SYSTEM AND METHOD FOR PERFORMING TEAR FILM STRUCTURE MEASUREMENT AND EVAPORATION RATE MEASUREMENTS
    1.
    发明申请
    SYSTEM AND METHOD FOR PERFORMING TEAR FILM STRUCTURE MEASUREMENT AND EVAPORATION RATE MEASUREMENTS 审中-公开
    用于执行电影薄膜结构测量和蒸发速率测量的系统和方法

    公开(公告)号:WO2015132788A3

    公开(公告)日:2015-12-17

    申请号:PCT/IL2015050232

    申请日:2015-03-04

    Abstract: In a system and method for performing tear film structure measurement and evaporation rate measurements a broadband light source illuminates the tear film and a spectrometer measures respective spectra of reflected light from at least one point of the tear film. A color camera obtains a large field of view image of the tear film so as to obtain color information for all points of the tear film imaged by the color camera and an autofocusing mechanism focusses the color camera and the spectrometer. A processing unit coupled to the camera and to the spectrometer calibrates the camera so that the color obtained by the camera at the at least one point measured by the spectrometer matches the color of the spectrometer at the same point, and determines from the color of each point of the calibrated camera the thickness of the lipids at the respective point.

    Abstract translation: 在用于执行泪膜结构测量和蒸发速率测量的系统和方法中,宽带光源照射泪膜,光谱仪测量来自泪膜的至少一个点的反射光的各个光谱。 彩色照相机获得泪膜的大视场图像,以获得由彩色照相机成像的泪膜的所有点的颜色信息,并且自动聚焦机构聚焦彩色照相机和光谱仪。 耦合到相机和光谱仪的处理单元校准相机,使得在由光谱仪测量的至少一个点处由相机获得的颜色在同一点匹配分光计的颜色,并且根据每个 点的校准相机的脂质在相应点的厚度。

    SYSTEM FOR TOMOGRAPHY AND/OR TOPOGRAPHY MEASUREMENTS OF A LAYERED OBJECT
    2.
    发明申请
    SYSTEM FOR TOMOGRAPHY AND/OR TOPOGRAPHY MEASUREMENTS OF A LAYERED OBJECT 审中-公开
    系统用于层叠对象的和/或地形测量

    公开(公告)号:WO2015177784A2

    公开(公告)日:2015-11-26

    申请号:PCT/IL2015050511

    申请日:2015-05-14

    Abstract: A system (10) for analyzing an object (11) includes a light source (12) producing multiple light components, each of different wavelength and a respective amplitude, phase and polarization. An optical element (13) directs the light components on to the object to create known 2D patterns at different image planes displaced from the optical element by distances that are known functions of the wavelength of the light component. A 2D imager (20) images the 2D patterns and produces a plurality of full view 2D wavelength dependent patterns each corresponding to a known distance from the optical element and each having variable image contrast dependent on displacement of a surface of the object from the image plane, maximal image contrast being achieved when the surface of the object and image plane are coincident. A processing unit (25) determines the object surface based on the variable image contrast of each image.

    Abstract translation: 用于分析物体(11)的系统(10)包括产生多个光分量的光源(12),每个光分量具有不同的波长和相应的振幅,相位和极化。 光学元件(13)将光分量引导到物体上,以在与光学元件偏移的不同图像平面上产生已知的2D图案,该距离是光分量的波长的已知功能。 2D成像器(20)对2D图案进行成像,并且产生多个全视图2D波长相关图案,每个图案对应于从光学元件的已知距离,并且每个具有可变图像对比度,取决于物体表面与图像平面的位移 当物体和图像平面的表面一致时,实现最大的图像对比度。 处理单元(25)基于每个图像的可变图像对比度确定对象表面。

    SYSTEM FOR ANALYZING OPTICAL PROPERTIES OF AN OBJECT
    3.
    发明申请
    SYSTEM FOR ANALYZING OPTICAL PROPERTIES OF AN OBJECT 审中-公开
    用于分析物体光学性质的系统

    公开(公告)号:WO2016024270A3

    公开(公告)日:2016-06-23

    申请号:PCT/IL2015050808

    申请日:2015-08-07

    Abstract: In a system for analyzing optical properties of an object (350) a point source of light (100) composed of multiple spectral bands each having a respective amplitude, phase and polarization is converted by first optics (120, 150) into a line light source to illuminate an object line on the object. A beam splitter (200) splits the light exiting the first optics and directs a first portion of light on to the object (350) as an illuminated line and a second portion of the light on to a reference mirror (450). Second optics (500) collects respective first and second lines of light reflected by the object and mirror of and collinearly images the reflected lines of light as an image line on to an imaging spectrometer (550) wherein mutual interference allows determination of the optical properties of the object at each point along the object line.

    Abstract translation: 在用于分析物体(350)的光学性质的系统中,由多个光谱带组成的点光源(100)分别由第一光学器件(120,150)转换为线光源 照亮物体上的物体线。 分束器(200)分离出射第一光学器件的光并且将第一部分光引导到物体(350)上作为照明线并且将光的第二部分引导到参考镜(450)上。 第二光学装置(500)收集由物体反射的各自的第一和第二线,以及将反射的线作为图像线共线地成像到成像光谱仪(550)上,其中相互干涉允许确定 沿着对象线的每个点处的对象。

    METHOD FOR ANALYZING AN OBJECT USING A COMBINATION OF LONG AND SHORT COHERENCE INTERFEROMETRY
    4.
    发明申请
    METHOD FOR ANALYZING AN OBJECT USING A COMBINATION OF LONG AND SHORT COHERENCE INTERFEROMETRY 审中-公开
    使用长和短相干干涉组合来分析对象的方法

    公开(公告)号:WO2015166495A3

    公开(公告)日:2015-12-30

    申请号:PCT/IL2015050445

    申请日:2015-04-29

    CPC classification number: G01B9/02047 G01B9/0209 G01B9/02091

    Abstract: A method for high dynamic range and high accuracy interferometry measurements is described. The method uses a broadband light source for generating light, an interferometer, a phase shifting device, an imaging optical system and a detector array for collecting and measuring the reflected light from an object. The detected light is processed by a processor unit to obtain the object's surface.

    Abstract translation: 描述了一种用于高动态范围和高精度干涉测量的方法。 该方法使用用于产生光的宽带光源,干涉仪,相移装置,成像光学系统和用于收集和测量来自物体的反射光的探测器阵列。 检测到的光由处理器单元处理以获得物体表面。

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