公开(公告)号：KR1020120127054A

公开(公告)日：2012-11-21

申请号：KR1020110045281

申请日：2011-05-13

Applicant: 한국표준과학연구원

Inventor： 문정희 ,  문대원 ,  이태걸 ,  윤소희 ,  김주황

IPC: H01J49/00 ,  H01J49/40 ,  H01J49/14 ,  H01J49/06 ,  H01J49/04

CPC classification number: H01J49/0004 ,  H01J49/142 ,  H01J49/164 ,  H01J49/40 ,  H01J49/406 ,  H01J49/0418 ,  H01J49/067 ,  H01J49/408

Abstract: PURPOSE: A flight time based mass microscope system is provided to change lens conditions by measuring mass imaging analysis of a sample with a TOF(Time of flight) base microscope mode. CONSTITUTION: A laser input unit(110) radiates laser beam to a sample. An ion gun assembly(120) radiates ion beam to the sample. A sample inlet chamber(130) introduces the sample through a sample inlet unit(131). The sample is arranged on a sample plate(140). A sample plate manipulator(150) controls the location of the sample plate. A CCD(Charge Coupled Device) camera takes a photograph of an image of the sample. A source lens assembly controls focus of the laser beam or the ion beam. A position measuring TOF detector measures the location of secondary ion generated in the sample.

Abstract translation: 目的：提供基于飞行时间的质量显微镜系统，通过测量具有TOF（飞行时间）基底显微镜模式的样品的质量成像分析来改变透镜状态。 构成：激光输入单元（110）向样品辐射激光束。 离子枪组件（120）将离子束辐射到样品。 样品入口室（130）将样品引入样品入口单元（131）。 样品被布置在样品板（140）上。 样品板机械手（150）控制样品板的位置。 CCD（电荷耦合器件）相机拍摄样品的图像。 源透镜组件控制激光束或离子束的焦点。 位置测量TOF检测器测量样品中产生的二次离子的位置。

公开(公告)号：KR1020140116139A

公开(公告)日：2014-10-01

申请号：KR1020147020604

申请日：2012-12-06

Applicant: 디에이치 테크놀로지즈 디벨롭먼트 피티이. 리미티드

Inventor： 호플러로버트이. ,  로이드윌리엄엠.

IPC: H01J49/40 ,  H01J49/04

CPC classification number: H01J49/405 ,  H01J49/0027 ,  H01J49/02 ,  H01J49/406

Abstract: 일부 실시예에서, 비행시간형 질량 분석계는 이온들을 받아들이는 입력 오리피스, 제1 경로를 따라서 상기 이온들을 가속시키는 제1 이온 가속기 스테이지, 상기 가속된 이온들을 받아들이고 상기 이온들을 상기 제1 경로와 상이한 제2 경로를 따라서 방향전환시키는 적어도 하나의 이온 반사기, 및 상기 적어도 하나의 이온 반사기에 의해 방향전환된 이온들 중 적어도 일부를 검출하는 검출기, 및 상기 제1 가속 스테이지와 상기 검출기 사이에 배치된 적어도 제1 및 제2 필드 자유 표류 영역을 포함하고, 여기서 상기 제2 필드 자유 영역은 상기 검출기의 근방에 배치된다. 일부 실시예에서, 상기 필드 자유 표류 영역의 길이는 이온들의 최초 위치에서의 변동에 대해 상기 이온들의 비행시간의 제1 및 제2 오더 보정을 제공하도록 선택될 수 있다.

公开(公告)号：KR1020050056937A

公开(公告)日：2005-06-16

申请号：KR1020057000890

申请日：2003-04-29

Applicant: 레코 코포레이션

Inventor： 베렌치코프아나톨리엔.

IPC: H01J49/40

CPC classification number: H01J49/406 ,  H01J49/004

Abstract: To provide comprehensive (i.e. rapid and sensitive) MS-MS analysis, the inventor employs a time-nested separation, using two time-of-flight (TOF) mass spectrometers. Parent ions are separated in a slow and long TOF1, operating at low ion energy (1 to l00eV), and fragment ions are mass analyzed in a fast and short TOF2, operating at much higher keV energy. Low energy fragmentation cell between TOF1 and TOF2 is tailored to accelerate fragmentation and dampening steps, mostly by shortening the cell and employing higher gas pressure. Since separation in TOF1 takes milliseconds and mass analysis in TOF2- microseconds, the invention provides comprehensive MS-MS analysis of multiple precursor ions per single ion pulse. Slow separation in TOF1 becomes possible with an introduction of novel TOF1 analyzers. The TOF-TOF could be implemented using a static TOF1, here described on the examples of spiratron, planar and cylindrical multi-pass separators with griddles spatial focusing ion mirrors. Higher performance is expected with the use of novel hybrid TOF 1 analyzers, combining radio frequency (RF) and quadratic DC fields. RF field retains low-energy ions within TOF 1 analyzer, while quadratic DC field improves resolution by compensate for large relative energy spread.

