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公开(公告)号：EP0377737A1
公开(公告)日：1990-07-18
申请号：EP88906113.1
申请日：1988-07-20
Applicant: OTSUKA ELECTRONICS CO., LTD.
Inventor： ATAGI, Hidehiro , SEKIWA, Mitsunao
CPC classification number: G01J3/02 , G01J3/0218 , G01J3/0294 , G01J3/08 , G01J3/2803 , G01J3/42 , G01J2003/106 , G01N21/255 , G01N2201/084
Abstract: A spectrophotometer capable of measuring a plurality of dispersed beams selectively with a linear array sensor (7, 18), which consists of a single row of sensor members, by discharging beams selectively from the output terminals of optical fibers (3a-3c, 13a, 13b, 21) by means of beam selecting means (8a-8c, SW1, SW2).
Abstract translation: 用途：用于线性阵列传感器光束的测量。
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公开(公告)号：EP0301251A2
公开(公告)日：1989-02-01
申请号：EP88110262.8
申请日：1988-06-28
Applicant: Rosemount GmbH & Co.
Inventor： Schneider, Rudolf , Krause, Hans, Dr. , Heimel, Helmut
Abstract: Die Erfindung betrifft eine Strahlungs-Zerhackereinrichtung (85), die zwischen zwei aufeinanderliegenden Teilen angeordnet ist. Die Zerhackerscheibe (85) ist hierbei über eine Achse (87) mit einer Lagervorrichtung (89) gekoppelt, die drei Auflagepunkte (93, 94, 104) aufweist. Durch diese besondere Lagerung wird das Zerhackerrauschen minimiert.
Abstract translation: 辐射斩波装置（85）布置在彼此相对的两个部分之间。 在这种布置中，斩波盘（85）经由轴（87）联接到具有三个轴承点（93,94,104）的轴承装置（89）。 这种特殊的轴承装置使斩波噪声最小化。
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公开(公告)号：EP0087568B1
公开(公告)日：1987-01-07
申请号：EP83100499.9
申请日：1983-01-20
Applicant: THE PERKIN-ELMER CORPORATION
Inventor： Talmadge, Paul C. , Vergato, Joseph A.
IPC: G01J3/42
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公开(公告)号：EP0193718A1
公开(公告)日：1986-09-10
申请号：EP86100641.9
申请日：1986-01-18
Applicant: Hartmann & Braun Aktiengesellschaft
Inventor： Fabinski, Walter , Apel, Willi
Abstract: Bei einer rotierenden Modulationseinrichtung für Fotometer sind zur Erzielung eines Abgleichs der Phasen von Meßstrahl und Vergleichsstrahl eine Scheibe mit Öffnungen und ein Konstruktionsteil mit korrespondierenden Öffnungen vorgesehen, wobei Scheibe und Konstruktionsteil relativ zueinander tangential verstellbar sind.
Abstract translation: 为了实现测量光束和比较光束的相位的对准，旋转调制装置具有带有开口的盘和具有相应开口的结构部分，盘和结构部分能够相对于彼此切向地调节。
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425.发明公开
公开(公告)号：EP0183415A2
公开(公告)日：1986-06-04
申请号：EP85308144.6
申请日：1985-11-08
Applicant: C. Reichert Optische Werke AG
Inventor： Lihl, Reinhard
CPC classification number: G02B21/002 , G01J3/02 , G01J3/0256 , G01J3/06 , G01J3/08 , G01J3/26 , G02B21/0096
Abstract: A photometer adapted to receive light deflected from a microscope observation axis (15) to alternatively provide image or wavelength scanning modes. The photometer comprises an entrance axis (29) for light received from the microscope, a pin hole occluder (12) positioned at one end of the entrance axis (29), a detector axis (27) having a detector (18) at one end thereof, and first and second scanning axes (16, 28) selectively connecting the entrance axis (29). The first scanning axis (16) is provided with a first imaging means (14) positioned thereon for imaging the pin hole occluder (12 near said detector (18). The second scanning axis (28) is provided with monochromator means (32) to reflect a single wavelength of light and a second imaging means for imaging the pin hold occluder (12) near the detector (18). The photometer also includes selector means (26) for connecting a chosen scanning axis (16, 28) to said entrance and detector axes (29, 27). By means of this arrangement image scanning' can be performed when said first scanning axis (16) connects said entrance and detector axes (29, 27), and wavelength scanning can be performed when said second scanning axis (28) connects said entrance and detector axes (29, 27).
Abstract translation: 适于接收从显微镜观察轴（15）偏转的光的光度计，以交替地提供图像或波长扫描模式。 所述光度计包括用于从所述显微镜接收的光的入口轴线（29），位于所述入口轴线（29）的一端的针孔闭塞器（12），在一端具有检测器（18）的检测器轴线 以及选择性地连接入口轴线（29）的第一和第二扫描轴（16,28）。 第一扫描轴（16）设置有定位在其上的第一成像装置（14），用于对针孔闭塞器（12）在所述检测器（18）附近进行成像，第二扫描轴（28）设置有单色仪装置 反射单个波长的光和第二成像装置，用于对检测器（18）附近的针保持闭塞器（12）进行成像。光度计还包括选择器装置（26），用于将所选择的扫描轴线（16,28）连接到所述入口 和检测器轴（29,27），通过该布置，当所述第一扫描轴（16）连接所述入口和检测器轴（29,27）时，可执行图像扫描，并且当所述第二扫描轴 （28）连接所述入口和检测器轴（29,27）。
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Patent Agency Ranking
公开(公告)号：EP0059025B1
公开(公告)日：1985-06-12
申请号：EP82300121.9
申请日：1982-01-11
Applicant: THE COMMONWEALTH OF AUSTRALIA
CPC classification number: G02B27/143 , G01J1/36 , G01J3/02 , G01J3/0205 , G01J3/021 , G01J3/08
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427.发明公开公开(公告)号：US20230266170A1
公开(公告)日：2023-08-24
申请号：US18017812
申请日：2021-07-26
Applicant: CytoVeris Inc.
