Abstract:
A non- volatile content addressable memory cell comprises: a first phase change material element, the first phase change material element having one end connected to a match-line; a first transistor, the first transistor having a gate connected to a word-line, a source connected to a true bit-read- write-search-line, and a drain connected to another end of the first phase change material element; a second phase change material element, the second phase change material element having one end connected to the match-line; and a second transistor, the second transistor having a gate connected to the word-line, a source connected to a complementary bit- read-write-search-line, and a drain connected to another end of the second phase change material element.
Abstract:
A memory storage system (10) is disclosed. In an exemplary embodiment, the memory storage system includes a plurality of memory storage banks (12) and a cache (14) in communication therewith. Both the plurality of memory storage banks (12) and the cache (14) further include destructive read memory storage elements.
Abstract:
PROBLEM TO BE SOLVED: To provide a memory device used particularly for an associative memory, a method for operating the associative memory, and a system including the associative memory. SOLUTION: The memory device for storing one or a plurality of addresses includes a coincidence line and first and second memory cells forming a two-bit memory cell. Each memory cell includes two memory elements connected to the coincidence line, and a selection line connected there. The selection line provides a signal expression of logical combinations of at least two different inputs. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a random access memory in which current scattering, voltage drops and heat generation related to the access of blocks in first and second storage units of a double memory unit are stabilized. SOLUTION: The memory is arranged between first and second storage units 220 and 222 and include a row selection unit 224 which conducts accesses to the storage places of the units 220 and 222 in accordance with first and second selection signals that are transmitted from the external side end section of the double memory unit to the selected row places. Different numbers are assigned to the blocks located at the distances corresponding from the external side end section so that the sum of the lengths of the propagation of the first and the second selection signals to the numbered blocks is maintained in a relatively constant manner regardless of the block number selected for the access.
Abstract:
PROBLEM TO BE SOLVED: To provide a device for monitoring hierarchical power source noise and a system for VLSI (very large scale integration) circuits. SOLUTION: In the system for monitoring hierarchical power source noise, the noise monitoring device is manufactured on-chip, and the noise on a chip is measured. In the noise-monitoring system, the plurality of on-chip noise-monitoring devices are distributed effectively in the chip. A noise analysis algorithm analyzes a noise characteristic, based on a collected noise data from the noise monitoring device, and the hierarchical noise monitoring system performs mapping operation to the system on the chip for the noise of each core. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To obtain a common row decoder and a common row decoding method for supplying selection signals independently timing-controlled of each other to a first memory unit and a second memory unit, respectively. SOLUTION: A common row decoder 110 includes an address input circuit 111 for supplying an enable input or a disable input in response to conditions of address signals XPs. Furthermore, a first and second selection circuits are provided for supplying selection signals RDOUT independently timing-controlled of each other to the first and second memory units, respectively, in response to first and second block selection inputs BLKSEL, enable conditions of first and second timing signals RDECON, and the enable input of the address input circuit. COPYRIGHT: (C)1999,JPO
Abstract:
Improved transistor array device performance is obtained by use of bias voltage regulation which tracks with a fraction of a monitor transistor threshold voltage. The circuitry and methods are especially useful for improving the performance of transistor array devices such as DRAM and embedded DRAM. These benefits are obtained especially when at least two bias voltages normally supplied to the array are regulated by tracking with a fraction of an actual threshold voltage of at least one monitor transistor. Performance improvements include improved reliability, wider operational bias conditions, reduced power consumption and (in the case of memory cells) improved retention time.
Abstract:
A memory storage system includes a plurality of memory storage banks and a cache in communication therewith. Both the plurality of memory storage banks and the cache further include destructive read memory storage elements configured for delayed write back scheduling thereto.
Abstract:
A memory storage system includes a plurality of memory storage banks and a cache in communication therewith. Both the plurality of memory storage banks and the cache further include destructive read memory storage elements configured for delayed write back scheduling thereto.