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公开(公告)号:KR101426646B1
公开(公告)日:2014-08-06
申请号:KR1020130021646
申请日:2013-02-28
Applicant: 충남대학교산학협력단
IPC: H01L29/786 , H01L21/336
CPC classification number: H01L29/66742 , H01L21/324 , H01L29/7869
Abstract: The present invention relates to a manufacturing method of a thin film transistor and, more specifically, to a manufacturing method of a thin film transistor using a self-aligned channel forming method, an in-plane gate forming method, a body metal contact forming technique, and an interlayer forming technique controlling a semiconductor/metal junction.
Abstract translation: 本发明涉及薄膜晶体管的制造方法,更具体地说,涉及使用自对准沟道形成方法的薄膜晶体管的制造方法,面内栅极形成方法,体金属接触形成技术 以及控制半导体/金属结的中间层形成技术。