Abstract:
본 발명은 신뢰성이 높은 분광(分光)모듈을 제공한다. 본 발명의 분광모듈(1)에서는 한쪽의 면(2a)으로부터 입사한 광을 투과시키는 기판(2)과, 기판(2)의 다른 쪽의 면(2b)에 대면하는 입사면(3a)을 가지고, 기판(2)을 투과하여 입사면(3a)으로부터 입사한 광을 투과시키는 렌즈부(3)와, 렌즈부(3)에 형성되어 렌즈부(3)에 입사한 광을 분광하고, 아울러, 반사하는 분광부(4)와, 분광부(4)에 의해서 반사된 광을 검출하는 광검출소자(5)와, 다른 쪽의 면(2b)과 입사면(3a)과의 사이에 형성되어 기판(2)에 대해서 렌즈부(3)를 지지하는 지지부(8)를 구비하고 있다. 이 분광모듈(1)에서는 지지부(8)에 의해 다른 쪽의 면(2b)과 입사면(3a)와의 사이에 틈새(S)가 형성되기 때문에, 다른 쪽의 면(2b)과 입사면(3a)과의 접촉에 의한 흠집의 발생을 방지할 수 있어, 분광모듈(1)의 신뢰성을 향상시킬 수 있다.
Abstract:
In this spectroscopic module (1), a light detecting element (4) has a light passing opening (4b) through which light entering a body section (2) passes. Therefore, the displacement of the relative positional relationship between the light passing opening (4b) and a light detecting section (4a) of the light detecting element (4) can be prevented from occurring. Moreover, an optical element (7) for guiding the light entering the body section (2) is placed in the light passing opening (4b). Consequently, light to enter the body section (2) can be certainly guided without part of the light to enter the body section (2) being blocked off by the edge on the light-entering side of the light passing opening (4b). Accordingly, this spectroscopic module (1) enables improved reliability.
Abstract:
Since a spectroscopic module (1) has a plate-shaped body section (2), the spectroscopic module can be reduced in size by reducing the thickness of the body section (2). Moreover, since the body section (2) is plate-shaped, the spectroscopic module (1) can be manufactured, for example, by using a wafer process. More specifically, by providing lens sections (3), diffraction layers (4), reflection layers (6) and light detecting elements (7) in a matrix form on a glass wafer which becomes many body sections (2) and dicing the glass wafer, many spectroscopic modules (1) can be manufactured. This enables easy mass production of spectroscopic modules (1).
Abstract:
A method and apparatus is disclosed which may comprise detecting the bandwidth of laser output light pulses of a pulsed laser utilizing an array of light detecting elements by the steps which may comprise passing a portion of the laser output light produced by the pulsed laser to the array of light detecting elements in a manner that shifts the portion of the laser beam across the array of light detecting elements to avoid aliasing artifacts in output of the light detecting array. The portion of the image formed by the laser output light may be under-sampled, e.g., in the spatial or time domains. The relevant feature size of an image of an output of a fringe pattern generating element being sampled may comprise a size that is small with respect to the size of individual light detecting elements in the array of light detecting elements. ® KIPO & WIPO 2009
Abstract:
An apparatus for detecting an end point in an etch chamber and a dry cleaning method are provided to minimize the damage of the inside of the etch chamber by detecting accurately the end point. An etch chamber dry cleaning process is performed to execute a dry cleaning process in an inside of an etch chamber(100). A wavelength detection process is performed to detect a plurality of wavelengths caused by a chemical reaction in the inside of the etch chamber(110). An end point decision process is performed to decide an end point by combining a rapidly reducing point of one of the various wavelengths and a rapidly increasing point of one of the various wavelengths(120). The end point detection is performed by using a CCD(Charge Coupled Device).
Abstract:
A color image sensor which uses a sensor array that has, as a lighting light source, 3-color light emitting elements capable of independently controlling light emitting timings respectively and at least three rows of pixels respectively constituted by a plurality of pixels, respective rows of pixels being provided with color filters having different transmitting wavelength regions, and which independently controls the lighting start and lighting period of each light emitting element, whereby it is possible to prevent color misregistration in an output image signal and regulate the image signal level of each color component. ® KIPO & WIPO 2007
Abstract:
An apparatus (300') and method capable of providing spatially multiplexed IR spectral information simultaneously in real-time for multiple samples or multiple spatial areas of one sample using IR absorption phenomena requires no moving parts or Fourier Transform during operation, and self-compensates for background spectra and degradation of component performance over time. IR spectral information and chemical analysis of the samples is determined by using one or more IR sources (310, 311), one or more sampling accessories (330, 331) for positioning the sample volumes, one or more optically dispersive elements (350), a focal plane array (FPA) (370) arranged to detect the dispersed light beams, and a processor (380) and display (390) to control the FPA (370), and display(390) to control the FPA (370) and display IR spectrograph.
Abstract:
색상 감지기는 단일의 집적 회로 칩 상에 구현된다. 색상 감지기는 복수의 색상 감지기 회로 및 이득 선택 제어를 포함한다. 복수의 색상 감지기 회로 내의 각각의 색상 감지기 회로는 광 검출기, 증폭기 및 이득 선택 회로를 포함한다. 증폭기는 광 검출기에 접속된다. 증폭기는 광 검출기로부터의 신호를 증폭한다. 이득 선택 회로는 증폭기에 접속된다. 이득 선택에 의해 증폭기의 이득이 제어된다. 이득 선택 회로는 가변 피드백 저항을 포함한다. 이득 선택 제어는 각각의 색상 감지기 회로마다 구별되는 가변 피드백 저항의 값을 선택한다.
Abstract:
PURPOSE: An improved real-time goniospectrophotometer is provided to economically and quickly obtain each dependence of a color spectrum by using sample materials or a light source. CONSTITUTION: An improved real-time goniospectrophotometer parabola-irradiates light from a light source in order to provide light beam from an azimuth angle within a zenith angle. Light is spectrum jet from the beam. An angular spectrum is obtained correspondingly to the zenith angle. The light beam includes a discrete beam set. Each beam included in the discrete beam set corresponds to the zenith angle within the zenith angle. The discrete beam set is collimated. Spectrum distribution of light from the light beam refers to diffraction of the light beam in a diffraction lattice.