Abstract:
In a first operation mode the level shifter (36) transmits as output a logic input signal (S i ) and in a second operation mode it shifts the high logic level of the input signal from a low (V dd ) to a high voltage (V pp ). The level shifter comprises a CMOS switch (42) and a pull-up transistor (43); the CMOS switch (42) comprises an NMOS transistor (45) and a PMOS transistor (44) which are connected in parallel between the input (37) and the output (39) of the shifter and have respective control terminals connected to a first supply line (4) at low voltage (V dd ) and, respectively, to a control line (46) connected to ground in the first operation mode and to the high voltage (V pp ) in the second operation mode; the pull-up transistor (43) is connected between the output (39) of the shifter and a second supply line (2) switchable between the low voltage and the high voltage and has a control terminal connected to the first supply line (4).
Abstract:
A method for reading a memory, particularly a non-volatile memory, whose particularity is that it comprises the steps of:
generating a memory enable signal (CE); generating a signal (ALE) for the visibility, inside the memory, of address signals generated externally with respect to the memory, the address signals being adapted to allow access to corresponding memory locations of the memory; generating a signal (RD) for the synchronous advancement of the read operation within the memory; each change of state of the memory enable signal (CE), together with a change of state of the address signals, being matched by different cycles for reading the memory, the different read cycles being enabled according to the state of the signal (ALE) for the visibility, inside the memory, of address signals generated externally to the memory, the logic state of the visibility signal switching between the high logic state, the low logic state and the pulsed state; emission of the data read from the memory being correlated to the state transition of the signal (RD) for the synchronous advancement of the reading of the memory.
Abstract:
The invention relates to a compensated voltage regulator (1) useful with programming circuitry for electrically programmable non-volatile memory cells in a cell matrix (3) which is divided in sectors (7), the regulator being of a type which includes a comparator (2) connected between first (Vpp) and second (GND) supply voltage references, and having:
a first input terminal (+) which is supplied by a reference voltage (Vref); an output terminal (U) connected to the control terminal of an output MOS transistor (Mcasc) having a conduction terminal through which an output current (Iout) is passed and being connected to the memory cells by a program line (10); a second input terminal (-), feedback connected to said program line (10).
A compensation block (20) is provided which is powered from said first voltage reference (Vpp) and has an input connected to both said output terminal (U) and said output transistor (Mcasc), and has an output connected to said output terminal (U) to duplicate a current (Iout*α) which is suitably attenuated with respect to the output current (Iout) and useful to modify the output voltage (Vg) of the comparator (2) included in the regulator.