Abstract:
According to one embodiment, there is provided an actinic ray- or radiation-sensitive resin composition including (A) a compound represented by a general formula (1) below that generates an acid when exposed to actinic rays or radiation, and (B) a resin.
Abstract:
PROBLEM TO BE SOLVED: To provide: an actinic ray-sensitive or radiation-sensitive resin composition having all of high sensitivity, excellent exposure latitude, and excellent line edge roughness performance at a high level; an actinic ray-sensitive or radiation-sensitive film using the composition; and a pattern formation method.SOLUTION: The actinic ray-sensitive or radiation-sensitive resin composition contains (A) a compound represented by the following general formula (1-1). In the formula, Rrepresents an alkyl group, an alkenyl group, an alkoxy group, an aliphatic cyclic group, an aromatic hydrocarbon group or a heterocyclic group; Rrepresents a hydrogen atom, an alkyl group, an alkoxy group, an alkenyl group, an aliphatic cyclic group, an aromatic hydrocarbon group, a heterocyclic group, a cyano group or an alkoxycarbonyl group; and Rrepresents an alkylene group where one or more -CH- groups may be substituted by an ether group, a carbonyl group, an ester group, an amide group, an urethane group or an urea group.
Abstract translation:要解决的问题:提供:具有高灵敏度,优异的曝光宽容度以及优异的线边缘粗糙度性能的光化射线敏感或辐射敏感性树脂组合物; 使用该组合物的光化射线敏感或辐射敏感膜; 和图案形成方法。 光解射线敏感性或辐射敏感性树脂组合物含有(A)由以下通式(1-1)表示的化合物。 式中,R“表示烷基,烯基,烷氧基,脂肪族环,芳香族烃基,杂环基等。 R 2 SB>表示氢原子,烷基,烷氧基,烯基,脂族环状基团,芳香族烃基,杂环基,氰基或 烷氧基羰基 R 3表示亚烷基,其中一个或多个-CH- SB POS =“2” - >可以被醚基取代,羰基 基团,酯基,酰胺基,氨基甲酸酯基或脲基。 版权所有(C)2013,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide: an actinic ray-sensitive or radiation-sensitive resin composition improved in CDU and roundness and suited even for a liquid immersion process with a line width of 45 nm or less; an actinic ray-sensitive or radiation-sensitive film and a pattern formation method which use the composition; and an electronic device manufacturing method and an electronic device.SOLUTION: An actinic ray-sensitive or radiation-sensitive resin composition contains a compound (A) represented by the specified general formula (1), and a resin (B) whose solubility in an alkaline developer is increased by the action of an acid. (The meaning of each symbol in the general formula (1) is described in the claims.)
Abstract:
PROBLEM TO BE SOLVED: To provide an actinic ray-sensitive or radiation-sensitive resin composition capable of satisfying, in a high level, all of reducing the number of development defects (bridge defects), reducing fluctuations of a critical dimension (CD) of a pattern line width per 1°C of PEB temperature (PEB temperature dependence), and enlarging a focus latitude in a space (space-DOF (depth of focus)), and to provide an actinic ray-sensitive or radiation-sensitive film using the actinic ray-sensitive or radiation-sensitive resin, a method for forming a pattern, a method for manufacturing an electronic device, and an electronic device using the above composition.SOLUTION: The actinic ray-sensitive or radiation-sensitive resin composition includes (A) a resin having a repeating unit expressed by general formula (1A) and a repeating unit expressed by general formula (1B) that is decomposed by an acid to generate a carboxyl group, and (B) a compound that generates an acid by irradiation with actinic rays or radiation. In general formula (1A), L represents a single bond or a divalent connecting group; and Z represents a cyclic acid anhydride group.
Abstract:
PROBLEM TO BE SOLVED: To provide an actinic ray-sensitive or radiation-sensitive resin composition achieving a favorable cross-sectional shape with high rectangularity, a high film residual rate and reduction of bridge defects, and to provide a resist film and a pattern forming method using the composition, and a method for manufacturing an electronic device and an electronic device.SOLUTION: The actinic ray-sensitive or radiation-sensitive resin composition includes: (A) a resin having a repeating unit expressed by following general formula (1), a repeating unit having a lactone structure or a sultone structure, and a repeating unit that is decomposed by an action of an acid to generate an alkali-soluble group; and (B) a compound that generates an acid by irradiation with actinic rays or radiation. In general formula (1), L represents a single bond or a divalent connecting group; Rrepresents a hydrogen atom or an alkyl group; and Z represents a cyclic acid anhydride group.
Abstract:
PROBLEM TO BE SOLVED: To provide an actinic ray-sensitive or radiation-sensitive resin composition which is excellent in the temporal stability of line width of a pattern, and an actinic ray-sensitive or radiation-sensitive film using the composition and a pattern formation method.SOLUTION: An actinic ray-sensitive or radiation-sensitive resin composition contains (A) a resin which is decomposed by the action of an acid to thereby exhibit increased solubility in an alkali developer and (B) a compound represented by the following general formula (1-1).
Abstract:
PROBLEM TO BE SOLVED: To provide an actinic ray-sensitive or radiation-sensitive resin composition capable of forming a pattern excellent in line width roughness (LWR) performance and corner proximity performance, and to provide a resist film and a pattern forming method using the composition.SOLUTION: There is provided an actinic ray-sensitive or radiation-sensitive resin composition including: (A) a resin that has a group represented by general formula (A1) and exhibits increase in solubility with an alkali developing solution by an action of an acid; (B) an onium salt compound that has a nitrogen atom in a cationic moiety and is decomposed by irradiation with actinic rays or radiation to generate an acid; and (D) a solvent. A resist film and a pattern forming method using the above composition are also provided. In general formula (A1), Rrepresents an oxygen atom or a sulfur atom; Rrepresents a hydrogen atom or a group represented by -COR; Rrepresents a monovalent hydrocarbon group which may have a hetero atom; and Rrepresents a hydrogen atom, methyl group, trifluoromethyl group or cyano group.
Abstract translation:要解决的问题:提供能够形成线宽粗糙度(LWR)性能和角接近性能优异的图案的光化射线敏感或辐射敏感性树脂组合物,并提供抗蚀剂膜和图案形成 方法使用该组合物。 提供了一种光化射线敏感或辐射敏感性树脂组合物,其包括:(A)具有由通式(A1)表示的基团并通过作用显示出与碱性显影液的溶解度增加的树脂 的酸 (B)在阳离子部分具有氮原子并通过用光化射线或辐射照射而分解产生酸的鎓盐化合物; 和(D)溶剂。 还提供了使用上述组合物的抗蚀剂膜和图案形成方法。 在通式(A1)中,R 3 SB>表示氧原子或硫原子; R 4 SB>表示氢原子或由-CO 2表示的基团。 SB>; R 5 SB>表示可以具有杂原子的一价烃基; R 6表示氢原子,甲基,三氟甲基或氰基。 版权所有(C)2012,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a photosensitive resin composition from which a uniform contact hole can be formed while maintaining high sensitivity.SOLUTION: The photosensitive resin composition comprises: (1) a polymer having (a1) a structural unit having a group in which an acid group is protected by an acid decomposable group and (a2) a structural unit having a crosslinking group, or (2) a polymer having (a1) a structural unit having a group in which an acid group is protected by an acid decomposable group and a polymer having (a2) a structural unit having a crosslinking group; (B) a photo-acid generator; (C) a compound having a thiirane ring in the molecule (excluding a compound having a thiirane ring in a side chain of a structural unit derived from a (meth)acrylate); and (D) a solvent.