61.
    发明专利
    未知

    公开(公告)号:DE10120425C2

    公开(公告)日:2003-12-18

    申请号:DE10120425

    申请日:2001-04-26

    Abstract: A method for examining a specimen ( 27 ) that exhibits at least two optical transition lines and is optically excitable at least with light of a first and light of a second wavelength is characterized by the step of illuminating the specimen ( 27 ) with illuminating light ( 15 ) that generates at least a multiple of the first wavelength and a multiple of the second wavelength; and by the step of detecting the detected light ( 29 ) proceeding from the specimen ( 27 ). Also disclosed is a scanning microscope system ( 1 ) having at least one light source ( 3 ) that emits illuminating light ( 15 ) for illumination of a specimen ( 27 ), the specimen ( 27 ) exhibiting at least two optical transition lines and being optically excitable at least with light of a first and light of a second wavelength, having at least one detector ( 41, 43, 65, 77, 79 ) for detection of the detected light ( 29 ) proceeding from the specimen ( 27 ) and an objective ( 25 ) for focusing the illuminating light ( 15 ) onto a subregion of the specimen ( 27 ). The scanning microscope system is characterized in that the illuminating light ( 15 ) generates at least a multiple of the first wavelength and a multiple of the second wavelength.

    62.
    发明专利
    未知

    公开(公告)号:DE10121732A1

    公开(公告)日:2002-11-07

    申请号:DE10121732

    申请日:2001-05-04

    Abstract: The present invention concerns a microscope and a method for operating a microscope, in particular a confocal or double confocal scanning microscope, having an optical beam path (9) extending between a light source (1), a specimen (2), and a detector (7) and/or a detection optical system, in which context intentional and unintentional relative motions occur between the specimen (2) and the optical beam path (9), undesired relative motions of the microscope components in optical beam path (9) are intended to result in no (or only minor) image defects, and method steps are provided which eliminate or minimize the image defects brought about by undesired relative motions between the specimen (2) and optical beam path (9); and is characterized in that a first device (8) detects relative motions; and a second device (22) compensates for unintentional relative motions.

    Confocal fluorescence microscope with apparatus for illuminating a specimen

    公开(公告)号:GB2366393B

    公开(公告)日:2002-08-07

    申请号:GB0105281

    申请日:2001-03-02

    Inventor: HOFFMANN JUERGEN

    Abstract: An apparatus for illuminating a specimen (1), preferably in confocal fluorescence scanning microscopy is disclosed. Two illumination beam paths (2, 4) are combined with a beam splitter (6) in order to simplify alignment and reduce the optical components in the illumination beam path. The at least one optical component (7) is arranged at least in one of the illumination beam paths (2, 4) and modifies the light; and that the optical properties of the component (7) can be influenced or modified in such a way that the illumination pattern of the illumination beam path (2, 4) in the specimen region changes shape.

    66.
    发明专利
    未知

    公开(公告)号:DE10043986A1

    公开(公告)日:2002-03-14

    申请号:DE10043986

    申请日:2000-09-05

    Abstract: A method for examining a specimen (11) by means of a confocal scanning microscope having at least one light source (1), preferably a laser, to generate an illuminating light beam (4) for the specimen (11), and a beam deflection device (9) to guide the illuminating light beam (4) over the specimen (11) comprises, in the interest of reliable definition of details or regions of interest of the specimen (11), the following method steps: Firstly a preview image is acquired. Then at least one region of interest in the preview image is marked. This is followed by allocation of individual illuminating light beam wavelengths and/or illuminating light beam power levels to the region or regions. Illumination of the region or regions of the specimen (11) in accordance with the allocation is then accomplished, at least one manipulation in at least one region (25) being performed by means of the illumination. Also described is a confocal scanning microscope having at least one light source (1), preferably a laser, to generate an illuminating light beam (4) for a specimen (11), and a beam deflection device (9) to guide the illuminating light beam (4) over the specimen (11), means for acquiring a preview image and means for marking at least one region of interest in the preview image being provided, such that individual illuminating light beam wavelengths and/or illuminating light beam power levels can be allocated to the region or regions, and the region or regions of the specimen (11) can be illuminated in accordance with the allocation, and such that at least one manipulation in at least one region (25) can be performed by means of the illumination.

    67.
    发明专利
    未知

    公开(公告)号:DE10038622A1

    公开(公告)日:2002-02-21

    申请号:DE10038622

    申请日:2000-08-03

    Abstract: A scanning microscope, in particular a confocal scanning microscope, with a light source (1), preferably a laser, for generating an illumination light beam (14) for a sample (11) and a scanning device for deflecting the illumination light beam (14) is, with a view to fast and reliable image-data acquisition and a compact structure, configured and refined in such a way that the scanning device has at least one micromirror (16). An optical arrangement with a light source (1), preferably a laser, for generating a light beam and at least one micromirror (16) for deflecting the light beam is furthermore provided, in which an adaptive lens (22) is provided for correcting for mirror defects or deformation of the mirror surface. Lastly, a method for imaging in scanning microscopy, in particular in confocal scanning microscopy, with a light source (1), preferably a laser, for generating an illumination light beam (14) for a sample (11) and a scanning device for deflecting the illumination light beam (14) is provided, in which at least one micromirror (16) is used in the scope of the scanning device.

Patent Agency Ranking