PULSE MODE ELECTRON GENERATOR
    1.
    发明专利

    公开(公告)号:JP2000353486A

    公开(公告)日:2000-12-19

    申请号:JP2000106050

    申请日:2000-04-07

    Applicant: CIT ALCATEL

    Abstract: PROBLEM TO BE SOLVED: To provide a pulse mode electron generator having a field emission cathode, reducing power consumption and simply controlled by an electric pulse generator easy to realize. SOLUTION: This pulse mode electron generator includes a field emission cathode 1 having electron emission micro-points 6-11 connected to a grid 13 biased by a biasing means 20 positively biasing the grid 13 and an anode 3 attracting the electrons emitted from the cathode 1. The grid 13 is biased by a fixed positive preliminary bias voltage generator 21 feeding a stop voltage slightly lower than the emission threshold voltage of the cathode 1, and it is connected in series to a positive pulse voltage generator 22 feeding the pulse component with a value sufficient to exceed the emission threshold voltage of the cathode 1. An electron pulse mode is easily generated, and power consumption required for generating electrons is reduced.

    HIGH-PRESSURE OPERATION FOR FIELD EMISSION COLD CATHODE

    公开(公告)号:JP2000353492A

    公开(公告)日:2000-12-19

    申请号:JP2000116161

    申请日:2000-04-18

    Applicant: CIT ALCATEL

    Abstract: PROBLEM TO BE SOLVED: To provide a gas detecting or measuring method and a device reduced in danger of breakdown of a field emission cathode. SOLUTION: The system for generating electrons with a field emission cathode 1 includes an array of electron emission micro-points 4-7 correlated with a grid 13 and carried by a substrate 3, and the substrate 3 has integral heater means 25-28 for heating the micro-points 4-7 in the range of about 300-400 deg.C and keeping the micro-points 4-7 at the temperature during electron emission. The cathode 1 can function at a higher residual air pressure without the danger of breakdown.

    ION SOURCE FOR TIME-OF-FLICHT MASS SPECTROMETER FOR GAS SAMPLE ANALYSIS

    公开(公告)号:JP2000348665A

    公开(公告)日:2000-12-15

    申请号:JP2000116162

    申请日:2000-04-18

    Applicant: CIT ALCATEL

    Abstract: PROBLEM TO BE SOLVED: To provide a more compact and more sensitive ion source structure of a mass spectrometer capable of being easily integrated with other component parts of the mass spectrometer. SOLUTION: This ion source of a mass spectrometer includes an electron source 5, at least one electrode 7 to adjust an electron stream and a rear electron gun 1 having at least one micro-channel wafer 9, 10 to generate a pulse secondary electron beam 12 containing many electrons from a pulse primary electron beam 8. The secondary ion beam 12 enters in the gas ionizing area 16 of an ion gun to generate an ion stream 19, and is analyzed by an ion detector 4 after passing through a flight tube 3.

    LEAK DETECTING METHOD BY DETECTION OF TRACER GAS AND LEAK DETECTING DEVICE FOR EXECUTING THIS METHOD

    公开(公告)号:JP2000171327A

    公开(公告)日:2000-06-23

    申请号:JP35233299

    申请日:1999-12-10

    Applicant: CIT ALCATEL

    Abstract: PROBLEM TO BE SOLVED: To shorten the preliminary exhaust duration time, to detect a large quantity of leak, to make the sensitivity of a leak detector adapt to a detection according to the characteristic of the leak to be tested, and to remove the background noise of helium resulted from a primary pump by use of the same primary pump. SOLUTION: A rotation starting device is constituted so that the rotating speed of a primary pump 6 is changed between at least two different rotating speeds V1, V2. A suction port 9 is selectively connected to the suction side 5 of the primary pump 6, the suction side 2 of a secondary pump 3, or a intermediate zone 14 through control valves 11, 13, 16. In order to execute the quickest preliminary exhaust, the detection of the largest quantity of leak, the compensation of the largest quantity of gas leak, and the adaptation of the sensitivity of the device prior to a test, and also in order to suppress the background noise of helium caused from the primary pump 6, the rotating speed change of the primary pump 6 is used.

    5.
    发明专利
    未知

    公开(公告)号:AT350761T

    公开(公告)日:2007-01-15

    申请号:AT00400835

    申请日:2000-03-27

    Applicant: CIT ALCATEL

    Abstract: The pulse mode electron generator of the invention includes a field emission cathode with electron-emitting micropoints associated with a grid biased by means for positively biasing the grid and an anode attracting electrons emitted by the cathode. The grid is biased by a permanent positive pre-bias voltage generator delivering a rest voltage which is slightly lower than the emission threshold voltage of the cathode and in series with a positive pulse voltage generator delivering a pulse component of sufficient value to exceed the emission threshold voltage of the cathode. This facilitates the pulse mode production of electrons and reduces the power consumption needed to produce the electrons.

    6.
    发明专利
    未知

    公开(公告)号:DE69305762T2

    公开(公告)日:1997-03-06

    申请号:DE69305762

    申请日:1993-02-01

    Applicant: CIT ALCATEL

    Abstract: An electromagnetic bearing including a stator portion having sixteen magnetic cores facing the rotor portion. The sixteen cores are divided into four groups of four cores, and each group is equipped with suspension electric windings disposed such that the magnetic flux produced thereby is in the same direction in the first two cores of the group and in the opposite direction in the following two cores, each core in each group further being equipped with a position-detection electric coil, the coils on the four cores in any one group being connected together in series and powered by an AC electric current, the magnetic flux produced by the coils at any determined time being in opposite directions in the first two cores of any group, and also in opposite directions in the following two cores.

    9.
    发明专利
    未知

    公开(公告)号:FR2792773B1

    公开(公告)日:2001-07-27

    申请号:FR9905088

    申请日:1999-04-22

    Applicant: CIT ALCATEL

    Abstract: In accordance with the invention, the ion source of a time-of-flight mass spectrometer includes an electron gun having an electron source and at least one electrode for conditioning the flow of electrons, followed by at least one microchannel wafer for generating a pulsed secondary electron beam containing a greater number of electrons from a pulsed primary electron beam. The secondary electron beam enters a gas ionization area of an ion gun which produces a flow of ions which is then passed through the flight tube in order to be analyzed by an ion detector. This provides a high-performance ion source which is compact, sensitive and easy to integrate.

    10.
    发明专利
    未知

    公开(公告)号:FR2792771B1

    公开(公告)日:2001-07-27

    申请号:FR9905087

    申请日:1999-04-22

    Applicant: CIT ALCATEL

    Abstract: The pulse mode electron generator of the invention includes a field emission cathode with electron-emitting micropoints associated with a grid biased by means for positively biasing the grid and an anode attracting electrons emitted by the cathode. The grid is biased by a permanent positive pre-bias voltage generator delivering a rest voltage which is slightly lower than the emission threshold voltage of the cathode and in series with a positive pulse voltage generator delivering a pulse component of sufficient value to exceed the emission threshold voltage of the cathode. This facilitates the pulse mode production of electrons and reduces the power consumption needed to produce the electrons.

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