Abstract:
In a system and method for performing tear film structure measurement and evaporation rate measurements a broadband light source illuminates the tear film and a spectrometer measures respective spectra of reflected light from at least one point of the tear film. A color camera obtains a large field of view image of the tear film so as to obtain color information for all points of the tear film imaged by the color camera and an autofocusing mechanism focusses the color camera and the spectrometer. A processing unit coupled to the camera and to the spectrometer calibrates the camera so that the color obtained by the camera at the at least one point measured by the spectrometer matches the color of the spectrometer at the same point, and determines from the color of each point of the calibrated camera the thickness of the lipids at the respective point.
Abstract:
A system (10) for analyzing an object (11) includes a light source (12) producing multiple light components, each of different wavelength and a respective amplitude, phase and polarization. An optical element (13) directs the light components on to the object to create known 2D patterns at different image planes displaced from the optical element by distances that are known functions of the wavelength of the light component. A 2D imager (20) images the 2D patterns and produces a plurality of full view 2D wavelength dependent patterns each corresponding to a known distance from the optical element and each having variable image contrast dependent on displacement of a surface of the object from the image plane, maximal image contrast being achieved when the surface of the object and image plane are coincident. A processing unit (25) determines the object surface based on the variable image contrast of each image.
Abstract:
A method for high dynamic range and high accuracy interferometry measurements is described. The method uses a broadband light source for generating light, an interferometer, a phase shifting device, an imaging optical system and a detector array for collecting and measuring the reflected light from an object. The detected light is processed by a processor unit to obtain the object's surface.
Abstract:
In a system for analyzing optical properties of an object (350) a point source of light (100) composed of multiple spectral bands each having a respective amplitude, phase and polarization is converted by first optics (120, 150) into a line light source to illuminate an object line on the object. A beam splitter (200) splits the light exiting the first optics and directs a first portion of light on to the object (350) as an illuminated line and a second portion of the light on to a reference mirror (450). Second optics (500) collects respective first and second lines of light reflected by the object and mirror of and collinearly images the reflected lines of light as an image line on to an imaging spectrometer (550) wherein mutual interference allows determination of the optical properties of the object at each point along the object line.