公开(公告)号：US11488900B2

公开(公告)日：2022-11-01

申请号：US17232109

申请日：2021-04-15

Applicant: Unimicron Technology Corp.

Inventor： Yan-Jia Peng ,  Kuo-Ching Chen ,  Pu-Ju Lin

IPC: H01L23/498 ,  H05K3/46 ,  H01L23/12 ,  H01L23/528 ,  H01L21/768 ,  H01L23/16 ,  H01L23/00 ,  H01L21/50 ,  H01L23/532

Abstract: A method of fabricating a wiring board with an embedded interposer substrate includes preparing a main substrate, forming a recess on the main substrate, placing an interposer substrate into the recess, electrically connecting a second pad of the interposer substrate and the first pad of the main substrate, and filling a gap between the interposer substrate and the main substrate with an underfill. The recess exposes a first pad of the main substrate. A second pad of interposer substrate and the first pad of the main substrate are made of the same metal and formed in different outer surface profiles. The underfill entirely touches side surfaces and a bottom surface of the interposer substrate.

公开(公告)号：US20220328387A1

公开(公告)日：2022-10-13

申请号：US17232128

申请日：2021-04-15

Applicant: Unimicron Technology Corp.

Inventor： John Hon-Shing Lau ,  Cheng-Ta Ko ,  Pu-Ju Lin ,  Kai-Ming Yang ,  Chi-Hai Kuo ,  Chia-Yu Peng ,  Tzyy-Jang Tseng

IPC: H01L23/498 ,  H01L21/48 ,  H01L21/683

Abstract: A package carrier includes a first redistribution layer having a first upper surface and a first lower surface and including a plurality of first redistribution circuits, a plurality of conductive through holes, a plurality of photoimageable dielectric layers, and a plurality of chip pads and a second redistribution layer disposed on the first upper surface of the first redistribution layer. The second redistribution layer has a second upper surface and a second lower surface aligned with and directly connected to the first upper surface of the first redistribution layer and includes a plurality of second redistribution circuits, a plurality of conductive structures, a plurality of Ajinomoto build-up Film (ABF) layers, and a plurality of solder ball pads. A line width and a line pitch of each of the first redistribution circuits are smaller than a line width and a line pitch of each of the second redistribution circuits.

公开(公告)号：US20220271208A1

公开(公告)日：2022-08-25

申请号：US17227391

申请日：2021-04-12

Applicant: Unimicron Technology Corp.

Inventor： Jeng-Ting Li ,  Chi-Hai Kuo ,  Cheng-Ta Ko ,  Pu-Ju Lin

IPC: H01L33/62 ,  H01L27/15 ,  H01L33/00

Abstract: A light emitting diode (LED) package structure includes a glass substrate, conductive through holes, active elements, an insulating layer, LEDs and pads. The glass substrate has an upper surface and a lower surface. The conductive through holes penetrate the glass substrate and connect the upper and the lower surfaces. The active elements are disposed on the upper surface of the glass substrate and electrically connected to the conductive through holes. The insulating layer is disposed on the upper surface and covers the active elements. The LEDs are disposed on the insulating layer and electrically connected to at least one of the active elements. The pads are disposed on the lower surface of the glass substrate and electrically connected to the conductive through holes. A source of at least one active elements is directly electrically connected to at least one of the corresponding pads through the corresponding conductive through hole.

公开(公告)号：US11410971B2

公开(公告)日：2022-08-09

申请号：US17098436

申请日：2020-11-15

Applicant: Unimicron Technology Corp.

Inventor： Tzyy-Jang Tseng ,  Pu-Ju Lin ,  Cheng-Ta Ko ,  Ra-Min Tain

IPC: H01L25/065 ,  H01L23/538 ,  H01L23/498 ,  H01L23/48 ,  H01L23/00

Abstract: A chip package structure includes a substrate, a first chip, a second chip, a bridge, a plurality of first bumps, a plurality of second bumps, a plurality of third bumps and a plurality of solder balls. A first active surface of the first chip and a second active surface of the second chip face a first surface of the substrate. The bridge includes a high-molecular polymer layer and a pad layer located on the high-molecular polymer layer. The first chip is electrically connected to the substrate through the first bumps. The second chip is electrically connected to the substrate through the second bumps. The first chip and the second chip are electrically connected to the pad layer through the third bumps. The first bumps and the second bumps have the same size. The solder balls are disposed on a second surface of the substrate and electrically connected to the substrate.

公开(公告)号：US11366381B2

公开(公告)日：2022-06-21

申请号：US16395244

申请日：2019-04-26

Applicant: Unimicron Technology Corp.

Inventor： Pu-Ju Lin ,  Shih-Lian Cheng ,  Yu-Hua Chen ,  Cheng-Ta Ko ,  Jui-Jung Chien ,  Wei-Tse Ho

IPC: B32B37/00 ,  G03F1/50 ,  H05K3/06 ,  H05K3/24 ,  H05K3/00 ,  H05K3/10 ,  H05K3/12 ,  H05K3/18 ,  H05K3/42 ,  G03F7/20 ,  G01K7/24 ,  G01K15/00

Abstract: A mask structure and a manufacturing method of the mask structure are provided. The mask structure includes a transparent substrate, a patterned metal layer, and a plurality of microlens structures. The patterned metal layer is disposed on the transparent substrate and exposing a portion of the transparent substrate. The microlens structures are disposed on the transparent substrate exposed by a portion of the patterned metal layer and being in contact with the portion of the patterned metal layer.