Abstract translation: 为了提供全面（即快速和敏感的）MS-MS分析，发明人采用时间嵌套分离，使用两个飞行时间（TOF）质谱仪。 母体离子以慢和长的TOF1分离，以低离子能（1至100eV）运行，碎片离子在快和短的TOF2中进行质量分析，运行在更高的keV能量下。 TOF1和TOF2之间的低能量碎裂电池适合加速碎裂和阻尼步骤，主要是通过缩短电池并采用更高的气体压力。 由于在TOF1中的分离需要几毫秒的时间和TOF2微秒的质量分析，本发明提供了每个离子脉冲多个前体离子的综合MS-MS分析。 引入新型TOF1分析仪可以使TOF1慢速分离。 TOF-TOF可以使用静态TOF1来实现，这里描述了具有格栅空间聚焦离子镜的螺旋桨，平面和圆柱形多通分离器的示例。 通过使用新型混合TOF 1分析仪，结合射频（RF）和二次直流场，可以期待更高的性能。 射频场保留了TOF 1分析仪内的低能离子，而二次直流场通过补偿大的相对能量扩散来提高分辨率。

公开(公告)号：EP4371144A1

公开(公告)日：2024-05-22

申请号：EP22740467.0

申请日：2022-07-08

Applicant: Micromass UK Limited

Inventor： WILDGOOSE, Jason Lee

IPC: H01J49/40 ,  H01J49/00

CPC classification number: H01J49/406 ,  H01J49/0027

公开(公告)号：EP3378091A1

公开(公告)日：2018-09-26

申请号：EP16867005.7

申请日：2016-11-16

Applicant: Micromass UK Limited ,  Leco Corporation

Inventor： HOYES, John Brian ,  VERENCHIKOV, Anatoly ,  YAVOR, Mikhail ,  RICHARDSON, Keith ,  WILDGOOSE, Jason

IPC: H01J49/40

CPC classification number: H01J49/406 ,  H01J49/0004 ,  H01J49/061 ,  H01J49/062 ,  H01J49/40 ,  H01J49/401

Abstract: A time-of-flight mass spectrometer is disclosed comprising: an ion deflector (305) configured to deflect ions to different positions in a first array of positions at different times; a position sensitive ion detector (187); and ion optics (180) arranged and configured to guide ions from the first array of positions to the position sensitive detector (187) so as to map ions from the first array of positions to a second array of positions on the position sensitive detector (187); wherein the ion optics includes at least one ion mirror for reflecting the ions.

公开(公告)号：EP3254299A1

公开(公告)日：2017-12-13

申请号：EP16702784.6

申请日：2016-01-29

Applicant: Auckland Uniservices Limited

Inventor： DERRICK, Peter ,  FILIPPOV, Igor

IPC: H01J49/06 ,  H01J49/40 ,  H01J49/42

CPC classification number: H01J49/061 ,  H01J49/405 ,  H01J49/406 ,  H01J49/408 ,  H01J49/422

Abstract: An ion mirror (10) for use in a time of flight mass spectrometer (100) comprises a first conductor (20) for producing a quadratic field along a first axis (80), and a second conductor (30) for producing a quadratic field along a second axis (90), the axes (80, 90) being orthogonal.

公开(公告)号：EP2078305B1

公开(公告)日：2017-05-17

申请号：EP07830134.8

申请日：2007-10-12

Applicant: Shimadzu Corporation

Inventor： SUDAKOV, Michael

IPC: H01J49/40

CPC classification number: H01J49/406

公开(公告)号：EP1866951A4

公开(公告)日：2010-12-08

申请号：EP06748558

申请日：2006-03-22

Applicant: LECO CORP

Inventor： VERENTCHIKOV ANATOLI N ,  YAVOR MIKHAIL

IPC: H01J49/40

CPC classification number: H01J49/408 ,  H01J49/406 ,  H01J49/48

Abstract: The present invention relates generally to a multi-reflecting time-of-flight mass spectrometer (MR TOF MS). To improve mass resolving power of a planar MR TOF MS, a spatially isochronous and curved interface may be used for ion transfer in and out of the MR TOF analyzer. One embodiment comprises a planar grid-free MR TOF MS with periodic lenses in the field-free space, a linear ion trap for converting ion flow into pulses and a C-shaped isochronous interface made of electrostatic sectors. The interface allows transferring ions around the edges and fringing fields of the ion mirrors without introducing significant time spread. The interface may also provide energy filtering of ion packets. The non-correlated turn-around time of ion trap converter may be reduced by using a delayed ion extraction from the ion trap and excessive ion energy is filtered in the curved interface.

