Abstract:
The present invention relates to a semiconductor memory device which applies a temperature-compensated word line voltage to a word line in a data reading operation. In the present invention, disclosed is the semiconductor memory device comprising a memory cell array which includes a plurality of word lines, a plurality of bit lines, and a plurality of nonvolatile memory cells which are connected to the word lines and the bit lines; and a word line voltage applying unit which applies a temperature-compensated read voltage to a selected word line and applies a temperature-compensated pass voltage to an unselected word line in the reading operation.
Abstract:
PURPOSE: The electronic system including the semiconductor memory device capable of the addition ECC according to the cell pattern, and the apparatus is proceed the ECC encoding based on the specific cell pattern. The data error generation of the vulnerable cell is prevented. CONSTITUTION: A memory cell array(530) stores user data. The ECC engine(790) is proceed the first ECC encoding about user data. The ECC engine outputs the first ECC encoding result of training as ECC information data. The ECC engine detects the cell pattern predetermined based on user data. The ECC engine is proceed the second ECC encoding about cell data corresponding to the cell pattern.
Abstract:
PURPOSE: A non-volatile memory device is provided to reduce current consumption in a column driver by using a column selection circuit which selects one bit line among a plurality of bit lines. CONSTITUTION: A memory cell array(10) comprises a matrix of a plurality of nonvolatile memory cells. A plurality of bit lines are coupled with the column of nonvolatile memory cells within a memory cell array. A column selection circuit(50) answers to a column selection signal. The column selection circuit selects at least one bit line among a plurality of bit lines. A column driver(200) outputs the column selection signal.
Abstract:
PURPOSE: A semiconductor memory device is provided to compensate the current difference between a near-cell and a far-cell based on the cell position in a memory card and a memory system. CONSTITUTION: A memory cell array comprises memory cells which are arranged therein in a matrix. More than two local bit lines(BL0-BL7) are respectively connected to more than two global bit line(GBL0,GBL1). Bit lines comprises local bit lines which are coupled with the row of the memory cells within the memory cell array. A plurality of bit line selection drivers are connected to the local bit lines. An internal boost power generating unit generates internal boost power having different levels more than 2.
Abstract:
PURPOSE: A nonvolatile memory device and a programming method thereof are provided to prevent non-selected memory cell from being programmed by differently setting a bias condition for self boosting in a program operation. CONSTITUTION: A memory cell array(110) includes a plurality of memory cells. A control logic unit(120) programs the plurality of memory cells and divides a plurality of program loops into two program loop sections. The control logic unit differently sets a bias condition for self boosting at each program loop section. A voltage generator(130) generates voltages to be applied to a selected word line, a non-selected word line, a string selection line, a ground selection line, and a common source line.