Abstract:
An actinic ray-sensitive or radiation-sensitive resin composition includes: (A) a resin capable of increasing a solubility of the resin (A) in an alkali developer by an action of an acid; and (B) a compound capable of generating an acid upon irradiation with an actinic ray or radiation, wherein (B) the compound capable of generating an acid upon irradiation with an actinic ray or radiation is contained in an amount of 10 to 30 mass % based on the entire solid content of the actinic ray-sensitive or radiation-sensitive resin composition, and a pattern forming method uses the composition.
Abstract:
PROBLEM TO BE SOLVED: To provide a method for producing a material for fixing a polymerization initiator on a surface, which can easily produce a domain structure of a nanosize order by a self assembled monolayer of the polymerization initiator without using means such as lithography; and to provide a method for producing a grafted polymer pattern which can easily produce a grafted polymer pattern having a domain structure of a nanosize order. SOLUTION: The method for producing a material for fixing a polymerization initiator on a surface comprises: contacting the polymerization initiator, having a site which can be bonded to a support, with the surface of the support, using a dipping or evaporation method; and then forming the nanodomain structure by the self assembled monolayer of the polymerization initiator bonded to the support on the support by self-assembly of the polymerization initiator bonded to the support. The method for producing the grafted polymer pattern comprises a step of producing the grafted polymer on the nanodomain structure of the material for fixing the polymerization initiator on the surface provided by the method for producing the material for fixing the polymerization initiator on the surface. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a pattern forming method by which excellent roughness performance, local pattern dimension uniformity and exposure latitude are achieved and film reduction in a pattern part can be suppressed, and to provide a compound, an actinic ray-sensitive or radiation-sensitive resin composition and a resist film used for the method, and a method for manufacturing an electronic device.SOLUTION: An actinic ray-sensitive or radiation-sensitive resin composition contains (A) a resin having a group that is decomposed under the action of an acid, and generating a polar group, (C1) a compound having a group generating a first acidic functional group by the application of an active ray or a radiation ray, and a group generating a second acidic functional group different from the first acidic functional group by the application of an active ray or a radiation ray, and (C2) a compound having two or more groups selected from groups generating a structure represented by general formulae (a), (b), (c), and (d) by the application of an active ray or a radiation ray.
Abstract:
PROBLEM TO BE SOLVED: To provide an actinic ray- or radiation-sensitive resin composition having high developability, exposure latitude and line edge roughness performance to solve a problem of an essential performance improvement technology of microphotofabrication using far-ultraviolet light, EUV, an electron beam, or the like, especially ArF excimer laser light. SOLUTION: This actinic ray- or radiation-sensitive resin composition includes a basic compound having (C)n basic groups and m groups that generate an acid by emission of actinic rays or radiation. Here, n and m satisfy the relationships n≥1, m≥2 and n COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an organic electroluminescent element with high interlayer adhesiveness and excellent durability, and to provide a method of manufacturing the same. SOLUTION: The organic electroluminescent element includes one electrode, at least one organic deposition layer, and another electrode formed in this order. Surface roughness Ra on the another electrode side of the organic deposition layer and a thickness t of the organic deposition layer satisfy a relation of 0.093
Abstract:
PROBLEM TO BE SOLVED: To provide an actinic ray-sensitive or radiation-sensitive resin composition having an effect of improving a trailing shape of a resist pattern and enabling formation of a pattern with excellent LER performance, and a pattern forming method using the composition.SOLUTION: The actinic ray-sensitive or radiation-sensitive resin composition comprises (A) a resin showing increase in the solubility with an alkali developing solution by an action of an acid, and (B) a compound that generates an acid by irradiation with actinic rays or radiation; and the actinic ray-sensitive or radiation-sensitive resin composition includes the (B) compound that generates an acid by irradiation with actinic rays or radiation by 10 to 30 mass% on a basis of the whole solid content of the resin composition. A pattern forming method is carried out by using the above composition.
Abstract:
PROBLEM TO BE SOLVED: To provide an actinic ray-sensitive or radiation-sensitive resin composition capable of forming a pattern excellent in line width roughness (LWR) performance and corner proximity performance, and to provide a resist film and a pattern forming method using the composition.SOLUTION: There is provided an actinic ray-sensitive or radiation-sensitive resin composition including: (A) a resin that has a group represented by general formula (A1) and exhibits increase in solubility with an alkali developing solution by an action of an acid; (B) an onium salt compound that has a nitrogen atom in a cationic moiety and is decomposed by irradiation with actinic rays or radiation to generate an acid; and (D) a solvent. A resist film and a pattern forming method using the above composition are also provided. In general formula (A1), Rrepresents an oxygen atom or a sulfur atom; Rrepresents a hydrogen atom or a group represented by -COR; Rrepresents a monovalent hydrocarbon group which may have a hetero atom; and Rrepresents a hydrogen atom, methyl group, trifluoromethyl group or cyano group.
Abstract translation:要解决的问题:提供能够形成线宽粗糙度(LWR)性能和角接近性能优异的图案的光化射线敏感或辐射敏感性树脂组合物,并提供抗蚀剂膜和图案形成 方法使用该组合物。 提供了一种光化射线敏感或辐射敏感性树脂组合物,其包括:(A)具有由通式(A1)表示的基团并通过作用显示出与碱性显影液的溶解度增加的树脂 的酸 (B)在阳离子部分具有氮原子并通过用光化射线或辐射照射而分解产生酸的鎓盐化合物; 和(D)溶剂。 还提供了使用上述组合物的抗蚀剂膜和图案形成方法。 在通式(A1)中,R 3 SB>表示氧原子或硫原子; R 4 SB>表示氢原子或由-CO 2表示的基团。 SB>; R 5 SB>表示可以具有杂原子的一价烃基; R 6表示氢原子,甲基,三氟甲基或氰基。 版权所有(C)2012,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a polymer film showing excellent production suitability, durability and adhesiveness to the substrate and having a fine structural pattern, a laminate having the polymer film and methods of manufacturing the polymer film and the laminate. SOLUTION: The method of manufacturing the polymer film includes: a film formation process of forming a polymer film by bringing two or more polymers including one or moer polymer having radical-polymerizable groups into contact with the surface of a substrate capable of generating a radical on exposure to light to form a polymer film having a phase-separated structure on the surface of the substrate; a fixing process of exposing the polymer film formed by the film forming process to light so as to fix the polymer film to the substrate; and a cleaning process of cleaning the polymer film obtained by the fixing process with a solvent. The polymer film obtained by the manufacturing method, and bound directly to the surface of the substrate is also provided. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an actinic ray-sensitive or radiation-sensitive resin composition having effect in improvement of tapered profile of a resist pattern and capable of forming a pattern with good LER performance, and to provide a pattern forming method using the composition.SOLUTION: An actinic ray-sensitive or radiation-sensitive resin composition and a pattern forming method using the composition comprise: (A) resin in which solubility in an alkali developer by action of acid increases; and (B) a compound generating the acid by irradiation with an actinic ray or radiation. The actinic ray-sensitive or radiation-sensitive resin composition contains 10 to 30 mass% of (B) the compound generating the acid by the irradiation with the actinic ray or radiation on the basis of entire solid content of the actinic ray-sensitive or radiation-sensitive resin composition.