Abstract:
The invention relates to a method for accessing, in reading, programming and/or erasing, to a semiconductor integrated non volatile memory device of the Flash EEPROM type with a NAND architecture comprising at least one memory matrix (2) organised in rows or word lines (WL) and columns or bit lines (BL), and wherein, for the memory, a plurality of additional address pins are provided. Advantageously, the method provides both an access protocol of the asynchronous type and a protocol of the extended type allowing to address, directly and in parallel, a memory extended portion by loading an address register associated with said additional pins in two successive clock pulses. A third multi-sequential access mode and a parallel additional bus referring to said additional address pins are also provided to allow a double addressing mode, sequential and in parallel.
Abstract:
A semiconductor memory system (38) comprising a memory matrix (110) including a plurality of memory cells arranged in rows and columns and connected to a plurality of column lines, each memory cell of the same column having a first and a second terminal connected to a first and a second column line respectively. Furthermore, the memory system (38) comprises a first (Main-0) and a second (Main-1) conduction line which can be connected to said first and second column lines, and generating means (41) provided with at least a first (a) and a second (b) output line, making available a first and a second reading/writing voltage to said first and second terminal respectively. The memory system (38) is characterized in that it comprises at least a first (Q 1 ) and a second (Q 2 ) selection transistor connected to the same command line (L1) and having corresponding operative terminals connected directly to the first (a) and to the second (b) output lines respectively and corresponding cell terminals connected directly to the first (Main-0) and to the second (Main-1) conduction lines respectively.
Abstract:
The invention relates to a method for programming a non-volatile memory device of the multi-level type, comprising a plurality of transistor cells grouped into memory words and conventionally provided with gate and drain terminals. The method applies different drain voltage values at different threshold values. Such values are directly proportional to the threshold levels to be attained by the individual memory word bits, and effective to provide for a simultaneous attainment of the levels, in a seeking-to manner, of the levels at the end of a limited number of pulses. Advantageously, a constant gate voltage value is concurrently applied to the gate terminals of said cells, such that the cell programming time is unrelated to the threshold level sought.
Abstract:
A synchronization circuit for read paths of an electronic memory, the memory being divided into two separate banks (EVEN, ODD), each bank comprising sense amplifiers (7, 8) and a counter circuit, comprising:
a circuit network (30) for managing the equalization of the memory cells of the memory banks, adapted to generate a synchronization signal (EQ-det) for the steps for updating the output buffer (9) of the memory; a circuit network (1) for managing the connection between sense amplifiers (7, 8) of the memory and the output buffer (9), the network being driven by the synchronization signal (EQ-det) for the memory output buffer updating steps, by signals (PRI-EV, PRI-ODD) for controlling the selection of the connecting path between the sense amplifier and the output buffer related to the memory bank affected by the read process, and by timing circuits (5) which are adapted to determine the read mode of the memory.