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公开(公告)号:DE10120425C2
公开(公告)日:2003-12-18
申请号:DE10120425
申请日:2001-04-26
Applicant: LEICA MICROSYSTEMS
Inventor: ENGELHARDT JOHANN , HOFFMANN JUERGEN
Abstract: A method for examining a specimen ( 27 ) that exhibits at least two optical transition lines and is optically excitable at least with light of a first and light of a second wavelength is characterized by the step of illuminating the specimen ( 27 ) with illuminating light ( 15 ) that generates at least a multiple of the first wavelength and a multiple of the second wavelength; and by the step of detecting the detected light ( 29 ) proceeding from the specimen ( 27 ). Also disclosed is a scanning microscope system ( 1 ) having at least one light source ( 3 ) that emits illuminating light ( 15 ) for illumination of a specimen ( 27 ), the specimen ( 27 ) exhibiting at least two optical transition lines and being optically excitable at least with light of a first and light of a second wavelength, having at least one detector ( 41, 43, 65, 77, 79 ) for detection of the detected light ( 29 ) proceeding from the specimen ( 27 ) and an objective ( 25 ) for focusing the illuminating light ( 15 ) onto a subregion of the specimen ( 27 ). The scanning microscope system is characterized in that the illuminating light ( 15 ) generates at least a multiple of the first wavelength and a multiple of the second wavelength.
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公开(公告)号:DE10121732A1
公开(公告)日:2002-11-07
申请号:DE10121732
申请日:2001-05-04
Applicant: LEICA MICROSYSTEMS
Inventor: ENGELHARDT JOHANN , HOFFMANN JUERGEN
Abstract: The present invention concerns a microscope and a method for operating a microscope, in particular a confocal or double confocal scanning microscope, having an optical beam path (9) extending between a light source (1), a specimen (2), and a detector (7) and/or a detection optical system, in which context intentional and unintentional relative motions occur between the specimen (2) and the optical beam path (9), undesired relative motions of the microscope components in optical beam path (9) are intended to result in no (or only minor) image defects, and method steps are provided which eliminate or minimize the image defects brought about by undesired relative motions between the specimen (2) and optical beam path (9); and is characterized in that a first device (8) detects relative motions; and a second device (22) compensates for unintentional relative motions.
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公开(公告)号:GB2366393B
公开(公告)日:2002-08-07
申请号:GB0105281
申请日:2001-03-02
Applicant: LEICA MICROSYSTEMS
Inventor: HOFFMANN JUERGEN
Abstract: An apparatus for illuminating a specimen (1), preferably in confocal fluorescence scanning microscopy is disclosed. Two illumination beam paths (2, 4) are combined with a beam splitter (6) in order to simplify alignment and reduce the optical components in the illumination beam path. The at least one optical component (7) is arranged at least in one of the illumination beam paths (2, 4) and modifies the light; and that the optical properties of the component (7) can be influenced or modified in such a way that the illumination pattern of the illumination beam path (2, 4) in the specimen region changes shape.
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公开(公告)号:DE10044647A1
公开(公告)日:2002-04-04
申请号:DE10044647
申请日:2000-09-08
Applicant: LEICA MICROSYSTEMS
Inventor: HOFFMANN JUERGEN
Abstract: Light from a source (3) is coupled into a fiber (4) and induces excitation transitions in the fiber. The light induced by the excitation transitions is used to illuminate the objects (2). The fiber may be suitable for fluorescent excitation. The device may include an acousto-optical tunable filter or LCD attenuator.
