公开(公告)号：US11749216B2

公开(公告)日：2023-09-05

申请号：US17574890

申请日：2022-01-13

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Hojune Yoo ,  Minsup Kim ,  Kyoungshin Jin ,  Jaemyung Hur

IPC: G09G3/34 ,  G06F3/147 ,  G01J3/10 ,  G01J3/42 ,  H05B47/11

CPC classification number: G09G3/3406 ,  G01J3/108 ,  G01J3/42 ,  H05B47/11 ,  G01J2003/425 ,  G06F3/147 ,  G09G2320/0626 ,  G09G2330/02 ,  G09G2360/144

Abstract: A display device includes a display, an illuminance sensor, an IR sensor disposed at a lower side of the display device, a memory to store correction data set by respective reflectance, and a processor. The processor is configured to calculate a reflectance of a floor surface, in an environment in which the display device is arranged, based on a sensing value of the IR sensor, obtain correction data corresponding to the calculated reflectance from stored correction data of the memory, correct an illuminance value sensed by using the illuminance sensor according to the obtained correction data, and control an operation of the display based on the corrected illuminance value.

公开(公告)号：US20180284020A1

公开(公告)日：2018-10-04

申请号：US15764603

申请日：2016-09-30

Applicant: COLOR GRAIL RESEARCH

Inventor： Rémi VAUCLIN ,  Franck HENNEBELLE

IPC: G01N21/55 ,  G01N21/31

CPC classification number: G01N21/55 ,  G01J3/10 ,  G01J2003/425 ,  G01N21/31 ,  G01N2201/0221 ,  G01N2201/0616 ,  G01N2201/0696

Abstract: Disclosed is a method for determining the reflectance of an object, the method including a step of solving an equation having several unknowns, the equation being obtained from formed images, the reflectance of the object and the illumination of the external light source being two unknowns of the equation. The step of solving the equation includes: calculating solution points of the equation, interpolating the calculated points by way of an interpolation function, and using at least one of the following approximations to solve the equation: a first approximation according to which each image is derived from the emission of a separate light flash, a second approximation according to which the interpolation function determines the stability points of the equation.

公开(公告)号：US09726538B2

公开(公告)日：2017-08-08

申请号：US14513458

申请日：2014-10-14

Applicant: OPTILAB, LLC

Inventor： Henry H. Hung

IPC: G01J1/42 ,  G01J3/02 ,  G01J3/42 ,  G01L1/24 ,  G01K11/32 ,  G01J3/28

CPC classification number: G01J3/0218 ,  G01J3/0245 ,  G01J3/42 ,  G01J2003/2859 ,  G01J2003/425 ,  G01K11/3206 ,  G01L1/246

Abstract: Various implementations of an apparatus for sensing one or more parameters are disclosed herein. The apparatus includes a sweeping wavelength laser configured to generate a sweeping wavelength optical signal; an optical fiber including a Fiber Bragg Grating (FBG) structure configured to sense a parameter, wherein the optical fiber is configured to receive the sweeping wavelength optical signal, wherein the FBG structure is configured to produce a reflected optical signal with a particular wavelength in response to the sweeping wavelength optical signal, and wherein the particular wavelength varies as a function of the parameter; a photo detector configured to generate an electrical signal based on the reflected optical signal; a comparator configured to generate a pulse based on a comparison of the electrical signal to a threshold; and a processor configured to generate an indication of the parameter based on the pulse. The comparator may be configured as a Schmitt trigger.

公开(公告)号：US20170059409A1

公开(公告)日：2017-03-02

申请号：US15241762

申请日：2016-08-19

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Kun Sun EOM

IPC: G01J3/42

CPC classification number: G01J3/42 ,  G01J3/027 ,  G01J3/10 ,  G01J3/28 ,  G01J2003/2873 ,  G01J2003/425

Abstract: An apparatus for measuring a reference spectrum includes a parameter adjuster configured to adjust a parameter of a spectroscope so that an intensity of a reflection spectrum of a sample has a value in a range, a reference material spectrum measurer configured to adjust reflectance of a reference material so an intensity of a reflection spectrum of the reference material is not saturated, and measure the reflection spectrum of the reference material, using the spectroscope having the adjusted parameter, a first reference spectrum calculator configured to, in response to the adjusted reflectance of the reference material not being one hundred percent, calculate a first reference spectrum based on the measured reflection spectrum of the reference material, and a second reference spectrum measurer configured to measure a second reference spectrum of the reference material, using the spectroscope having the adjusted parameter, when a light source of the spectroscope is turned off.

