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公开(公告)号：BR8402698A
公开(公告)日：1985-05-07
申请号：BR8402698
申请日：1984-06-05
Applicant: IBM
Inventor： JACKWSKI STEFAN PETER , MOYER JAMES THEODORE
Abstract: Testing of interface lines (14) interconnecting a first circuit (10) to a second circuit. When an abnormal circuit condition affects the interface lines, such as an open circuit or a short circuit condition, the operation of the first and second circuit is detrimentally affected. The present invention determines the existence of abnormal circuit conditions in one or more lines of a group of interface lines without the utilization of redundant duplex lines to perform the determination. The interface lines are subdivided into a first group (14a), which are used when the apparatus of the present invention is being used to locate abnormal circuit conditions, and a second group (14b), which is not used when the apparatus of the present invention is being used to locate abnormal circuit conditions. Each line of the first group is connected to a corresponding input terminal of a first exclusive OR gate (16) and a second exclusive OR gate (18) at an input side and an output side, respectively. The first and second OR gates are input to a matching circuit (20), an output signal therefrom indicating the existence of an abnormal circuit condition in the first group of lines. As a result, since the lines of the first group are used when the apparatus of the present invention is being used to locate abnormal circuit conditions, each line of the first group is tested individually for the presence of an abnormal circuit condition. However, since the lines of the second group are not used when the apparatus of the present invention is locating abnormal circuit conditions, the lines of the second group are tested, collectively, as a group, for the presence of an abnormal circuit condition. One line (11) of the first group is connected to an input side of the second group. The output side of the second group is connected to an additional input terminal of the second exclusive OR gate. An output signal from the matching circuit indicates the existence of an abnormal circuit condition in at least one line of either one or both of the first and second group of lines.
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公开(公告)号：AU3555678A
公开(公告)日：1979-11-01
申请号：AU3555678
申请日：1978-04-28
Applicant: IBM
Inventor： MOYER JAMES THEODORE
Abstract: Channel data buffer apparatus for buffering data being transferred between an input/output channel unit and a main storage unit in a digital data processing system. In the disclosed embodiment, data is generally transferred between the channel unit and the data buffer (a "channel/buffer" transfer) in two-byte segments and between the main storage unit and the data buffer (a "storage/buffer" transfer) in eight-byte segments. The data buffer is comprised of eight column-forming byte-wide multirow storage arrays each having its own address mechanism for accessing any desired row therein. Corresponding rows in the different storage arrays provide the corresponding eight-byte rows for the data buffer as a whole. For storage/buffer transfers, data buffer address circuitry is provided for enabling a group of eight contiguous bytes to be read out of or written into the data buffer on a single access even though some of the bytes may be located on one row of the data buffer and other of the bytes on the next row of the data buffer. For channel/buffer transfers, data buffer address circuitry is provided for enabling a group of two contiguous bytes to be read out of or written into the data buffer on a single access even though one of the bytes may be located on one row of the data buffer and the other of the bytes on the next row of the data buffer. For storage/buffer transfers, an eight-byte wrap-around data shifter is located between the data buffer and the main storage unit for enabling any necessary alignment or realignment of the data being transferred. These features enable data to be loaded into the data buffer in a packed manner and without regard to the storage word boundary alignments in the main storage unit. Among other things, this minimizes the hardware needed for buffering the data and improves the data chaining capability of the system.
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Patent Agency Ranking
公开(公告)号：DE3484634D1
公开(公告)日：1991-07-04
申请号：DE3484634
申请日：1984-06-15
Applicant: IBM
Inventor： GOODING DAVID NORMAN , JACKOWSKI STEFAN PETER , MOYER JAMES THEODORE , PLANT III JAMES WALTER
Abstract: A failure detection apparatus is disclosed for detecting the existence of abnormal circuit conditions in a circuit, the abnormal condition causing erroneous data to be transmitted from one circuit to another circuit, via interface lines. Since spare interface lines are not available, the existing interface lines (11) must be used to determine the accuracy of the transmitted data. A gate line (13), interconnecting adjacent intergrated circuits (10, 12), gates the odd and the even data bytes of the data from the one adjacent integrated circuit to another. If the gate line fails, or otherwise experiences an abnormal circuit condition, the odd and the even data bytes will not be gated from the one adjacent integrated circuit to the other in the proper sequence. With the present invention, the proper sequence is checked. The even data bytes are transmitted along the existing interface lines from the one adjacent integrated circuit to the other with an odd parity; however, the odd data bytes are transmitted along the existing interface lines with an even parity. The receiving integrated circuit determines whether the even data bytes were received with the odd parity and whether the odd data bytes were received with the even parity. An error signal is generated when the even and odd data bytes are not received with the odd and even parity, respectively. The error signal indicates the existence of the failure gate line.
