公开(公告)号：DE10300157A1

公开(公告)日：2004-07-15

申请号：DE10300157

申请日：2003-01-07

Applicant: LEICA MICROSYSTEMS

Inventor： BEWERSDORF JOERG ,  GUGEL HILMAR

IPC: G02B21/00

Abstract: The invention relates to a confocal 4pi microscopy method which is characterized by coherently illuminating a sample from two sides by one objective each with illumination light which has at least one illumination wavelength whereby a stationary illumination wave having a main illumination maximum and secondary illumination maxima is produced by interference of the illumination light in the sample. The detection light emitted by the sample has at least one detection wavelength and is detected through the two objectives. The detection light is made to interfere, thereby producing in the sample a detection pattern having a main detection maximum, secondary detection maxima and detection minima in such a manner that the secondary illumination maxima and the detection minima overlap at least partially.

公开(公告)号：GB2363026B

公开(公告)日：2003-03-19

申请号：GB0108719

申请日：2001-04-06

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  HOFFMANN JUERGEN ,  GUGEL HILMAR ,  BEWERSDORF JOERG

IPC: G01N21/64 ,  G02B21/00 ,  G02B21/06

Abstract: The present invention concerns a double confocal scanning microscope ( 1 ) having an illuminating beam path ( 2 ) of at least one light source ( 3 ), and a detected beam path ( 4 ) of at least one detector ( 5 ), and in order to achieve almost the theoretically possible resolution capability, in particular in the context of multi-color fluorescence applications, is characterized in that the optical properties in particular of the components ( 6, 10, 13, 14 ) arranged in the beam path are coordinated with one another in such a way that the accumulated aberrations, with respect to the optical axis ( 33 ) and/or at least one surface ( 18, 19, 20 ) in the specimen region, are at least of the order of magnitude of the theoretically achievable resolution capability.

公开(公告)号：DE10100246A1

公开(公告)日：2002-07-11

申请号：DE10100246

申请日：2001-01-05

Applicant: LEICA MICROSYSTEMS

Inventor： BEWERSDORF JOERG ,  GUGEL HILMAR

IPC: G02B21/34 ,  G02B21/00 ,  G02B21/24 ,  G02B21/16 ,  G12B21/20

Abstract: Microscope has an object carrier element for holding an object during viewing. The carrier has a reference object integral with it that can be used for calibration, alignment and adjustment of the microscope. The reference object can be detected using normal light. The invention also relates to a corresponding method for operating a microscope.

公开(公告)号：DE10045837A1

公开(公告)日：2002-04-25

申请号：DE10045837

申请日：2000-09-14

Applicant: LEICA MICROSYSTEMS

Inventor： BEWERSDORF JOERG ,  GUGEL HILMAR

IPC: G02B21/06 ,  G02B21/18

公开(公告)号：GB2363026A

公开(公告)日：2001-12-05

申请号：GB0108719

申请日：2001-04-06

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  HOFFMANN JUERGEN ,  GUGEL HILMAR ,  BEWERSDORF JOERG

IPC: G01N21/64 ,  G02B21/00 ,  G02B21/06

Abstract: A double confocal scanning microscope (1) has an illuminating beam path (2) associated with a light source (3) and a detected beam path (4) associated with a detector (5). In order to achieve a resolution capability approaching that theoretically possible, in particular in the context of multi-color fluorescence applications, the optical properties of components (6, 10, 13, 14) arranged in the beam path are co-ordinated with one another in such a way that the accumulated aberrations, with respect to the optical axis (33) and/or at least one surface (18, 19, 20) in a specimen support region, are at least of the order of magnitude of the theoretically achievable resolution capability.

