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    감소된 복굴절을 갖는 유리 기판을 제조하는 방법
    3.
    发明公开
    감소된 복굴절을 갖는 유리 기판을 제조하는 방법 审中-公开

    公开(公告)号：KR20200142018A

    公开(公告)日：2020-12-21

    申请号：KR20207030857

    申请日：2019-04-04

    Applicant: CORNING INC

    Inventor： RAI ROHIT ,  SCHNEIDER VITOR MARINO

    IPC: C03B25/00 ,  C03B13/02 ,  C03B13/04 ,  C03C3/083 ,  C03C10/00 ,  C03C21/00 ,  C03C23/00

    Abstract: 복굴절결함을감소시키기위해유리-계기판을처리하는방법및 유리-계기판이개시된다. 일구체예에서, 유리-계기판을처리하기위한방법은상기유리-계기판을형성하기위해유리-계물질을롤링하는단계, 및상기유리-계기판의온도를증가시킴으로써유리-계기판을열처리하는단계, 상기온도를유지기간동안최대온도로유지하는단계, 및이후상기온도를일 이상의냉각속도로감소시키는단계를포함하며, 여기서상기열처리후에, 상기유리-계기판은상기유리-계기판의임의의모서리로부터 5 mm 및이의외부및 상기유리-계기판의임의의에지(edge)로부터 5 mm 및이의외부의모든위치에서 5 nm/mm 이하의피크-투-밸리(peak-to-valley)의두께에걸친지연(retardance)을갖는다.

    PRISM-COUPLING SYSTEMS AND METHODS FOR CHARACTERIZING ION-EXCHANGED WAVEGUIDES WITH LARGE DEPTH-OF-LAYER
    6.
    发明申请
    PRISM-COUPLING SYSTEMS AND METHODS FOR CHARACTERIZING ION-EXCHANGED WAVEGUIDES WITH LARGE DEPTH-OF-LAYER 审中-公开
    用于表征具有大层深度的离子交换波长的原始耦合系统和方法

    公开(公告)号：WO2016106038A3

    公开(公告)日：2016-08-18

    申请号：PCT/US2015066022

    申请日：2015-12-16

    Applicant: CORNING INC

    Inventor： ROUSSEV ROSTISLAV VATCHEV ,  SCHNEIDER VITOR MARINO ,  YOUNG EMILY ELIZABETH

    IPC: G01N21/41 ,  C03C21/00 ,  G01N21/84

    CPC classification number: G01M11/08 ,  C03C21/002 ,  G01B11/0641 ,  G01B11/22 ,  G01L1/24 ,  G01L1/248 ,  G01N21/23 ,  G01N21/41 ,  G01N21/8422 ,  G01N2021/4126 ,  G02B5/04 ,  G02B6/1345 ,  G02B6/14 ,  G02B6/34 ,  G02B6/362

    Abstract: Prism-coupling systems and methods for characterizing large depth-of-layer waveguides formed in glass substrates by dual ion-exchange (DIOX) are disclosed. One method includes making a first measurement after a first ion-exchange process that forms a deep region and then performing a second measurement after a second ion-exchange process that forms a shallow region. Light- blocking features (49) are arranged relative to the prism (40) to produce a mode spectrum where the contrast of the mode lines for the strongly coupled low-order modes is improved at the expense of loss of resolution for measuring characteristics of the shallow region. Standard techniques for determining the compressive stress, the depth of layer or the tensile strength of the shallow region are then employed. A second measurement can be made using a near-IR wavelength to measure characteristics of the deeper, first ion-exchange process. Systems and methods of measuring ion- exchanged samples using shape control are also disclosed.

    Abstract translation: 公开了通过双离子交换（DIOX）表征在玻璃基板中形成的大深度深度波导的棱镜耦合系统和方法。 一种方法包括在形成深区域的第一离子交换过程之后进行第一测量，然后在形成浅区域的第二离子交换过程之后进行第二测量。 遮光特征（49）相对于棱镜（40）布置以产生模式光谱，其中强耦合低阶模式的模式线的对比度以牺牲分辨率的损失为代价，用于测量 浅地区。 然后采用用于确定压缩应力，层的深度或浅区域的拉伸强度的标准技术。 可以使用近红外波长进行第二次测量，以测量较深的第一离子交换过程的特性。 还公开了使用形状控制测量离子交换样品的系统和方法。

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