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公开(公告)号：DE3467418D1
公开(公告)日：1987-12-17
申请号：DE3467418
申请日：1984-05-25
Applicant: IBM
Inventor： JACKOWSKI STEFAN PETER , MOYER JAMES THEODORE
Abstract: Testing of interface lines (14) interconnecting a first circuit (10) to a second circuit. When an abnormal circuit condition affects the interface lines, such as an open circuit or a short circuit condition, the operation of the first and second circuit is detrimentally affected. The present invention determines the existence of abnormal circuit conditions in one or more lines of a group of interface lines without the utilization of redundant duplex lines to perform the determination. The interface lines are subdivided into a first group (14a), which are used when the apparatus of the present invention is being used to locate abnormal circuit conditions, and a second group (14b), which is not used when the apparatus of the present invention is being used to locate abnormal circuit conditions. Each line of the first group is connected to a corresponding input terminal of a first exclusive OR gate (16) and a second exclusive OR gate (18) at an input side and an output side, respectively. The first and second OR gates are input to a matching circuit (20), an output signal therefrom indicating the existence of an abnormal circuit condition in the first group of lines. As a result, since the lines of the first group are used when the apparatus of the present invention is being used to locate abnormal circuit conditions, each line of the first group is tested individually for the presence of an abnormal circuit condition. However, since the lines of the second group are not used when the apparatus of the present invention is locating abnormal circuit conditions, the lines of the second group are tested, collectively, as a group, for the presence of an abnormal circuit condition. One line (11) of the first group is connected to an input side of the second group. The output side of the second group is connected to an additional input terminal of the second exclusive OR gate. An output signal from the matching circuit indicates the existence of an abnormal circuit condition in at least one line of either one or both of the first and second group of lines.
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公开(公告)号：BR8903132A
公开(公告)日：1990-02-06
申请号：BR8903132
申请日：1989-06-27
Applicant: IBM
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公开(公告)号：AT30783T
公开(公告)日：1987-11-15
申请号：AT84105935
申请日：1984-05-25
Applicant: IBM
Inventor： JACKOWSKI STEFAN PETER , MOYER JAMES THEODORE
Abstract: Testing of interface lines (14) interconnecting a first circuit (10) to a second circuit. When an abnormal circuit condition affects the interface lines, such as an open circuit or a short circuit condition, the operation of the first and second circuit is detrimentally affected. The present invention determines the existence of abnormal circuit conditions in one or more lines of a group of interface lines without the utilization of redundant duplex lines to perform the determination. The interface lines are subdivided into a first group (14a), which are used when the apparatus of the present invention is being used to locate abnormal circuit conditions, and a second group (14b), which is not used when the apparatus of the present invention is being used to locate abnormal circuit conditions. Each line of the first group is connected to a corresponding input terminal of a first exclusive OR gate (16) and a second exclusive OR gate (18) at an input side and an output side, respectively. The first and second OR gates are input to a matching circuit (20), an output signal therefrom indicating the existence of an abnormal circuit condition in the first group of lines. As a result, since the lines of the first group are used when the apparatus of the present invention is being used to locate abnormal circuit conditions, each line of the first group is tested individually for the presence of an abnormal circuit condition. However, since the lines of the second group are not used when the apparatus of the present invention is locating abnormal circuit conditions, the lines of the second group are tested, collectively, as a group, for the presence of an abnormal circuit condition. One line (11) of the first group is connected to an input side of the second group. The output side of the second group is connected to an additional input terminal of the second exclusive OR gate. An output signal from the matching circuit indicates the existence of an abnormal circuit condition in at least one line of either one or both of the first and second group of lines.
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公开(公告)号：DE2829668A1
公开(公告)日：1979-02-01
申请号：DE2829668
申请日：1978-07-06
Applicant: IBM
Inventor： MOYER JAMES THEODORE
Abstract: Channel data buffer apparatus for buffering data being transferred between an input/output channel unit and a main storage unit in a digital data processing system. In the disclosed embodiment, data is generally transferred between the channel unit and the data buffer (a "channel/buffer" transfer) in two-byte segments and between the main storage unit and the data buffer (a "storage/buffer" transfer) in eight-byte segments. The data buffer is comprised of eight column-forming byte-wide multirow storage arrays each having its own address mechanism for accessing any desired row therein. Corresponding rows in the different storage arrays provide the corresponding eight-byte rows for the data buffer as a whole. For storage/buffer transfers, data buffer address circuitry is provided for enabling a group of eight contiguous bytes to be read out of or written into the data buffer on a single access even though some of the bytes may be located on one row of the data buffer and other of the bytes on the next row of the data buffer. For channel/buffer transfers, data buffer address circuitry is provided for enabling a group of two contiguous bytes to be read out of or written into the data buffer on a single access even though one of the bytes may be located on one row of the data buffer and the other of the bytes on the next row of the data buffer. For storage/buffer transfers, an eight-byte wrap-around data shifter is located between the data buffer and the main storage unit for enabling any necessary alignment or realignment of the data being transferred. These features enable data to be loaded into the data buffer in a packed manner and without regard to the storage word boundary alignments in the main storage unit. Among other things, this minimizes the hardware needed for buffering the data and improves the data chaining capability of the system.
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