Abstract translation: 用于测量参考光谱的装置包括：参数调节器，被配置为调节分光镜的参数，使得样品的反射光谱的强度具有在一个范围内的值;参考材料光谱测量器，被配置为调节参考材料的反射率 因此参考物质的反射光谱的强度不饱和，并且使用具有调整参数的分光器测量参考物质的反射光谱，第一参考光谱计算器被配置为响应于参考物质的调整的反射率 材料不是百分之百，基于测量的参考材料的反射光谱计算第一参考光谱;以及第二参考光谱测量器，被配置为使用具有调整参数的分光仪，测量参考物质的第二参考光谱，当时 关闭光谱仪的光源。

公开(公告)号：US20160296118A1

公开(公告)日：2016-10-13

申请号：US14684638

申请日：2015-04-13

Applicant: ATOPTIX, LLC

Inventor： Perry S. EDWARDS ,  Zhiwen LIU

IPC: A61B5/00 ,  G01J3/28

CPC classification number: A61B5/0075 ,  A61B5/14542 ,  A61B5/6801 ,  A61B5/6843 ,  A61B5/6898 ,  A61B5/742 ,  A61B2560/0252 ,  A61B2562/12 ,  G01J3/0229 ,  G01J3/0272 ,  G01J3/18 ,  G01J3/42 ,  G01J2003/425

Abstract: Devices for reflectance spectroscopy, processes of assembling devices for reflectance spectroscopy, and health care processes of using reflectance optical spectroscopy devices are disclosed. The devices include a light source arranged and disposed to apply broadband light to sample, and a light-receiving feature configured to receive reflected light produced by the applying of the broadband light to the sample. The light-receiving feature is arranged and disposed to direct the reflected light to an optical detection system and isolate the reflected light from the broadband light. The optical detection system is capable of differentiating individual frequencies of the reflected light. The processes of assembling include removably positioning the devices on electronic devices. The health care processes include positioning the devices.

Abstract translation: 公开了用于反射光谱的装置，用于反射光谱装配装置的工艺和使用反射光谱装置的保健工艺。 这些装置包括布置和布置以将样品宽带光应用的光源和被配置为接收通过将宽带光施加到样品产生的反射光的光接收特征。 光接收特征被布置和布置成将反射光引导到光学检测系统并将反射光与宽带光隔离。 光学检测系统能够区分反射光的各个频率。 组装过程包括将设备可拆卸地定位在电子设备上。 保健过程包括定位设备。

公开(公告)号：US20150330906A1

公开(公告)日：2015-11-19

申请号：US14702606

申请日：2015-05-01

Applicant: Panasonic Corporation

Inventor： YUMI WAKITA ,  JUN OZAWA ,  NAOSHI KONDO ,  YUUICHI OGAWA ,  TETSUHITO SUZUKI

IPC: G01N21/84 ,  G01N21/31 ,  G01N33/12

CPC classification number: G01N21/314 ,  G01J3/42 ,  G01J2003/425 ,  G01N21/31 ,  G01N21/3151 ,  G01N21/84 ,  G01N33/12 ,  G01N2021/3155 ,  G01N2201/0635 ,  G01N2201/12 ,  G01N2201/129 ,  G08B21/182

Abstract: A freshness estimation method includes obtaining an absorbance spectrum that is obtained by irradiating an eye of a fish with light having all or part of a wavelength band from 315 nm to 450 nm; and estimating freshness of the fish by using a shape of the obtained absorbance spectrum.

Abstract translation: 新鲜度估计方法包括获得通过用具有315nm至450nm的全部或部分波长带的光照射鱼的眼睛获得的吸收光谱; 并通过使用所获得的吸收光谱的形状来估计鱼的新鲜度。

公开(公告)号：US20070291255A1

公开(公告)日：2007-12-20

申请号：US11845580

申请日：2007-08-27

Applicant: David Larsen ,  Zhi Xu

Inventor： David Larsen ,  Zhi Xu

IPC: G01N21/00

CPC classification number: G01J3/02 ,  G01J3/0262 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/42 ,  G01J3/45 ,  G01J2003/425 ,  G01N21/274 ,  G01N21/31 ,  G01N2021/3137 ,  G01N2201/0227 ,  G01N2201/127

Abstract: Increasing signal to noise ratio in optical spectra obtained by spectrophotometers. An interferometer introduces interference effects into a source light beam. A dual beam configuration splits the source beam having the interference effects into a reference beam and a sample beam. The reference beam interacts with a reference substance and is detected by a reference detector. The sample beam interacts with a sample substance and is detected by a sample detector. An optical spectra of the sample is based on the difference between the detected reference beam and the detected sample beam.