公开(公告)号：DE10018256A1

公开(公告)日：2001-10-25

申请号：DE10018256

申请日：2000-04-13

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  BEWERSDORF JOERG ,  GUGEL HILMAR ,  HOFFMANN JUERGEN

IPC: G01N21/64 ,  G02B21/00 ,  G02B21/06

Abstract: The present invention concerns a double confocal scanning microscope ( 1 ) having an illuminating beam path ( 2 ) of at least one light source ( 3 ), and a detected beam path ( 4 ) of at least one detector ( 5 ), and in order to achieve almost the theoretically possible resolution capability, in particular in the context of multi-color fluorescence applications, is characterized in that the optical properties in particular of the components ( 6, 10, 13, 14 ) arranged in the beam path are coordinated with one another in such a way that the accumulated aberrations, with respect to the optical axis ( 33 ) and/or at least one surface ( 18, 19, 20 ) in the specimen region, are at least of the order of magnitude of the theoretically achievable resolution capability.

公开(公告)号：DE19902624A1

公开(公告)日：1999-09-30

申请号：DE19902624

申请日：1999-01-23

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  HEINRICH ULRICH ,  GUGEL HILMAR

IPC: G01J3/04 ,  G01J3/14 ,  G02B5/04 ,  G02B21/00 ,  G02B27/12

Abstract: Optical arrangement detects fanned out spectral regions in the dispersion plane (3). An incoming light beam (1) is focussed on a pinhole (7), where the shape of the latter is a polygon (8), which realises a high dynamic response when the light beam is split into spectral regions or spectral colours.

公开(公告)号：DE112017002368A5

公开(公告)日：2019-01-24

申请号：DE112017002368

申请日：2017-05-09

Applicant: LEICA MICROSYSTEMS

Inventor： GUGEL HILMAR ,  LEIMBACH VOLKER

IPC: G02B27/28

公开(公告)号：DK2149070T3

公开(公告)日：2018-05-28

申请号：DK08749935

申请日：2008-04-30

Applicant: LEICA MICROSYSTEMS

Inventor： GUGEL HILMAR ,  SEYFRIED VOLKER

IPC: G02F1/11 ,  F21V9/40 ,  G02B21/00

公开(公告)号：DE10300157B4

公开(公告)日：2016-08-25

申请号：DE10300157

申请日：2003-01-07

Applicant: LEICA MICROSYSTEMS

Inventor： BEWERSDORF JÖRG ,  GUGEL HILMAR

IPC: G02B21/00 ,  G02B21/06

Abstract: Verfahren zur konfokalen 4-Pi-Mikroskopie, gekennzeichnet durch folgende Schritte: • Kohärentes Beleuchten einer Probe von zwei Seiten durch je ein Objektiv mit Beleuchtungslicht, das zumindest eine Beleuchtungswellenlänge aufweist, wobei durch Interferenz des Beleuchtungslichts in der Probe eine stehende Beleuchtungswelle mit einem Beleuchtungs-Hauptmaximum und mit Beleuchtungs-Nebenmaxima erzeugt wird; • Detektieren des von der Probe ausgehenden Detektionslichtes, das zumindest eine Detektionswellenlänge aufweist, durch die beiden Objektive hindurch, wobei das Detektionslicht zur Interferenz gebracht wird und dadurch in der Probe ein Detektionsmuster mit einem Detektions-Hauptmaximum und mit Detektions-Nebenmaxima derart erzeugt wird, dass die Beleuchtungs-Nebenmaxima und die Detektions-Nebenmaxima sich an unterschiedlichen Orten befinden; und • Markieren der Probe mit zumindest einem Fluoreszenzfarbstoff, der derart ausgewählt ist, dass das Verhältnis von Beleuchtungswellenlänge zu Detektionswellenlänge im Bereich von 0,5 bis 0,9 oder im Bereich von 0,6 bis 0,8 oder bei 0,75 liegt; • Vorsehen einer Detektionslochblende, deren Öffnungsdurchmesser kleiner als 1 Airyscheibe oder von 0,7 bis 0,8 Airyscheiben oder von 0,7 Airyscheiben ist.