Inventor： Alan Kersey , David Fournier , Rishikesh Pandey , Gary Root
CPC classification number: G01J3/44 , G01J3/12 , G01J3/0208 , G01J3/08 , G01J3/10 , G01J3/0218 , G01J2003/102 , G01J2003/1213 , G01N21/65
Abstract: A system and method for analyzing a sample using Raman spectral light includes a light source, a light detector, a narrow band pass filter and an analyzer. Within the system, excitation light is directed to interrogate the sample. The narrow band pass filter is positioned to receive Raman scattered light produced as a result of the interrogation. The light detector is positioned to receive the Raman scattered light that has passed through the at least one narrow band pass filter. The analyzer contains stored instructions that when executed cause the processor to a) control the light source; and b) process signals produced by the light detector to analyze the sample material, the signals representative of the intensity of the Raman scattered light received by the at least one light detector corresponding to one or more wavenumbers in a high wavenumber region of a Raman signal.
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公开(公告)号：US20180266942A1
公开(公告)日：2018-09-20
申请号：US15985032
申请日：2018-05-21
Applicant: PerkinElmer Singapore PTE Ltd.
Inventor： Ralph Lance Carter , Robert Alan Hoult
CPC classification number: G01N21/35 , G01J3/021 , G01J3/0262 , G01J3/0291 , G01J3/0297 , G01J3/08 , G01J3/453 , G01J2003/4534 , G01N21/4738 , G01N2021/3595 , G01N2201/061 , G01N2201/068
Abstract: Diffuse reflectance spectroscopy apparatus for use in analysing a sample comprising a sample receiving location 2 for receiving a sample 3 for analysis; an illumination arrangement 4 for directing light towards a received sample; a detector 6 for detecting light reflected by a received sample; and collection optics 5 for directing light reflected by a received sample towards the detector. The illumination arrangement further comprises an interferometer 42 and a half beam block 45a, 45b which is disposed substantially at a focus in the optical path for blocking light which exits the interferometer, passes said focus, and is reflected from re-entering the interferometer. A half beam block 45a may be disposed in the optical path between the interferometer and the light source 41 for blocking light that exits the interferometer back towards the light source and is reflected by the light source from re-entering the interferometer and/or a half beam block 45b may be disposed in the optical path on the opposite side of the interferometer than the light source.
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公开(公告)号：US20180180480A1
公开(公告)日：2018-06-28
申请号：US15738265
申请日：2016-06-14
Applicant: Konica Minolta, Inc.
Inventor： Shinichi IIDA , Yoshitaka TERAOKA
CPC classification number: G01J3/10 , G01J3/08 , G01J3/26 , G01J3/50 , G01J3/501 , G01J3/504 , G01J2003/102
Abstract: First and second measurement operations are performed according to each of a plurality of geometric conditions while keeping the geometric condition. In the first measurement operation, illumination light is radiated from a first light radiating position toward a measurement target position and spectroscopic measurement is performed on reflected light traveling from the measurement target position toward a first light receiving position. In the second measurement operation, illumination light is radiated from a second light radiating position toward a measurement target position and spectroscopic measurement is performed on reflected light traveling from the measurement target position toward a second light receiving position. The two spectroscopic measurement results are averaged. The second light radiating position and the second light receiving position are respectively disposed symmetrical to the first light radiating position and the first light receiving position with respect to a reference axis.
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公开(公告)号：US20160270702A1
公开(公告)日：2016-09-22
申请号：US15072090
申请日：2016-03-16
Applicant: GlucoVista, Inc.
Inventor： Yonatan Gerlitz , Alexander Ostritsky , Rotem Gerlitz
IPC: A61B5/1455 , A61B5/00 , A61B5/145
CPC classification number: A61B5/1455 , A61B5/14532 , A61B5/7203 , A61B5/7246 , A61B5/7278 , A61B2562/0233 , G01J3/021 , G01J3/0291 , G01J3/0294 , G01J3/08 , G01J3/108 , G01J2005/0048
Abstract: A concentration correction system includes an infrared detector and components that produce an aggregate emission of infrared radiation. A mirror assembly includes a mirror and is changeable between a correcting configuration and a measuring configuration. In the correcting configuration, the mirror produces a mirror signal incident on the detector. The mirror assembly also obstructs external body infrared radiation from reaching the detector. In the measuring configuration, the mirror assembly allows the external body infrared radiation onto the detector. A concentration correction method includes receiving external body infrared radiation and simultaneously receiving a first portion of the aggregate emission. A measurement value indicative of concentration is recorded from the detector. A second portion of the aggregate emission reflected with the mirror and produces a mirror signal incident on the detector. A correction value corresponding to the mirror signal is recorded from the detector and used to correct the measurement value.
Abstract translation: 浓度校正系统包括红外检测器和产生红外辐射聚集发射的部件。 反射镜组件包括反射镜，并且可以在校正配置和测量配置之间变化。 在校正配置中，镜产生入射在检测器上的镜像信号。 反射镜组件还阻挡外部身体的红外辐射到达检测器。 在测量配置中，镜组件允许外部身体红外辐射到探测器上。 浓度校正方法包括接收外部身体红外辐射并同时接收聚集发射的第一部分。 从检测器记录表示浓度的测定值。 用反射镜反射的聚集发射的第二部分并且产生入射在检测器上的镜像信号。 从检测器记录对应于镜像信号的校正值，并用于校正测量值。
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