公开(公告)号：EP1595154A4

公开(公告)日：2006-05-10

申请号：EP03713598

申请日：2003-02-20

Applicant: IBM

Inventor： GATTIKER ANNE ,  GROSCH DAVID A ,  KNOX MARC D ,  MOTIKA FRANCO ,  NIGH PHIL ,  VAN HORN JODY ,  ZUCHOWSKI PAUL S

IPC: G01R31/28 ,  G01R31/30 ,  G01R31/26

CPC classification number: G01R31/2879 ,  G01R31/275 ,  G01R31/2856 ,  G01R31/3004 ,  G01R31/3008

Abstract: Methods for testing a semiconductor circuit (10) including testing the circuit and modifying a well bias (14, 18) of the circuit during testing. The methods improve the resolution of voltage-based and IDDQ testing and diagnosis by modifying well bias during testing. In addition, the methods provide more efficient stresses during stress testing. The methods apply to ICs where the semiconductor well (wells and/or substrates) are wired separately from the chip VDD and GND, allowing for external control (40) of the well potentials during test. In general, the methods rely on using the well bias to change transistor threshold voltages.

公开(公告)号：DE69604810T2

公开(公告)日：2000-04-20

申请号：DE69604810

申请日：1996-08-09

Applicant: IBM

Inventor： LEAS JAMES ,  KOSS ROBERT ,  VAN HORN JODY ,  WALKER GEORGE ,  PERRY CHARLES ,  GARDELL DAVID ,  DINGLE STEVE ,  PRILIK RONALD

IPC: G01R1/06 ,  G01R1/073 ,  G01R31/28 ,  H01L21/66 ,  G01R31/316

Abstract: An apparatus and a method for simultaneously testing or burning in all the integrated circuit chips on a product wafer. The apparatus comprises a glass ceramic carrier having test chips and means for connection to pads of a large number of chips on a product wafer. Voltage regulators on the test chips provide an interface between a power supply and power pads on the product chips, at least one voltage regulator for each product chip. The voltage regulators provide a specified Vdd voltage to the product chips, whereby the Vdd voltage is substantially independent of current drawn by the product chips. The voltage regulators or other electronic means limit current to any product chip if it has a short. The voltage regulator circuit may be gated and variable and it may have sensor lines extending to the product chip. The test chips can also provide test functions such as test patterns and registers for storing test results.

公开(公告)号：DE60320314T2

公开(公告)日：2009-06-25

申请号：DE60320314

申请日：2003-02-20

Applicant: IBM

Inventor： GATTIKER ANNE ,  GROSCH DAVID A ,  KNOX MARC D ,  MOTIKA FRANCO ,  NIGH PHIL ,  VAN HORN JODY ,  ZUCHOWSKI PAUL S

IPC: G01R31/26 ,  G01R31/28 ,  G01R31/30

公开(公告)号：AT391926T

公开(公告)日：2008-04-15

申请号：AT03713598

申请日：2003-02-20

Applicant: IBM

Inventor： GATTIKER ANNE ,  GROSCH DAVID ,  KNOX MARC ,  MOTIKA FRANCO ,  NIGH PHIL ,  VAN HORN JODY ,  ZUCHOWSKI PAUL

IPC: G01R31/26 ,  G01R31/28 ,  G01R31/30

公开(公告)号：DE60320314D1

公开(公告)日：2008-05-21

申请号：DE60320314

申请日：2003-02-20

Applicant: IBM

Inventor： GATTIKER ANNE ,  GROSCH DAVID A ,  KNOX MARC D ,  MOTIKA FRANCO ,  NIGH PHIL ,  VAN HORN JODY ,  ZUCHOWSKI PAUL S

IPC: G01R31/26 ,  G01R31/28 ,  G01R31/30

公开(公告)号：DE69604810D1

公开(公告)日：1999-11-25

申请号：DE69604810

申请日：1996-08-09

Applicant: IBM

Inventor： LEAS JAMES ,  KOSS ROBERT ,  VAN HORN JODY ,  WALKER GEORGE ,  PERRY CHARLES ,  GARDELL DAVID ,  DINGLE STEVE ,  PRILIK RONALD

IPC: G01R1/06 ,  G01R1/073 ,  G01R31/28 ,  H01L21/66 ,  G01R31/316

Abstract: An apparatus and a method for simultaneously testing or burning in all the integrated circuit chips on a product wafer. The apparatus comprises a glass ceramic carrier having test chips and means for connection to pads of a large number of chips on a product wafer. Voltage regulators on the test chips provide an interface between a power supply and power pads on the product chips, at least one voltage regulator for each product chip. The voltage regulators provide a specified Vdd voltage to the product chips, whereby the Vdd voltage is substantially independent of current drawn by the product chips. The voltage regulators or other electronic means limit current to any product chip if it has a short. The voltage regulator circuit may be gated and variable and it may have sensor lines extending to the product chip. The test chips can also provide test functions such as test patterns and registers for storing test results.