公开(公告)号：EP1137044A2

公开(公告)日：2001-09-26

申请号：EP01302006.0

申请日：2001-03-05

Applicant: Micromass Limited

Inventor： Hoyes, John Brian

IPC: H01J49/40

CPC classification number: H01J49/406

Abstract: A time of flight mass analyser 1 having a drift region 2, an ion packet generator 6, first and second ion reflectors 18,19 and at least one ion detector 20 is disclosed. The drift region 2 has an axis 3, an entrance 4 and an exit 5 and provides for a place wherein ions may be temporally separated according to their mass-to-charge ratios. The ion packet generator 6 injects packets of ions into the drift region 2 at the region's entrance 4 from a beam of ions by intermittently applying an electrostatic field such that the packets of ions enter the drift region 2 in an initial direction which is inclined to the direction of said beam of ions. The first ion reflector 18 is disposed at the exit 5 of the drift region 2 to reflect back towards the entrance 4 ions which are travelling towards the reflector 18 in the drift region 2. The second ion reflector 19 is disposed in juxtaposition to the first ion reflector 18 to reflect packets of ions back towards the first ion reflector 18 through at least a portion of the drift region 2 so that the packet of ions may be reflected to and fro between said first 18 and second 19 ion reflectors and undergo a number n of reflections at the second ion reflector 19. A detector 20 is disposed to detect at least some packets of ions reflected by the first ion reflector 18 which do not enter the second ion reflector 19. The number of reflections at the second ion reflector 19 may be selected by adjustment of an inclination of the initial direction to the axis 3.

Abstract translation: 公开了具有漂移区2的飞行时间质量分析器1，离子包发生器6，第一和第二离子反射器18,19以及至少一个离子检测器20。 漂移区2具有轴线3，入口4和出口5，并且提供离子可根据其质荷比暂时分离的地方。 离子包发生器6通过间歇地施加静电场将来自离子束的离子区域的入口4的离子注入到漂移区域2中，使得离子包沿初始方向进入偏移区域2，该初始方向倾斜于 所述离子束的方向。 第一离子反射器18设置在漂移区域2的出口5处，以朝向在漂移区域2中朝向反射器18行进的入口4离子反射。第二离子反射器19与第一离子并置设置 反射器18，以通过漂移区2的至少一部分将离子束反射回第一离子反射器18，使得离子束可以在所述第一离子反射器18和第二离子反射器20之间来回反射，并经历数字n 在第二离子反射器19处的反射的设计。检测器20被设置为检测由第一离子反射器18反射的离子的至少一些分组，其不进入第二离子反射器19.在第二离子反射器19处的反射次数可以 通过调整初始方向与轴3的倾斜度来选择。

公开(公告)号：KR101790534B1

公开(公告)日：2017-10-27

申请号：KR1020110045281

申请日：2011-05-13

Applicant: 한국표준과학연구원

Inventor： 문정희 ,  문대원 ,  이태걸 ,  윤소희 ,  김주황

IPC: H01J49/00 ,  H01J49/40 ,  H01J49/14 ,  H01J49/06 ,  H01J49/04

CPC classification number: H01J49/0004 ,  H01J49/142 ,  H01J49/164 ,  H01J49/40 ,  H01J49/406

Abstract: 본발명의목적은분석하고자하는대상의분자량에제한받지않고약물/대사체/지질/펩타이드와같은저분자량분석이나유전자/단백질과같은고분자량분석이모두가능하도록레이저빔또는이온빔을동시에사용하고, 또한주사형방법이아닌현미경방법을사용함으로써측정속도를비약적으로증대시키는, 초고속멀티모드질량분석을위한비행시간기반질량현미경시스템을제공함에있다. 본발명의초고속멀티모드질량분석을위한비행시간기반질량현미경시스템은, 시료의질량화학분석을수행하는질량현미경시스템(100)에있어서, 저분자량시료내지고분자량시료모두에대하여분석이가능하도록, 상기시료상에레이저빔, 이온빔, 레이저빔또는이온빔중 선택되는어느한 가지를디포커스(defocus)된상태로주사하고, 상기시료의이미지를촬영함과동시에레이저빔또는이온빔이주사되었을때 상기시료에서발생되는이차이온을비행시간기반(TOF, time-of-flight)으로위치를측정하여검출함으로써, 현미경모드(microscope mode)로상기시료의질량이미징분석을수행하는것을특징으로한다.