公开(公告)号：WO2007087315A3

公开(公告)日：2008-07-31

申请号：PCT/US2007001799

申请日：2007-01-23

Applicant: CHEMIMAGE CORP ,  BECKSTEAD JEFFREY ,  TREADO PATRICK J ,  NELSON MATTHEW ,  HUBBLE HUGH W II ,  NEISS JASON

Inventor： BECKSTEAD JEFFREY ,  TREADO PATRICK J ,  NELSON MATTHEW ,  HUBBLE HUGH W II ,  NEISS JASON

IPC: G01J3/44

CPC classification number: G01J3/44 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0272 ,  G01J3/28 ,  G01J3/443 ,  G01N21/65 ,  G01N21/718

Abstract: In one embodiment, the disclosure relates to a method for interrogating a sample by: illuminating a first region of the sample with a first illumination pattern to obtain a plurality of first sample photons; illuminating a second region of the sample with a second illumination pattern to obtain a plurality of second sample photons; processing the plurality of first sample photons to obtain a characteristic atomic emission of the first region and processing the plurality of second sample photons to obtain a Raman spectrum; and identifying the sample through at least one of the characteristic atomic emission of the first region or the Raman spectrum of the second region of the sample.

Abstract translation: 在一个实施例中，本公开涉及一种用于询问样本的方法，其中：用第一照明图案照射样品的第一区域以获得多个第一样品光子; 用第二照明图案照射样品的第二区域以获得多个第二样品光子; 处理多个第一样品光子以获得第一区域的特征原子发射并处理多个第二样品光子以获得拉曼光谱; 以及通过样品的第二区域的第一区域的特征性原子发射或拉曼光谱中的至少一个来识别样品。

公开(公告)号：EP1977205A4

公开(公告)日：2010-06-09

申请号：EP07762521

申请日：2007-01-23

Applicant: CHEMIMAGE CORP

Inventor： BECKSTEAD JEFFREY ,  TREADO PATRICK J ,  NELSON MATTHEW ,  HUBBLE HUGH W II ,  NEISS JASON

IPC: G01J3/44 ,  G01J3/30

CPC classification number: G01J3/44 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0272 ,  G01J3/28 ,  G01J3/443 ,  G01N21/65 ,  G01N21/718

Abstract: In one embodiment, the disclosure relates to a method for interrogating a sample by: illuminating a first region of the sample with a first illumination pattern to obtain a plurality of first sample photons; illuminating a second region of the sample with a second illumination pattern to obtain a plurality of second sample photons; processing the plurality of first sample photons to obtain a characteristic atomic emission of the first region and processing the plurality of second sample photons to obtain a Raman spectrum; and identifying the sample through at least one of the characteristic atomic emission of the first region or the Raman spectrum of the second region of the sample.