever means can be connected in use to power supply means operable in a write mode and a read mode. A write-mode heater (36, 47, 56, 73) is provided on the lever means in the first current path, and a read/write tip (37, 57, 74, 84) is provided on the write-mode heater. A read-mode heater (39, 46, 58, 75, 83) is provided on the lever means in the second current path. Decoupling means (38a, 38b, 40a, 40b, 60, 61, 77a, 77b, 78a, 78b) is arranged to inhibit current flow to the write-mode heater via the first current path in use when the power supply means is operated in the read mode. The component, with separate write and read-mode heaters, can thus be addressed in both the write and read modes via a single pair of supply lines. Other embodiments provide read/write components (100) employing a thermal decoupling mechanism, and read/write components (80) where read-sensing is performed by a proximity sensing arrangement between the lever means and the support structure. Sensing apparatus (115) for atomic force microscopes is also provided where tip movement can be detected via similar proximity sensing arrangements.
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