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公开(公告)号:KR1020080034796A
公开(公告)日:2008-04-22
申请号:KR1020070104008
申请日:2007-10-16
Applicant: 도쿄엘렉트론가부시키가이샤
IPC: H01L21/02 , H01L21/00 , H01L21/3065
CPC classification number: H01L21/6831 , H01J37/32495 , H01J37/32559 , H01J2237/2007 , H01L21/67069 , H01L21/68757
Abstract: A substrate stage and a plasma processing apparatus is provided to reduce replacement of an electrostatic chuck for a long period of time since the substrate stage has an oxide film made of a IIIA group element of a periodic system, which is highly resistant to plasma, and prevent reduction in cooling efficiency of a focus ring by forming a thin coating covering a focus ring placement part. A substrate stage for mounting a substrate(W) which is subjected to a plasma process, comprises a focus ring placement part(39), and a substrate mounting part(40). The focus ring placement part is configured to place a focus ring(19) that surrounds a substrate mounted on the substrate stage. The substrate mounting part overhangs beyond the focus ring placement part at an inside position of the focus ring placement part, having an electrostatic chuck(16) having a mounting drawing and holding the substrate on an upper side of the substrate mounting part, and an oxide film(38) of a predetermined thickness and made of a IIIA group element of a periodic system.
Abstract translation: 提供了基板载台和等离子体处理装置,以减少长时间的静电卡盘的更换,因为基片载物台具有由对等离子体具有高度耐受性的周期性系统的IIIA族元素构成的氧化膜,以及 通过形成覆盖聚焦环放置部分的薄涂层来防止聚焦环的冷却效率降低。 用于安装经受等离子体处理的衬底(W)的衬底台包括聚焦环放置部分(39)和衬底安装部分(40)。 焦点环放置部分被配置为放置围绕安装在衬底台上的衬底的聚焦环(19)。 基板安装部分在焦点环放置部分的内部位置上伸出聚焦环放置部分,具有具有安装图的静电卡盘(16)并将基板保持在基板安装部分的上侧,并且氧化物 膜(38),其由周期性系统的IIIA族元素制成。
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公开(公告)号:KR100914589B1
公开(公告)日:2009-08-31
申请号:KR1020070104008
申请日:2007-10-16
Applicant: 도쿄엘렉트론가부시키가이샤
IPC: H01L21/02 , H01L21/00 , H01L21/3065
CPC classification number: H01L21/6831 , H01J37/32495 , H01J37/32559 , H01J2237/2007 , H01L21/67069 , H01L21/68757
Abstract: 본 발명은 플라즈마 처리 장치의 가동 비용을 감소시키고 장치의 가동률을 향상시키는 것이 가능한 기판 탑재대에 관한 것이다. 기판 탑재대로서의 하부 전극이 장치의 챔버 내에 배치되고, 하부전극 내에 정전 척이 통합되어 있다. 정전 척의 측벽 상에 용사 피막으로서 1000 내지 2000㎛ 범위의 막 두께를 갖는 예컨대 산화이트륨 막 등의 주기율표의 3A족 원소의 산화막이 형성된다.
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