Abstract:
An object of the present invention is to provide a synthetic silica glass optical material which exhibits excellent transmittance as well as durability for high output power vacuum ultraviolet rays, being emitted from, for example, ArF excimer lasers and Xe.sub.2 excimer lamps, and to provide a method for producing the same. A synthetic silica glass optical material for high output power vacuum ultraviolet rays made from ultra high purity synthetic silica glass for use in the wavelength region of from 165 to 195 nm, containing OH groups at a concentration of from 5 to 300 wtppm with a fluctuation width in OH group concentration (.DELTA.OH/cm) of 10 wtppm or less, containing hydrogen molecules at a concentration of from 1.times.10.sup.17 to 1.times.10.sup.19 molecule/cm.sup.3 with a fluctuation width in hydrogen molecule concentration (.DELTA.H.sub.2 /cm) of 1.times.10.sup.17 molecule/cm.sup.3 or lower, and containing chlorine at a concentration of 50 wtppm or lower. Also claimed is a method for producing the same.
Abstract:
The invention relates to fluorine-containing silica glasses, and methods of their production. The silica glass may be used for an ultraviolet light optical system in which light in a wavelength region of 200 nm or less, such as an ArF (193 nm) excimer laser, is used. The invention also relates to a projection exposure apparatus containing fluorine-containing glass of the invention.
Abstract:
A synthetic silica glass article made by hydrolyzing an alkoxysilane and thermally sintering the resulting silica; this synthetic silica glass article has a viscosity of not lower than 10.sup.10 poise at 140.degree. C., and contains, as metallic impurities, less than 1 ppm at Al, less than 0.2 ppm of Fe, less than 0.2 ppm of Na, less than 0.2 ppm of K, less than 0.01 ppm of Li, less than 0.2 ppm of Ca, less than 0.02 ppm of Ti, less than 0.01 ppm of B, less than 0.01 of P, less than 0.01 ppm of As.
Abstract:
The invention relates to lenses, prisms or other optical members which are subjected to high-power ultraviolet light having a wavelength of about 360 nm or less, or ionizing radiation, particularly optical members for use in laser exposure apparatus for lithography, and to blanks for such optical members. The homogeneity of the refractive index distribution and the resistance to optical deterioration when the optical members are exposed for a long period of time to short wavelength ultraviolet light from a laser beam are improved. The optical members are made of high-purity synthetic silica glass material containing at least about 50 wt. ppm of OH groups, and are doped with hydrogen. The refractive index distribution caused by the fictive temperature distribution during heat treatment in the process of producing high-purity silica glass blanks for optical members in accordance with the present invention is offset by the combined refractive index distribution determined by the OH group concentration distribution or by the OH group concentration distribution and the Cl concentration distribution in the glass.
Abstract:
Die Erfindung betrifft ein Verfahren zum Herstellen eines Quarzglaskörpers beinhaltend die Verfahrensschritte i.) Bereitstellen eines Siliziumdioxidgranulats aus einem pyrogen erzeugten Siliziumdioxidpulver, ii.) Bilden einer Glasschmelze aus dem Siliziumdioxidgranulat, iii.) Bilden eines Quarzglaskörpers aus zumindest einem Teil der Glasschmelze, iv.) Zerkleinern des Quarzglaskörpers unter Erhalt einer Quarzglaskörnung, v.) Verarbeiten des Quarzglaskörpers zu einer Vorform und vi.) Bilden eines opaken Quarzglaskörpers aus der Vorform. Die Erfindung betrifft weiterhin einen opaken Quarzglaskörper, der durch dieses Verfahren erhältlich ist. Weiterhin betrifft die Erfindung einen Reaktor und eine Anordnung, die jeweils durch Weiterverarbeiten des opaken Quarzglaskörpers erhältlich sind.
Abstract:
A fused silica glass article having greater resistance to damage induced by exposure to laser radiation such as laser induced wavefront distortion at deep ultraviolet (DUV) wavelengths, and behaviors such as fluence dependent transmission, which are related to intrinsic defects in the glass. The improved resistance to laser damage may be achieved in some embodiments by loading the glass article with molecular hydrogen (H2) at temperatures of about 400°C or less, or 350°C or less. The combined OH and deuteroxyl (OD) concentration may be less than 10 ppm by weight. In other embodiments, the improved resistance may be achieved by providing the glass with 10 to 60 ppm deuteroxyl (OD) species by weight. In still other embodiments, improved resistance to such laser damage may be achieved by both loading the glass article with molecular hydrogen at temperatures of about 350°C or less and providing the glass with less than 10 ppm combined OH and OD, or 10 to 60 ppm OD by weight.
Abstract:
Die Erfindung geht von einem optischen Bauteil aus synthetischem Quarzglas zur Verwendung in der ArF-Excimerlaser-Lithographie mit einer Einsatzwellenlänge von 193 nm aus, mit einer Glasstruktur im Wesentlichen ohne Sauerstoffdefektstellen, einem Wasserstoffgehalt im Bereich von 0,1 x 10 16 Molekülen/cm 3 bis 1,0 x 10 18 Molekülen/cm 3 und einem Gehalt an SiH-Gruppen von weniger als 2 x 10 17 Molekülen/cm 3 und mit einem Gehalt an Hydroxylgruppen im Bereich zwischen 0,1 und 100 Gew.-ppm, wobei die Glasstruktur eine fiktive Temperatur von weniger 1070 °C aufweist. Um ausgehend von einer Messung des Kompaktierungsverhaltens bei einer Messwellenlänge von 633 nm eine verlässliche Prädiktion zum Kompaktierungsverhalten beim Einsatz mit UV-Laserstrahlung der Einsatzwellenlänge ermöglicht, wird eine Ausgestaltung des optischen Bauteil vorgeschlagen, bei der es auf Bestrahlung mit Strahlung einer Wellenlänge von 193 nm mit 5x10 9 Pulsen mit einer Pulsbreite von 125 ns und einer Energiedichte von jeweils 500µJ/cm 2 sowie einer Pulswiederholfrequenz von 2000 Hz mit einer laserinduzierten Brechzahländerung reagiert, deren Betrag bei Vermessung mit der Einsatzwellenlänge von 193 nm einen ersten Messwert M 193nm und bei Vermessung mit einer Messwellenlänge von 633 nm einen zweiten Messwert M 633nm ergibt, wobei gilt: M 193nm /M 633nm
Abstract:
A fused silica glass and a fused silica article having a combined concentration of at least one of OH and OD of up to about 50 ppm. The fused silica glass is formed by drying a fused silica soot blank or preform in an inert atmosphere containing a drying agent, followed by removal of residual drying agent from the dried soot blank by heating the dried soot blank in an atmosphere comprising an inert gas and of oxygen.