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公开(公告)号：JP2000177263A
公开(公告)日：2000-06-27
申请号：JP35440498
申请日：1998-12-14
Applicant: TORAY INDUSTRIES
Inventor： ISHIKAWA KOJI , UEHARA MASATSUGU , HIRATA HAJIME
Abstract: PROBLEM TO BE SOLVED: To provide a method and apparatus for manufacturing a printing base sheet for a thermal stencil having a plastic film of a uniform thickness in the base sheet for the stencil manufactured by adhering a porous support made of synthetic fiber to one side of the film without adhesive and co-orienting it. SOLUTION: In the method for manufacturing a printing base sheet for a thermal stencil for obtaining a composite film by sequentially conducting a casting step of discharging a synthetic resin from a mouthpiece and casting a plastic film, an adhering step of adhering a porous support made of synthetic fibers to one surface of the film without adhesive, and a co-orienting step of co-orienting the film and the support, a plastic film thickness measuring step of measuring a thickness of only the plastic film of the composite film is provided after the co-orienting step, and the thickness of the plastic film is controlled by feeding back thickness information in its width direction to the casting step. The apparatus for manufacturing the base sheet for a thermal stencil by the method is provided.
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公开(公告)号：JPH11218466A
公开(公告)日：1999-08-10
申请号：JP2312998
申请日：1998-02-04
Applicant: TORAY INDUSTRIES
Inventor： SASAMOTO HIROKAZU , IDO HIDEO , HIRATA HAJIME
Abstract: PROBLEM TO BE SOLVED: To provide a measuring device of a substrate of excellent precision and reproducibility for shortening a measuring time and the production method of a color filter or a transparent electrode substrate. SOLUTION: The measuring device of a substrate judges the presence of a projection-like matter set on at least one substrate constituting a liquid crystal element sandwiching the liquid crystal composition between a pair of opposite substrates. A stage 2 mounting a sample, a height measuring means 3 or an imaging means and a data processor 5 are provided, and the presence of the projection-like matter is judged from height information obtained from the height measuring means 3 and intensity information obtained from the imaging means.
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公开(公告)号：JPH08338814A
公开(公告)日：1996-12-24
申请号：JP16830495
申请日：1995-06-09
Applicant: TORAY INDUSTRIES
Inventor： HIRATA HAJIME , ISHIKAWA KOJI , TORIKAI JUN , HANATO HIROSHI
IPC: B29C55/02 , B29L7/00 , G01N21/89 , G01N21/894
Abstract: PURPOSE: To accurately detect a pin hole of a small diameter of a light permeable film, by arranging an ultrasonic light source at the side of one face of the film and a photodetecting part having an image pickup device at the side of the other face of the film. CONSTITUTION: An ultrasonic light source 3 is arranged at the side of one face of a film 1, and a photodetecting part 4 having a built-in solid image pickup device 5 is set at the side of the other face of the film 1. Most of the ultraviolet rays from the light source 3 are reflected and absorbed by the film 1, not penetrating to the photodetecting part 4. Meanwhile, if a pin hole 2 is present on the film 1, the ultraviolet rays pass through the pin hole to reach the photodetecting part 4, are converted to an image signal by the device 5 and processed at a signal-processing device 6. As a result, the pin hole 2 is detected. Even women the film 1 shows a high permeability to visible lights, the ultraviolet rays are generally low in transmission and therefore the amount of ultraviolet rays passing through the pin hole 2 is greatly different from that of ultraviolet rays passing through other parts than the pin hole 2. The pin hole 2 is accordingly judged surely.
