Improved integrated circuit structure.

    公开(公告)号:HK1040569A1

    公开(公告)日:2002-06-14

    申请号:HK02101938

    申请日:2002-03-13

    Applicant: IBM

    Abstract: A semiconductor chip carrier having an increased chip connector and plated through hole density. In particular, a substrate having a plurality of plated through holes therein, and a fatigue resistant redistribution layer thereon. The redistribution layer includes a plurality of vias selectively positioned over and contacting the plated through holes. The substrate further including a ground plane, two pair of signal planes, and two pair of power planes, wherein the second pair of power planes are located directly underneath the external dielectric layer. A buried plated through hole within the substrate.

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