VOLTAGE REFERENCE CIRCUIT WITH NEGATIVE LINEAR TEMPERATURE CHANGE

    公开(公告)号:JPH07295667A

    公开(公告)日:1995-11-10

    申请号:JP32961594

    申请日:1994-12-02

    Abstract: PURPOSE: To provide a circuit that generates a reference voltage with negative temperature coefficient together with a band gap reference voltage with positive temperature coefficient. CONSTITUTION: This circuit includes a network consisting of a Vbe voltage multiplier circuit (K'Vbe) circulating a properly stabilized current against change in a supply voltage between an output node A of an amplifier and a band gap voltage generating network, at least one resistor R connected between a band gap voltage node and ground, and resistive voltage dividers R1, R2 connected to between an output node and ground.

    4.
    发明专利
    未知

    公开(公告)号:DE69609053D1

    公开(公告)日:2000-08-03

    申请号:DE69609053

    申请日:1996-05-14

    Abstract: An integrated semiconductor structure (500) comprises two homologous P-type regions (120 and 130) formed within an N-type epitaxial layer (110). A P-type region (510) formed in the portion of the epitaxial layer (110) disposed between the two P-type regions (120 and 130) includes within it an N-type region (520); this N region (520) is electrically connected to the P region (130) by means of a surface metal contact (530). The structure reduces the injection of current between the P region 120 and the P region 130, at the same time preventing any vertical parasitic transistors from being switched on.

    7.
    发明专利
    未知

    公开(公告)号:DE69609053T2

    公开(公告)日:2001-03-29

    申请号:DE69609053

    申请日:1996-05-14

    Abstract: An integrated semiconductor structure (500) comprises two homologous P-type regions (120 and 130) formed within an N-type epitaxial layer (110). A P-type region (510) formed in the portion of the epitaxial layer (110) disposed between the two P-type regions (120 and 130) includes within it an N-type region (520); this N region (520) is electrically connected to the P region (130) by means of a surface metal contact (530). The structure reduces the injection of current between the P region 120 and the P region 130, at the same time preventing any vertical parasitic transistors from being switched on.

    8.
    发明专利
    未知

    公开(公告)号:DE69618178D1

    公开(公告)日:2002-01-31

    申请号:DE69618178

    申请日:1996-05-14

    Abstract: A monolithic, integrated semiconductor circuit comprising a high-voltage device (210) with a predetermined reverse-conduction threshold, typically a chain of Zener diodes (220-240) has, connected in series therewith, a thermal compensation device (250) constituted by a plurality of Vbe multipliers connected in series with one another. Each of the Vbe multipliers is formed by a resistive divider (R1i, R2i) and a low-voltage transistor (Ti) or two or more low-voltage transistors in a Darlington configuration.

    9.
    发明专利
    未知

    公开(公告)号:DE69325027T2

    公开(公告)日:1999-09-16

    申请号:DE69325027

    申请日:1993-12-02

    Abstract: A bandgap voltage reference circuit employs a Vbe voltage multiplier network in a feedback line of an output amplifier of the bandgap reference circuit, thus permitting to independently fix the output voltage that is produced and the temperature coefficient thereof. A voltage reference having a linear negative temperature coefficient in an extended temperature variation range may be obtained, starting from a bandgap reference voltage with a positive temperature coefficient.

    10.
    发明专利
    未知

    公开(公告)号:DE69325027D1

    公开(公告)日:1999-06-24

    申请号:DE69325027

    申请日:1993-12-02

    Abstract: A bandgap voltage reference circuit employs a Vbe voltage multiplier network in a feedback line of an output amplifier of the bandgap reference circuit, thus permitting to independently fix the output voltage that is produced and the temperature coefficient thereof. A voltage reference having a linear negative temperature coefficient in an extended temperature variation range may be obtained, starting from a bandgap reference voltage with a positive temperature coefficient.

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