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34.发明专利
公开(公告)号：JPH08338709A
公开(公告)日：1996-12-24
申请号：JP17040495
申请日：1995-06-13
Applicant: TORAY INDUSTRIES
Inventor： TORIKAI JUN , HIRATA HAJIME
Abstract: PURPOSE: To measure the thickness of a colored thin film by calculating order to interference corresponding to wave length for giving a maximum value or a minimum value of spectral intensity of interference light of white color light due to the thin film and correcting the order of interference on the basis of spectral transmission characteristics of thin film material. CONSTITUTION: Measuring white-color light from a light source 11 is collected by a reflection mirror 12 and a lens 13, projected and reflected on a color filter coated film for a color display to be measured as parallel light by a lens for projecting and receiving 23 and becomes interference light. The interference light is collected, made incident on a spectral part 3, collected by a light collecting lens 31, and passed through a pin hole 32 of a position separated by only a focus point, and thereafter is made parallel light by a lens 33. The parallel light is separated by a plane diffraction grating 34. A component in the range of specified wave length out of spectral interference light is image-formed on an image sensor 36 by an image formation lens 35. The spectral intensity is successively read by a sensor drive circuit 37 for every picture element, transmitted to an operation processing part 4 as a voltage signal and thin film measuring can be performed by operation processing.
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公开(公告)号：JPH0771923A
公开(公告)日：1995-03-17
申请号：JP19707894
申请日：1994-08-22
Applicant: TORAY INDUSTRIES
Inventor： HIRATA HAJIME , KIMURA KATSUMI , TORIKAI JUN
IPC: G01B11/06
Abstract: PURPOSE:To precisely measure the thickness of a thin film even when a subject to be measured has a locally fine unevenness in thickness. CONSTITUTION:Parallel white lights are made incident on a subject 6 to be measured at a fixed incident angle, the reflected light or transmitted light is guided to a spectroscope 14 to detect the wavelength or wave number giving the peak of bright part or dark part by spectral intensity, a normal part is extracted on the basis of the wavelength or the regularity of wave number or peak value, and the film thickness of the subject 6 is measured on the basis of the wavelength or wave number belonging to the normal part.
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Patent Agency Ranking
公开(公告)号：JPH02170017A
公开(公告)日：1990-06-29
申请号：JP32348088
申请日：1988-12-23
Applicant: TORAY INDUSTRIES
Inventor： HIRATA HAJIME , NAKAJIMA HIROKI , YAMAZAKI CHIKAYASU
Abstract: PURPOSE:To offer a three-dimensionally nondirectional flow sensor which is rich in flexibility by supporting a sensor element in a space by 1st and 2nd lead wires and a frame body thermally isotropically so that the element is isolated from a base plate. CONSTITUTION:The flow sensor 1 consists of the frame body 2, sensor element 3, lead wires 4, 5, and 6, base plate 7, etc., the sensor element 3 is arranged almost in the center of the frame body 2 by lead wires 4 at circumferentially equal intervals, and the lead wires 6 function even as main columns for supporting the frame body 2 above the base plate 7 at a proper distance. Thus, the sensor element 3 is arranged in the center of the frame body 2, much smaller than the diameter of the frame body 2, and regarded nearly as a point, and the element is further isolated sufficiently from the base plate 7, so wind strikes on the sensor element 3 almost equally in all directions. Namely, the sensor element 3 is almost nondirectional in three dimensions. Further, the electrodes of the sensor element 3 are supported in a thermally balanced state by the lead wires 4 and 6 and its detection characteristics are nondirectional in three dimensions.
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公开(公告)号：JP2002310924A
公开(公告)日：2002-10-23
申请号：JP2001118397
申请日：2001-04-17
Applicant: TORAY INDUSTRIES
Inventor： ISHIKAWA KOJI , HIRATA HAJIME , KITAHARA YASUSHI
IPC: G01N21/892 , B29C47/08 , B29K77/00 , B29L7/00 , G01N21/894
Abstract: PROBLEM TO BE SOLVED: To provide a sheet defect inspecting device with high accuracy in distinguishing defects capable of highly accurately determining the size of defects, especially pinhole, membrane, and air bubble defects which occur on a sheet, highly accurately distinguishing the defects, and reducing over detection of the defects. SOLUTION: In the defect inspecting device for detecting defect signals from among signals outputted from a light receiving part, a light source is arranged on one surface side of the sheet transferred by a sheet transfer means, and the light receiving part with an image pickup element is arranged on the other surface side. A plate for correcting the quantity of light is provided between the light source and the sheet.
