박막 트랜지스터의 제조방법
    1.
    发明授权
    박막 트랜지스터의 제조방법 有权
    薄膜晶体管的制造方法

    公开(公告)号:KR101426646B1

    公开(公告)日:2014-08-06

    申请号:KR1020130021646

    申请日:2013-02-28

    CPC classification number: H01L29/66742 H01L21/324 H01L29/7869

    Abstract: The present invention relates to a manufacturing method of a thin film transistor and, more specifically, to a manufacturing method of a thin film transistor using a self-aligned channel forming method, an in-plane gate forming method, a body metal contact forming technique, and an interlayer forming technique controlling a semiconductor/metal junction.

    Abstract translation: 本发明涉及薄膜晶体管的制造方法,更具体地说,涉及使用自对准沟道形成方法的薄膜晶体管的制造方法,面内栅极形成方法,体金属接触形成技术 以及控制半导体/金属结的中间层形成技术。

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