TRANSISTOR, 3D MEMORY AND MANUFACTURING METHOD THEREFOR, AND ELECTRONIC DEVICE

    公开(公告)号:US20240130106A1

    公开(公告)日:2024-04-18

    申请号:US18304219

    申请日:2023-04-20

    CPC classification number: H10B12/30 H10B12/05

    Abstract: A transistor, a 3D memory and a manufacturing method therefor, and an electronic device are provided in the present application. The 3D memory includes a plurality of layers of memory cells stacked in a direction perpendicular to a substrate, and a word line. A memory cell includes a transistor which includes a source and a drain, a gate extending in the direction perpendicular to the substrate, a semiconductor layer surrounding a sidewall of the gate. The semiconductor layer includes a source contact region and a drain contact region arranged at intervals. A channel between the source contact region and the drain contact region is a horizontal channel, and the word line extends in the direction perpendicular to the substrate and penetrates through the memory cells of different layers.

    MEMORY, METHOD FOR MANUFACTURING MEMORY, AND ELECTRONIC DEVICE

    公开(公告)号:US20240381626A1

    公开(公告)日:2024-11-14

    申请号:US18695254

    申请日:2023-08-21

    Abstract: Disclosed is a memory, a method for manufacturing the memory. The memory includes: one or more layers of memory cell arrays stacked in a direction perpendicular to a substrate; a plurality of wordlines that penetrate through one or more layers of the memory cell arrays; and a plurality of bitlines, wherein each memory cell includes a semiconductor layer that surrounds a sidewall of the wordline and extends along the sidewall and each bitline is connected to the semiconductor layers of a column of memory cells in one layer of the memory cell array, wherein the bitline is composed of different branch lines, and the semiconductor layer of each memory cell is connected to two adjacent first branch lines but is not connected to at least a part of the region of the second branch line between the two adjacent first branch lines.

    SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREFOR, AND ELECTRONIC DEVICE

    公开(公告)号:US20250056790A1

    公开(公告)日:2025-02-13

    申请号:US18754418

    申请日:2024-06-26

    Abstract: Provided are a semiconductor device and manufacturing method thereof, and an electronic device. The semiconductor device includes multiple storage cells distributed in a direction perpendicular to a base substrate, the multiple storage cells include multiple transistors and capacitors distributed in different layers and stacked in the direction perpendicular to the base substrate; a word line penetrating different layers and extending in the direction perpendicular to the base substrate; a transistor includes a first source/drain electrode, a second source/drain electrode and a semiconductor layer surrounding a sidewall of the word line; first insulating layers and conductive layers alternately distributed in the direction perpendicular to the base substrate, at least one first hole penetrating the different layers; and the second electrode of the capacitor includes an inner electrode disposed in the first hole on the first electrode.

    Method for Efficiently Processing Instructions in a Computational Storage Device

    公开(公告)号:US20240061596A1

    公开(公告)日:2024-02-22

    申请号:US18312968

    申请日:2023-05-05

    CPC classification number: G06F3/0631 G06F3/0604 G06F3/0679

    Abstract: Provided are a computational storage system, computational storage processor, solid-state drive (SSD) and data storing method. The method may include receiving a first storing instruction based on a storage object, generating a second storing instruction based on a flash memory address according to information carried by the first storing instruction and SSD resource information maintained locally, and sending the generated second storing instruction to the SSD. The SSD resource information may include resource occupation information in the SSD. Generating the second storing instruction may include parsing an identification of a storage object, data length information and a starting source address of entire data, allocating a flash memory address or addresses in one or more SSDs for storing data of the storage object according to the data length information and the resource occupancy information in the SSD, and generating the second storing instructions for each SSD.

Patent Agency Ranking