公开(公告)号：GB2367702B

公开(公告)日：2002-09-11

申请号：GB0118351

申请日：2001-07-27

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  HOFFMANN JUERGEN

IPC: G02B5/10 ,  G02B7/198 ,  G02B21/00 ,  G02B21/06 ,  G02B26/10

Abstract: A scanning microscope, in particular a confocal scanning microscope, with a light source (1), preferably a laser, for generating an illumination light beam (14) for a sample (11) and a scanning device for deflecting the illumination light beam (14) is, with a view to fast and reliable image-data acquisition and a compact structure, configured and refined in such a way that the scanning device has at least one micromirror (16). An optical arrangement with a light source (1), preferably a laser, for generating a light beam and at least one micromirror (16) for deflecting the light beam is furthermore provided, in which an adaptive lens (22) is provided for correcting for mirror defects or deformation of the mirror surface. Lastly, a method for imaging in scanning microscopy, in particular in confocal scanning microscopy, with a light source (1), preferably a laser, for generating an illumination light beam (14) for a sample (11) and a scanning device for deflecting the illumination light beam (14) is provided, in which at least one micromirror (16) is used in the scope of the scanning device.

公开(公告)号：GB2369953A

公开(公告)日：2002-06-12

申请号：GB0123899

申请日：2001-10-04

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  HOFFMANN JUERGEN

IPC: G02B21/06 ,  G02B21/00 ,  G02B21/16

Abstract: A light source for illumination in scanning microscopy comprises an electromagnetic energy source (3) emitting light (17) of one wavelength, and a beam splitter (5) for spatially dividing the light into two partial light beams (19, 21). An intermediate element (9), for wavelength modification is provided in at least one light beam (21). The partial light beams (19,21) may be directed onto overlapping regions of a specimen. The intermediate element (9) may be an optical parametric oscillator or an element for frequency multiplication. A beam shaping element may be placed after the intermediate element.

公开(公告)号：GB2369739A

公开(公告)日：2002-06-05

申请号：GB0123392

申请日：2001-09-28

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  KNEBEL WERNER

IPC: G02B26/10 ,  G02B21/00 ,  G02B21/06 ,  G02B21/24 ,  G02B21/36 ,  G06T1/00

Abstract: A scanning microscope comprises means (3) for acquiring and displaying a preview image (7), a microscope optical system (51) and means (5) for marking at least one region (27, 29) of interest in the preview image (7). A first beam deflection device (43, 67, 68) directs the scan field (31, 33) onto the vicinity of the region of interest; and a second beam deflection device (49, 72, 94) serves for meander-shaped scanning within the scan field (31, 33).

公开(公告)号：DE10056382A1

公开(公告)日：2002-05-23

申请号：DE10056382

申请日：2000-11-14

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  HOFFMANN JUERGEN

IPC: G02B21/06 ,  G02B21/00 ,  G02B21/16

Abstract: An electromagnetic source of power (3) emits light (17) for a wavelength and is upstream to a device (5) for apportioning light into two dividing beams of light. There is an intermediate element (9) in the first dividing beam of light (21) to alter wavelengths. The second dividing beam of light (19) is aligned directly onto a specimen (41) to give optical stimulation to a first area. An Independent claim is also included for a scan microscope with a microscope lens, a detector and a beam deflector device for guiding an illuminating light beam over a specimen.

公开(公告)号：GB2368743A

公开(公告)日：2002-05-08

申请号：GB0120663

申请日：2001-08-24

Applicant: LEICA MICROSYSTEMS

Inventor： STORZ RAFAEL ,  ENGELHARDT JOHANN ,  BIRK HOLGER

IPC: G02B26/06 ,  G02B21/00 ,  G02B21/06 ,  G02F1/01 ,  H01S3/00

Abstract: A method for illuminating an object with light 2 from a laser light source 3, preferably in a confocal scanning microscope 1. With the method according to the invention, it is possible to reduce the coherence length of the laser light, so that disruptive interference phenomena can be substantially eliminated. Should interference phenomena be formed, these are to be influenced in such a way that they have no effect on the detection. The method is characterized in that the phase angle of the light field is varied by a modulation means 4 in such a way that interference phenomena do not occur in the optical beam path, or occur only to an undetectable extent, within a predeterminable time interval. Modulation means 4 may comprise an electro optical modulation (EOM), mirror, lens or beam splitter. Alternatively, the modulation means 4 may modulate the laser directly by switching it on and off, changing laser intensity and so on.

