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公开(公告)号：US09466628B2
公开(公告)日：2016-10-11
申请号：US14135872
申请日：2013-12-20
Applicant: IMEC
Inventor： Pilar Gonzalez , Murali Jayapala , Andy Lambrechts , Klaas Tack
CPC classification number: H01L27/14625 , G01B7/08 , G01J3/0297 , G01J3/26 , G01J3/2823 , G01J3/36
Abstract: A solid-state spectral imaging device is described. The device includes an image sensor and a plurality of optical filters directly processed on top of the image sensor. Each optical filter includes a first mirror and a second mirror defining an optical filter cavity having a fixed height. Each optical filter also includes a first electrode and a second electrode having a fixed position located opposite to each other and positioned to measure the height of the optical filter cavity. Further, a method to calibrate spectral data of light and a computer program for calibrating light is described.
Abstract translation: 描述了固态光谱成像装置。 该装置包括在图像传感器的顶部直接处理的图像传感器和多个光学滤波器。 每个滤光器包括第一反射镜和限定具有固定高度的光学滤光腔的第二反射镜。 每个滤光器还包括第一电极和第二电极，所述第一电极和第二电极具有彼此相对定位并固定以测量光学滤光器空腔的高度的固定位置。 此外，描述了校准光的光谱数据的方法和用于校准光的计算机程序。
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公开(公告)号：US20250085665A1
公开(公告)日：2025-03-13
申请号：US18882206
申请日：2024-09-11
Applicant: Imec vzw
Inventor： Yuqian Li , Ziduo Lin , Murali Jayapala , Zhenxiang Luo , Vasileios Lemonidis
Abstract: Examples include imaging one or more objects contained inside a droplet. A method includes generating at least one hologram of the one or more objects contained in the droplet by using in-line lens-free imaging. The at least one hologram includes at least one artifact that is caused by the droplet and that affects the at least one characteristic of the one or more objects contained in the droplet. The method includes at least partially removing the at least one artifact or the cause of the at least one artifact. The method further includes generating an image, after or during removing the at least one artifact or the cause of the at least one artifact. The image includes the one or more objects. The method also comprises recognizing the at least one characteristic of the one or more objects based on the image.
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3.发明申请公开(公告)号：US20250114793A1
公开(公告)日：2025-04-10
申请号：US18909640
申请日：2024-10-08
Applicant: IMEC VZW
Inventor： Christopher Adams , Peter Peumans , Andy Lambrechts , Murali Jayapala , Tim Stakenborg
IPC: B01L3/00 , G01N15/1429
Abstract: A system for label-free identification and/or classification and/or selection of at least one cell is provided. The system comprises a microfluidic environment configured to be traversable by the at least one cell, an imaging sensor configured to gather imaging information with respect to at least a part of the microfluidic environment, and a processing unit connected to the imaging sensor. In this context, the microfluidic environment comprises at least one sub-environment configured to interact with the at least one cell. Furthermore, the processing unit is configured to detect at least one sub-environment interaction event based on persistence of the at least one cell imaged by the imaging sensor in the temporal domain. In addition to this, the processing unit is configured to identify and/or classify and/or select the at least one cell based on the at least one sub-environment interaction event.
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公开(公告)号：US09217861B2
公开(公告)日：2015-12-22
申请号：US14373071
申请日：2013-01-18
Applicant: IMEC VZW
Inventor： Murali Jayapala , Geert Van der Plas , Veronique Rochus , Xavier Rottenberg , Simone Severi
CPC classification number: G02B26/0833 , G02B5/08 , G02B7/182 , G02B17/0896 , G02B26/08 , G02B26/0825 , G02B26/0841 , G02B27/10 , H04N13/322 , H04N13/365
Abstract: Micro-mirror arrays configured for use in a variable focal length lens are described herein. An example variable focal length lens comprises a micro-mirror array having a plurality of micro-mirror elements arranged in at least a first section and a second section. Each micro-mirror element has a tilt axis and comprises, on each of two opposing sides of the tilt axis, (i) at least one actuation electrode, (ii) at least one measurement electrode, and (iii) at least one stopper. Additionally, each micro-mirror element in the first section has a first tilt angle range, and each micro-mirror element in the second section has a second tilt angle range, with the first tilt angle range being less than the second tilt angle range.