公开(公告)号：US11362057B2

公开(公告)日：2022-06-14

申请号：US16687557

申请日：2019-11-18

Applicant: Unimicron Technology Corp.

Inventor： Pu-Ju Lin ,  Cheng-Ta Ko ,  Ra-Min Tain ,  Tzyy-Jang Tseng

IPC: H01L23/00 ,  H01L23/538 ,  H01L25/065

Abstract: A chip package structure includes a substrate, at least two chips, a plurality of first pads, a plurality of first micro bumps, and a bridging element. The substrate has a first surface and a second surface opposite to the first surface. The two chips are disposed on the first surface of the substrate and are horizontally adjacent to each other. Each chip has an active surface. The first pads are disposed on the active surface of each of the chips. The first micro bumps are disposed on the first pads and have the same size. The bridging element is disposed on the first micro bumps such that one of the chips is electrically connected to another of the chips through the first pads, the first micro bumps, and the bridging element.

公开(公告)号：US20220108953A1

公开(公告)日：2022-04-07

申请号：US17314055

申请日：2021-05-07

Applicant: Unimicron Technology Corp.

Inventor： John Hon-Shing Lau ,  Cheng-Ta Ko ,  Pu-Ju Lin ,  Tzyy-Jang Tseng ,  Ra-Min Tain ,  Kai-Ming Yang

IPC: H01L23/538 ,  H01L25/065 ,  H01L23/00 ,  H01L25/00 ,  H01L21/48

Abstract: A package structure, including a bridge, an interposer, a first redistribution structure layer, a second redistribution structure layer, and multiple chips, is provided. The bridge includes a silicon substrate, a redistribution layer, and multiple bridge pads. The interposer includes an intermediate layer, multiple conductive vias, multiple first pads, and multiple second pads. The bridge is embedded in the intermediate layer. The bridge pads are aligned with the upper surface. The first redistribution structure layer is disposed on the upper surface of the interposer and is electrically connected to the first pads and the bridge pads. The second redistribution structure layer is disposed on the lower surface of the interposer and is electrically connected to the second pads. The chips are disposed on the first redistribution structure layer and are electrically connected to the first redistribution structure layer. The chips are electrically connected to each other through the bridge.

公开(公告)号：US20220069489A1

公开(公告)日：2022-03-03

申请号：US17319109

申请日：2021-05-13

Applicant: Unimicron Technology Corp.

Inventor： John Hon-Shing Lau ,  Chia-Yu Peng ,  Kai-Ming Yang ,  Pu-Ju Lin ,  Cheng-Ta Ko ,  Tzyy-Jang Tseng

IPC: H01R12/52 ,  H01L21/48 ,  H01L23/498 ,  H01R4/04 ,  H01R43/00

Abstract: A circuit board structure, including a redistribution circuit structure layer, a build-up circuit structure layer, and a connection structure layer, is provided. The redistribution circuit structure layer includes multiple first connecting pads. The build-up circuit structure layer is disposed on one side of the redistribution circuit structure layer and includes multiple second connecting pads. A line width and a line spacing of the redistribution circuit structure layer are smaller than a line width and a line spacing of the build-up circuit structure layer. The connection structure layer is disposed between the redistribution circuit structure layer and the build-up circuit structure layer, and includes a substrate and multiple conductive paste pillars penetrating the substrate. The first connecting pads are electrically connected to the second connecting pads respectively through the conductive paste pillars. The first connecting pads and the second connecting pads are respectively embedded in two opposite surfaces of the substrate.

公开(公告)号：US20210251107A1

公开(公告)日：2021-08-12

申请号：US17017702

申请日：2020-09-11

Applicant: Unimicron Technology Corp.

Inventor： Ra-Min Tain ,  Pu-Ju Lin ,  Cheng-Chung Lo ,  Chi-Hai Kuo ,  Cheng-Ta Ko ,  Tzyy-Jang Tseng ,  John Hon-Shing Lau

IPC: H05K7/20 ,  F28D15/02 ,  F28D15/04 ,  B21D53/08

Abstract: A vapor chamber structure includes a thermally conductive housing, a capillary structure layer, a grid structure layer, and a working fluid. The thermally conductive housing has a sealed chamber, where a pressure in the sealed chamber is lower than a standard atmospheric pressure. The capillary structure layer is disposed in the sealed chamber. The grid structure layer is disposed in the sealed chamber and arranged along a first direction. A size of the grid structure layer is less than or equal to a size of the capillary structure layer. The working fluid fills the sealed chamber.

公开(公告)号：US20210136931A1

公开(公告)日：2021-05-06

申请号：US17147474

申请日：2021-01-13

Applicant: Unimicron Technology Corp.

Inventor： Tzyy-Jang Tseng ,  Cheng-Ta Ko ,  Pu-Ju Lin ,  Tse-Wei Wang

IPC: H05K3/46 ,  H05K3/40 ,  H05K1/11 ,  H05K1/03

Abstract: A manufacturing method of a carrier structure includes: A build-up circuit layer is formed on a carrier. The build-up circuit layer includes at least one first circuit layer, at least one first dielectric layer, a second circuit layer, a second dielectric layer, and a plurality of conductive vias. The first circuit layer is located on the carrier and includes at least one first pad, which is disposed relative to at least one through hole of the carrier. The first dielectric layer is located on the first circuit layer. The second circuit layer is located on the first dielectric layer and includes at least one second pad. The second dielectric layer is located on the second circuit layer and includes at least one opening exposing the second pad. The conductive via penetrates the first dielectric layer and is electrically connected to the first circuit layer and the second circuit layer.