플라즈마 처리 장치, 플라즈마 처리 방법, 종점 검출 방법 및 컴퓨터 판독가능한 기억 매체
    2.
    发明公开
    플라즈마 처리 장치, 플라즈마 처리 방법, 종점 검출 방법 및 컴퓨터 판독가능한 기억 매체 失效
    等离子体处理装置,等离子体处理方法和端点检测方法

    公开(公告)号:KR1020100045955A

    公开(公告)日:2010-05-04

    申请号:KR1020097027399

    申请日:2008-08-26

    CPC classification number: H01L21/02252 H01J37/32963 H01L21/02238

    Abstract: A plasma processing apparatus (100) is provided with a plasma generating means for generating plasma in a chamber (1); a measuring section (60) for measuring the integration value of the particle number of active species moving toward a subject to be processed (wafer (W)) in plasma; and a control section (50) which controls plasma processing to be ended when the integration value of the measured particle number reaches a set value. The measuring section (60) measures the particle number of the species by radiating a prescribed laser beam toward plasma from a light source section (61) and receiving light by a detecting section (63) having a VUV monochromator.

    Abstract translation: 等离子体处理装置(100)设置有用于在室(1)中产生等离子体的等离子体产生装置; 用于测量在等离子体中朝向待处理对象(晶片(W))移动的活性物质的粒子数的积分值的测量部分(60) 以及控制部(50),当所测量的粒子数的积分值达到设定值时,控制等离子体处理结束。 测量部分(60)通过从光源部分(61)向等离子体辐射规定的激光束并通过具有VUV单色仪的检测部分(63)接收光来测量物质的粒子数。

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