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公开(公告)号：JP2002086538A
公开(公告)日：2002-03-26
申请号：JP2000277701
申请日：2000-09-13
Applicant: TORAY INDUSTRIES
Inventor： NAKAI YASUHIRO , UEHARA MASATSUGU , HIRATA HAJIME
Abstract: PROBLEM TO BE SOLVED: To provide a sheet manufacturing method by which the low control precision attributed to the asymmetry of response by a thermal sheet thickness adjusting means is upgraded in a simple way as well as a sheet thickness control device. SOLUTION: This sheet thickness control device used in the sheet manufacturing process is of such a function that a polymer is extruded in the shape of a sheet with the help of a die equipped with a plurality of thermal thickness adjusting means and the extrusions are molded into the sheet of a desired thickness and further, the thickness distribution in the width direction, of the sheet is measured and an amount of heat to be applied to the thermal thickness adjusting means is controlled based on the measurements. In this control device the amount of heat is applied to the thermal thickness adjusting means in such a manner that the variation of the amount of heat to be applied to the thermal thickness adjusting means shows that it is greater when the amount of heat is decreased compared to the case when the amount of heat is increased.
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公开(公告)号：JP2001280921A
公开(公告)日：2001-10-10
申请号：JP2000097144
申请日：2000-03-31
Applicant: TORAY INDUSTRIES
Inventor： ISHIKAWA KOJI , MATSUKUMA TETSUNORI , HIRATA HAJIME
Abstract: PROBLEM TO BE SOLVED: To provide a film thickness measuring instrument capable of carrying out precise film thickness measurement by providing a converging device for converging an infrared beam and by using a light interference system, and provide a film manufacturing method using the instrument. SOLUTION: The infrared beam 2 output from a light parallelizing optical system 4 in a projection part is made to get incident into a film using the thin film thickness measuring instrument 30 arranged, in order, with a light source 1 for outputting the infrared beam, the light parallelizing optical system 4 in the projection part, a light converging device 6 for converging the infrared beam, a light parallelizing optical system 7 in a photoreceiving part, a diffraction grating 8, a linear image sensor 10 and a computing means 11. A reflected beam from the film is received by the converging device 6, the light output from the device 6 is brought into parallel light by the parallelizing optical system 7, and it is separated into its spectral components by the grating 8. The light separated into the spectral components by the grating 8 is detected by the linear image sensor 10 as a spectrum of light intensity in each wavelength to be converted into an electric signal, and a film thickness is found by the computing means 11.
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公开(公告)号：JP2000329702A
公开(公告)日：2000-11-30
申请号：JP2000075393
申请日：2000-03-17
Applicant: TORAY INDUSTRIES
Inventor： HAYASHI KOJI , TAKAMURA RYOJI , HIRATA HAJIME , NAKAI YASUHIRO
IPC: G01B11/30 , G01N21/892
Abstract: PROBLEM TO BE SOLVED: To improve detection sensitivity and accuracy by using a light reception means including a photoconductor with a reflection means at a non-light- reception surface side and a photoconductor with a rough face part at least at one portion of a surface. SOLUTION: The detection device of the defect of the surface or inside of a sheet 1 such as a plastic film is composed by equipping a reflection means such as an aluminum deposition film 24 in a photoconductor 21 for receiving diffusion light (b) being generated by a defect 5 caused by laser beams or the like from a light source part. Then, for example, while the sheet 1 is being run by a take-up roll, scanning is made in a specific direction by light beams (a) from a laser light source. The diffusion light (b) from the defect 5 entering the photoconductor 21 is detected by a photomultiplier or the like while repeating reflection or the like, but the leakage of the scattered light (b) is reduced by the aluminum deposition film 24 at the non-light-reception surface side for improving light reception efficiency. Even if at least one portion of the surface of the photoconductor 21 is set to a rough face part with a specific roughness, surface reflection can be suppressed, thus obtaining the same effect.
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