公开(公告)号：DE10050529A1

公开(公告)日：2002-04-18

申请号：DE10050529

申请日：2000-10-11

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  KNEBEL WERNER

IPC: G02B26/10 ,  G02B21/00 ,  G02B21/06 ,  G02B21/24 ,  G02B21/36 ,  G06T1/00

Abstract: A method and an arrangement for beam control in a scanning microscope are disclosed. The scanning microscope comprises means for acquiring and displaying (3) a preview image (7) and a microscope optical system (51). Means for marking (5) at least one region of interest (27, 29) in the preview image (7) are provided. A first beam deflection device (43, 67, 68) displaces the scan field (31, 33) onto the region of interest (27, 29); and a second beam deflection device (49, 72, 94) serves for meander-shaped scanning within the scan field (31, 33).

公开(公告)号：GB2367701A

公开(公告)日：2002-04-10

申请号：GB0116559

申请日：2001-07-06

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN

IPC: G02B21/06 ,  G02B21/00 ,  G02F1/11 ,  G02F1/33 ,  G02B6/27

Abstract: The present invention concerns an apparatus for coupling light (1) of at least one wavelength of a laser light source (2) into an optical assemblage (3), preferably into a confocal scanning microscope, having an optically active component (4) that serves in particular to select the wavelength and to set the power of the coupled-in light (5). To ensure that changes in the power and/or wavelength of the laser light source do not affect the power of the light (5) coupled into the optical assemblage, the apparatus according to the present invention is characterized in that in order to influence the coupled-in light (5), the component (4) serves as the adjusting element of a control system (11).

公开(公告)号：DE59706523D1

公开(公告)日：2002-04-04

申请号：DE59706523

申请日：1997-12-05

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  ZAPF THOMAS ,  ULRICH HEINRICH

IPC: A61C1/08 ,  A61C19/04 ,  A61C19/05 ,  G01B11/24 ,  G02B21/00 ,  G02B21/36 ,  G02B27/14 ,  G11B7/14

公开(公告)号：GB2358922B

公开(公告)日：2002-03-27

申请号：GB0026120

申请日：2000-10-25

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  WIDZGOWSKI BERND

IPC: G02B21/00 ,  G02B21/06 ,  G01J1/16 ,  G01J1/44

Abstract: A method and system for compensating intensity fluctuations of an illumination system in a confocal microscope comprise a first and a second analog-to-digital converters for digitizing a first electrical signal corresponding to the light reflected from a specimen, and for digitizing a second electrical signal corresponding to an illumination reference, respectively. The digitized signals are sent to a first and a second look up tables carrying out a log conversion of the first and second electrical signals, respectively. Also provided is a calculator for correcting the first electrical signal for intensity fluctuations of the second electrical signal. The corrected electrical signal is sent to a third look up table for converting the corrected electric signal. The conversion is done by exponentiation of the corrected electrical signal.

公开(公告)号：DE10043992A1

公开(公告)日：2002-03-21

申请号：DE10043992

申请日：2000-09-05

Applicant: LEICA MICROSYSTEMS

Inventor： ENGELHARDT JOHANN ,  HOFFMANN JUERGEN ,  KNEBEL WERNER

IPC: G02B21/00

Abstract: A method for examining a specimen (11) by means of a confocal scanning microscope having at least one light source (1), preferably a laser, to generate an illuminating light beam (4) for the specimen (11), and a beam deflection device (9) to guide the illuminating light beam (4) over the specimen (11) comprises, in the interest of reliable definition of details or regions of interest of the specimen (11), the following method steps: Firstly a preview image is acquired. Then at least one region of interest in the preview image is marked. This is followed by allocation of individual illuminating light beam wavelengths and/or illuminating light beam power levels to the region or regions. Illumination of the region or regions of the specimen (11) in accordance with the allocation is then accomplished. Lastly, the reflected and/or fluorescent light proceeding from the specimen (11) is detected.