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公开(公告)号:DE10046410A1
公开(公告)日:2002-03-28
申请号:DE10046410
申请日:2000-09-18
Applicant: LEICA MICROSYSTEMS
Inventor: BEWERSDORF JOERG , GUGEL HILMAR , HOFFMANN JUERGEN
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公开(公告)号:DE10043986A1
公开(公告)日:2002-03-14
申请号:DE10043986
申请日:2000-09-05
Applicant: LEICA MICROSYSTEMS
Inventor: ENGELHARDT JOHANN , HOFFMANN JUERGEN , KNEBEL WERNER
Abstract: A method for examining a specimen (11) by means of a confocal scanning microscope having at least one light source (1), preferably a laser, to generate an illuminating light beam (4) for the specimen (11), and a beam deflection device (9) to guide the illuminating light beam (4) over the specimen (11) comprises, in the interest of reliable definition of details or regions of interest of the specimen (11), the following method steps: Firstly a preview image is acquired. Then at least one region of interest in the preview image is marked. This is followed by allocation of individual illuminating light beam wavelengths and/or illuminating light beam power levels to the region or regions. Illumination of the region or regions of the specimen (11) in accordance with the allocation is then accomplished, at least one manipulation in at least one region (25) being performed by means of the illumination. Also described is a confocal scanning microscope having at least one light source (1), preferably a laser, to generate an illuminating light beam (4) for a specimen (11), and a beam deflection device (9) to guide the illuminating light beam (4) over the specimen (11), means for acquiring a preview image and means for marking at least one region of interest in the preview image being provided, such that individual illuminating light beam wavelengths and/or illuminating light beam power levels can be allocated to the region or regions, and the region or regions of the specimen (11) can be illuminated in accordance with the allocation, and such that at least one manipulation in at least one region (25) can be performed by means of the illumination.
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公开(公告)号:DE10038622A1
公开(公告)日:2002-02-21
申请号:DE10038622
申请日:2000-08-03
Applicant: LEICA MICROSYSTEMS
Inventor: ENGELHARDT JOHANN , HOFFMANN JUERGEN
Abstract: A scanning microscope, in particular a confocal scanning microscope, with a light source (1), preferably a laser, for generating an illumination light beam (14) for a sample (11) and a scanning device for deflecting the illumination light beam (14) is, with a view to fast and reliable image-data acquisition and a compact structure, configured and refined in such a way that the scanning device has at least one micromirror (16). An optical arrangement with a light source (1), preferably a laser, for generating a light beam and at least one micromirror (16) for deflecting the light beam is furthermore provided, in which an adaptive lens (22) is provided for correcting for mirror defects or deformation of the mirror surface. Lastly, a method for imaging in scanning microscopy, in particular in confocal scanning microscopy, with a light source (1), preferably a laser, for generating an illumination light beam (14) for a sample (11) and a scanning device for deflecting the illumination light beam (14) is provided, in which at least one micromirror (16) is used in the scope of the scanning device.
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公开(公告)号:DE10049296A1
公开(公告)日:2002-02-14
申请号:DE10049296
申请日:2000-10-04
Applicant: LEICA MICROSYSTEMS
Inventor: ENGELHARDT JOHANN , HOFFMANN JUERGEN
Abstract: The arrangement has a light source, preferably a laser, for generating a light beam, at least one acousto-optical deflector (3) for the light beam and a correction device for radiation errors caused by the deflector. The correction device has an adaptive optical arrangement (2), especially for correcting phase front errors. Independent claims are also included for the following: a method of deflecting light beams.
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公开(公告)号:DE10035688A1
公开(公告)日:2002-02-07
申请号:DE10035688
申请日:2000-07-20
Applicant: LEICA MICROSYSTEMS
Inventor: ENGELHARDT JOHANN , HOFFMANN JUERGEN
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公开(公告)号:DE10031458A1
公开(公告)日:2002-01-17
申请号:DE10031458
申请日:2000-06-28
Applicant: LEICA MICROSYSTEMS
Inventor: HOFFMANN JUERGEN
IPC: G02B21/00
Abstract: The device has at least one illumination source (4), an objective (10) and at least one detector (12). An optical circulator (15) arranged between the source(s), the objective and the detector(s) feeds light from the source(s) to the objective, which is associated with a specimen (11) under investigation and light from the specimen to the detector(s).
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