System and method for double sided optical inspection of thin film disks or wafers
    61.
    发明公开
    System and method for double sided optical inspection of thin film disks or wafers 审中-公开
    系统与Verfahrenfürdoppelseitige optische Inspektion vonDünnfilmplattenoder Wafern

    公开(公告)号:EP2378273A2

    公开(公告)日:2011-10-19

    申请号:EP10182395.3

    申请日:2004-12-03

    Inventor: Meeks, Steven W.

    Abstract: A double-sided optical inspection system is presented which may detect and classify particles, pits and scratches on thin film disks or wafers in a single scan of the surface. In one embodiment, the invention uses a pair of orthogonally oriented laser beams, one in the radial and one in the circumferential direction on both surfaces of the wafer or thin film disk. The scattered light from radial and circumferential beams is separated via their polarization or by the use of a dichroic mirror together with two different laser wavelengths.

    Abstract translation: 一种用于测量物体表面上的缺陷的方法,包括:将第一光束在第一入射平面中朝向物体上的第一位置引导; 将第二光束引导到物体(4501)上的第二位置的第二入射平面中,其中第一入射平面和第二入射平面之间的角度为零,并且其中第一光束被引导在圆周 方向(4504),并且所述第二光束被引导在所述物体(4501)的径向方向上; 检测第一散射光束; 并检测第二散射光束; 其中所述第一散射光束包括来自所述第一位置的散射光强度,并且所述第二散射光束包括来自所述第二位置的散射光强度,所述方法还包括比较所述第一散射光束和所述第二散射光束以确定 物体表面上的缺陷的第一纵横比(4501)。

    Apparatus for inspecting the surface of materials
    63.
    发明公开
    Apparatus for inspecting the surface of materials 失效
    Gerätzur Untersuchung vonMaterialienoberflächen。

    公开(公告)号:EP0557558A1

    公开(公告)日:1993-09-01

    申请号:EP92103406.2

    申请日:1992-02-27

    Abstract: An apparatus for inspecting the surface of a sheet-like object, comprising:
       a movable stage with an object mounted thereon;
       lighting means for lighting the object on the stage, particularly by making a plurality of illumination lights respectively having different wavelengths incident on the surface of the object from respective predetermined directions;
       image pickup means for fetching the image of the object under illumination of said lighting means as image data or the images of parts of the object as image data obtained on the respective different wavelengths;
       image data processing means for inspecting said image data for defects;
       and synchronization control means either for flashing the lighting means at a predetermined time interval just after the said stage commences its movement, synchronously with fetching the image data or for flashing the lighting means and simultaneously fetching the image data obtained on the respective different wavelengths, synchronously with the object on the stage reaching respective predetermined positions while moving said stage.

    Abstract translation: 一种用于检查片状物体的表面的装置,包括:安装有物体的可移动台; 照明装置,用于照亮舞台上的物体,特别是通过分别具有不同波长的多个照明光从各个预定方向入射到物体的表面上; 图像拾取装置,用于在所述照明装置的照明下将所述物体的图像作为图像数据或所述对象的部分的图像作为在各个不同波长上获得的图像数据; 图像数据处理装置,用于检查所述图像数据的缺陷; 以及同步控制装置,用于在所述阶段开始其移动之后的预定时间间隔闪烁照明装置,与获取图像数据同步或用于闪烁照明装置并同时取得在各个不同波长上获得的图像数据 同时舞台上的物体在移动所述舞台时达到相应的预定位置。

    VORRICHTUNG UND VERFAHREN ZUR HANDHABUNG, BEARBEITUNG UND BEOBACHTUNG KLEINER TEILCHEN, INSBESONDERE BIOLOGISCHER TEILCHEN
    70.
    发明授权
    VORRICHTUNG UND VERFAHREN ZUR HANDHABUNG, BEARBEITUNG UND BEOBACHTUNG KLEINER TEILCHEN, INSBESONDERE BIOLOGISCHER TEILCHEN 失效
    设备和方法处理,加工和监测小颗粒,尤其是生物颗粒

    公开(公告)号:EP0679325B1

    公开(公告)日:1997-10-15

    申请号:EP94905056.1

    申请日:1994-01-13

    Inventor: SCHUTZE, Raimund

    CPC classification number: G01N15/0205 C12M41/46 G01N2201/103 G01N2201/1087

    Abstract: The description relates to a device for handling, treating and observing small particles, especially biological particles. A first laser (4) generates light beams in a first wavelength range which are focussed by a first optical device (12, 13; 14, 15) and form an optical trap. A slide (22) holds corresponding particles. There is also a light source (17) for observation purposes and observation and recording devices for observing the particles and recording their behaviour. A second laser (3) generates light beams in a second wavelength range which are focussed so that particles on the slide may be treated. The optical devices for the light beams can be positioned and adjusted independently of each other and thus the light beams can be focussed in the same object plane of the slide at the start of treatment and observation independently of their wavelengths.

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