ELECTRON BEAM EXPOSURE SYSTEM
    50.
    发明申请
    ELECTRON BEAM EXPOSURE SYSTEM 审中-公开
    电子束曝光系统

    公开(公告)号:WO2004040614A3

    公开(公告)日:2004-09-16

    申请号:PCT/NL0300745

    申请日:2003-10-30

    Abstract: The invention relates to an electron beam exposure apparatus for transferring a pattern onto the surface of a target (14), comprising: a beamlet generator for generating a plurality of electron beamlets (5a, 5b); a modulation array for receiving said plurality of electron beamlets, comprising a plurality of modulators for modulating the intensity of an electron beamlet; a controller, connected to the modulation array for individually controlling the modulators, an adjustor, operationally connected to each modulator, for individually adjusting the control signal of each modulator; a focusing electron optical system comprising an array of electrostatic lenses (7) wherein each lens focuses a corresponding individual beamlet, which is transmitted by said modulation array, to a cross section smaller than 300 nm, and a target holder for holding a target with its exposure surface onto which the pattern is to be transferred in the first focal plane of the focusing electron optical system.

    Abstract translation: 本发明涉及一种用于将图案转移到目标(14)的表面上的电子束曝光装置,包括:用于产生多个电子小射束(5a,5b)的小射束发生器; 用于接收所述多个电子小射束的调制阵列,其包括用于调制电子小射束的强度的多个调制器; 连接到调制阵列的控制器,用于单独控制调制器;调节器,可操作地连接到每个调制器,用于单独调节每个调制器的控制信号; 包括静电透镜阵列(7)的聚焦电子光学系统,其中每个透镜将由所述调制阵列发射的相应的单个子束聚焦到小于300nm的横截面,以及用于保持靶 在聚焦电子光学系统的第一焦平面上图案将被转印到曝光表面上。

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