Abstract translation: 通过分光光度计获得的光谱增加信噪比。 干涉仪将干扰效应引入源光束。 双光束配置将具有干涉效应的源光束分解成参考光束和样本光束。 参考光束与参考物质相互作用，并由参考检测器检测。 样品束与样品物质相互作用，并由样品检测器检测。 样品的光谱基于检测到的参考光束和检测到的样品光束之间的差异。

公开(公告)号：US5048960A

公开(公告)日：1991-09-17

申请号：US361406

申请日：1989-06-05

Applicant: Takahisa Hayashi ,  Nariaki Fujiwara

Inventor： Takahisa Hayashi ,  Nariaki Fujiwara

IPC: G01B11/06 ,  G01J3/28 ,  G01J3/42 ,  G01N21/27 ,  G02B21/06

CPC classification number: G01N21/274 ,  G01B11/06 ,  G01J3/42 ,  G01J2003/425 ,  G01J3/2823 ,  G01N2201/12753

Abstract: A method of and an apparatus for obtaining spectral data and calculating corrected spectral data. The method includes the steps of: obtaining spectral data S'(.lambda.) which is representative of the spectral characteristics of light which is generated by a light source and reflected by an object; substantially concurrently with the step of obtaining the spectral data S'(.lambda.), obtaining spectral data R(.lambda.) which is representative of the spectral characteristics of light which is generated by the light source; and calculating corrected spectral data S(.lambda.) as a function of the spectral data S'(.lambda.) and the spectral data R(.lambda.).

公开(公告)号：US4922104A

公开(公告)日：1990-05-01

申请号：US277964

申请日：1988-11-30

Applicant: Kinya Eguchi ,  Kikue Niitsuma ,  Shigeru Wakena ,  Masayoshi Ezawa

Inventor： Kinya Eguchi ,  Kikue Niitsuma ,  Shigeru Wakena ,  Masayoshi Ezawa

IPC: G01J3/42 ,  G01N21/35 ,  G02B21/00 ,  G02B21/24

CPC classification number: G01N21/35 ,  G02B21/0004 ,  G02B21/24 ,  G01J2003/425 ,  G01J3/42 ,  G01N2021/1738 ,  G01N2021/1742 ,  G01N2021/3595 ,  G01N2021/6417 ,  G01N21/3563 ,  G01N21/6458

Abstract: An infrared spectrum measuring microscope apparatus which is suitable for accurately identifying the material at a microfine portion. A sample stage is vertically moved and special optical means are provided in the sample stage for enabling high-sensitivity spectral measurement of a microfine portion of samples of various sizes. The infrared microspectometer of the present invention also enables the chemical species of the sample to be identified by the fluorescence spectrum in addition to the information of the infrared spectrum.

Abstract translation: 一种红外光谱测量显微镜装置，适用于在微细部分精确识别材料。 样品台被垂直移动，并且在样品台中提供特殊的光学装置，以实现各种尺寸的样品的微细部分的高灵敏度光谱测量。 除了红外光谱的信息之外，本发明的红外显微光谱仪还能够通过荧光光谱鉴定样品的化学物质。

公开(公告)号：US4875773A

公开(公告)日：1989-10-24

申请号：US191262

申请日：1988-05-06

Applicant: Richard Burns ,  James Defendorf ,  Edward King ,  Cornelius McCarthy

Inventor： Richard Burns ,  James Defendorf ,  Edward King ,  Cornelius McCarthy

IPC: G01J3/18 ,  G01J3/04 ,  G01J3/10 ,  G01J3/12 ,  G01J3/28 ,  G01J3/42 ,  G01J3/44 ,  G01J3/443 ,  G01N21/31

CPC classification number: G01J3/04 ,  G01J3/02 ,  G01J3/0294 ,  G01J3/12 ,  G01J3/2803 ,  G01J2003/045 ,  G01J2003/102 ,  G01J2003/1204 ,  G01J2003/1295 ,  G01J2003/1828 ,  G01J2003/425 ,  G01J3/1838 ,  G01J3/42 ,  G01J3/4406 ,  G01J3/443 ,  G01N2021/174 ,  G01N2021/3129

Abstract: An optical system for a multidetector array spectrophotometer which includes multiple light sources for emitting light of selected wavelength ranges and means for selectively transmitting the selected wavelength ranges of light to respective slits of a multi-slit spectrograph for multiple wavelength range detection. The spectrograph has two or more slits which direct the selected wavelength ranges of the light spectra to fall upon a dispersive and focusing system which collects light from each slit, disperses the light by wavelength and refocuses the light at the positions of a single set of detectors.