公开(公告)号：AT415641T

公开(公告)日：2008-12-15

申请号：AT04787202

申请日：2004-09-23

Applicant: LEICA MICROSYSTEMS

Inventor： ULRICH HEINRICH ,  KNEBEL WERNER ,  MOELLMANN KYRA

IPC: G02B21/00 ,  G02B21/02 ,  G02B21/06 ,  G02B21/08 ,  G02B21/32

Abstract: A scanning microscope includes a light source for evanescently illuminating a sample disposed on a slide. A point detector receives detection light emanating from a scanning point of the sample. A beam deflection device disposed in an optical path of the detection light can shift a position of the scanning point.

公开(公告)号：DE102007002863B3

公开(公告)日：2008-08-07

申请号：DE102007002863

申请日：2007-01-15

Applicant: LEICA MICROSYSTEMS

Inventor： SEIFERT ROLAND ,  KNEBEL WERNER

IPC: G02B7/00 ,  F16C1/02 ,  G02B7/10 ,  G02B21/02

Abstract: The device has a transmission unit (3) that works between an operating unit (2) e.g. stepping motor, and an optical component (1) i.e. lens. The transmission unit transfers a traction force and/or pressure force, which is transferred in advance by the operating unit, to the optical component based on inclination. The transmission unit is attached to an adjustment unit (6) that works on the optical component. The adjustment unit is movable or tiltable to the optical component over the operating unit and the transmission unit, where the adjustment unit is pressable against the optical component.

公开(公告)号：DE102005046638A1

公开(公告)日：2007-04-05

申请号：DE102005046638

申请日：2005-09-29

Applicant: LEICA MICROSYSTEMS

Inventor： KNEBEL WERNER

IPC: G02B21/00

Abstract: The microscope has a light source (3) emitting an illumination light beam (5) for illuminating a sample (7). The illumination light beam runs along an illumination optical path (9) and is guided across or through the sample along with a beam deflection device (11). An additional light source (13) produces a manipulation light beam (15) that runs along a manipulation optical path (16), where the manipulation light beam forms a manipulation beam focus. An optical unit (20) e.g. zoom lens, is mounted downstream of the additional light source in the manipulation light beam. An independent claim is also included for a method for sample manipulation with a manipulation light beam in a scanning microscope.

公开(公告)号：DE10356826A1

公开(公告)日：2005-07-07

申请号：DE10356826

申请日：2003-12-05

Applicant: LEICA MICROSYSTEMS

Inventor： BOEHM INGO ,  KNEBEL WERNER ,  ULRICH HEINRICH

IPC: G02B21/00 ,  G02B21/06 ,  G02F1/11

Abstract: A scanning microscope includes at least one light source, an acousto-optical element, a beam deflection device and a beam guiding device. The at least one light source generates an illuminating light beam. The acousto-optical element spatially splits a sub-light beam from the illuminating light beam and adjusts an optical power of the illuminating light beam. The beam deflection device scans the illuminating light beam over or through a sample. The beam guiding device directs the sub-light beam onto the sample.

公开(公告)号：DE10335466A1

公开(公告)日：2005-03-03

申请号：DE10335466

申请日：2003-08-02

Applicant: LEICA MICROSYSTEMS

Inventor： STORZ RAFAEL ,  KNEBEL WERNER

IPC: G02B21/06 ,  G02B21/00 ,  G01J3/06

Abstract: The scanning microscope (1) has an incoupling apparatus (31) with which light (33) other than the light (17) proceeding from the sample (7) is coupled into the detection beam path and conveyed to the detector (21). A closure apparatus automatically closes off the incoupling apparatus from the outside, in largely light-tight fashion, when the light guide (37) guiding the other light to the incoupling apparatus is removed. An independent claim is also included for confocal scanning microscope.

公开(公告)号：AU2003280287A1

公开(公告)日：2004-06-23

申请号：AU2003280287

申请日：2003-09-23

Applicant: LEICA MICROSYSTEMS

Inventor： BIRK HOLGER ,  STORZ RAFAEL ,  KNEBEL WERNER

IPC: G02B21/00

公开(公告)号：DE10243447A1

公开(公告)日：2004-03-25

申请号：DE10243447

申请日：2002-09-19

Applicant: LEICA MICROSYSTEMS

Inventor： KNEBEL WERNER

IPC: G02B21/00

Abstract: Scanning microscopy method has the following steps: illumination of a probe with an illumination light beam that has a given illumination frequency and direction and that generates detection light from the sample that has a frequency which is a harmonic of the illumination frequency; reflection of at least a part of the detection light back from the probe using a mirror that is transparent to the illumination light wavelength and reflective for the detection light; and receipt of the reflected light and detection light emitted in a direction opposite to the illumination light direction with a detector. An Independent claim is made for a scanning microscope.

公开(公告)号：DE10233549A1

公开(公告)日：2004-02-12

申请号：DE10233549

申请日：2002-07-23

Applicant: LEICA MICROSYSTEMS

Inventor： STORZ RAFAEL ,  SEYFRIED VOLKER ,  KNEBEL WERNER

IPC: G02B21/00 ,  G02B21/06

Abstract: Scanning microscope has a light source that generates an illuminating beam for illumination of a sample. A beam deflection device is provided with which the illumination beam can be directed through or over the sample. A detection beam from the sample is detected using a detector. An additional manipulation light beam is provided for probe handling and positioning, with the manipulation light beam being adjusted with the same beam deflection device as the sample illumination beam. An Independent claim is made for a scanning microscopy method.

公开(公告)号：GB2369739A

公开(公告)日：2002-06-05

申请号：GB0123392

申请日：2001-09-28

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  KNEBEL WERNER

IPC: G02B26/10 ,  G02B21/00 ,  G02B21/06 ,  G02B21/24 ,  G02B21/36 ,  G06T1/00

Abstract: A scanning microscope comprises means (3) for acquiring and displaying a preview image (7), a microscope optical system (51) and means (5) for marking at least one region (27, 29) of interest in the preview image (7). A first beam deflection device (43, 67, 68) directs the scan field (31, 33) onto the vicinity of the region of interest; and a second beam deflection device (49, 72, 94) serves for meander-shaped scanning within the scan field (31, 33).

公开(公告)号：DE10050529A1

公开(公告)日：2002-04-18

申请号：DE10050529

申请日：2000-10-11

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  KNEBEL WERNER

IPC: G02B26/10 ,  G02B21/00 ,  G02B21/06 ,  G02B21/24 ,  G02B21/36 ,  G06T1/00

Abstract: A method and an arrangement for beam control in a scanning microscope are disclosed. The scanning microscope comprises means for acquiring and displaying (3) a preview image (7) and a microscope optical system (51). Means for marking (5) at least one region of interest (27, 29) in the preview image (7) are provided. A first beam deflection device (43, 67, 68) displaces the scan field (31, 33) onto the region of interest (27, 29); and a second beam deflection device (49, 72, 94) serves for meander-shaped scanning within the scan field (31, 33).