Abstract translation: 这里描述了配置用于可变焦距透镜的微镜阵列。 示例性可变焦距透镜包括具有布置在至少第一部分和第二部分中的多个微反射镜元件的微反射镜阵列。 每个微镜元件具有倾斜轴线，并且在倾斜轴线的两个相对侧的每一侧上包括（i）至少一个致动电极，（ii）至少一个测量电极，和（iii）至少一个止动器。 此外，第一部分中的每个微镜元件具有第一倾斜角范围，并且第二部分中的每个微镜元件具有第二倾斜角范围，其中第一倾斜角度范围小于第二倾斜角范围。
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公开(公告)号：US09201241B2
公开(公告)日：2015-12-01
申请号：US13746149
申请日：2013-01-21
Applicant: IMEC
Inventor： Murali Jayapala , Geert Van Der Plas , Veronique Rochus , Xavier Rottenberg , Simone Severi , Stéphane Donnay
CPC classification number: G02B27/00 , G02B1/00 , G02B6/352 , G02B6/359 , G02B26/0825 , G02B26/0841 , G02B2207/00 , H04N1/00
Abstract: A built-in self-calibration system and method for a micro-mirror array device, for example, operating as a variable focal length lens is described. The calibration method comprises determining a capacitance value for each micro-mirror element in the array device at a number of predetermined reference angles to provide a capacitance-reference angle relationship. From the capacitance values, an interpolation step is carried to determine intermediate tilt angles for each micro-mirror element in the array. A voltage sweep is applied to the micro-mirror array and capacitance values, for each micro-mirror element in the array, are measured. For a capacitance value that matches one of the values in the capacitance-reference angle relationship, the corresponding voltage is linked to the associated tilt angle to provide a voltage-tilt angle characteristic which then stored in a memory for subsequent use.
Abstract translation: 描述了用作微反射镜阵列器件的内置自校准系统和方法，例如作为可变焦距透镜操作。 校准方法包括以多个预定参考角度确定阵列器件中的每个微镜元件的电容值，以提供电容参考角度关系。 根据电容值，进行插值步骤以确定阵列中的每个微镜元件的中间倾斜角度。 对微镜阵列施加电压扫描，并测量阵列中每个微镜元件的电容值。 对于与电容参考角度关系中的一个值匹配的电容值，相应的电压与相关联的倾斜角度相关联，以提供电压倾斜角特性，然后将其存储在存储器中用于随后的使用。
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Patent Agency Ranking
公开(公告)号：US20140368920A1
公开(公告)日：2014-12-18
申请号：US14373071
申请日：2013-01-18
Applicant: IMEC VZW
Inventor： Murali Jayapala , Geert Van der Plas , Veronique Rochus , Xavier Rottenberg , Simone Severi
IPC: G02B26/08
CPC classification number: G02B26/0833 , G02B5/08 , G02B7/182 , G02B17/0896 , G02B26/08 , G02B26/0825 , G02B26/0841 , G02B27/10 , H04N13/322 , H04N13/365
Abstract: Micro-mirror arrays configured for use in a variable focal length lens are described herein. An example variable focal length lens comprises a micro-mirror array having a plurality of micro-mirror element arranged in at least a first section and a second section. Each micro-mirror element has a tilt axis and comprises, on each of two opposing sides of the tilt axis, (i) at least one actuation electrode, (ii) at least one measurement electrode, and (iii) at least one stopper. Additionally, each micro-mirror element in the first section has a first tilt axis range, and each micro-mirror element in the second section has a second tilt axis range, with the first tilt axis range being less than the second tilt axis range.
Abstract translation: 这里描述了配置用于可变焦距透镜的微镜阵列。 示例性可变焦距透镜包括具有布置在至少第一部分和第二部分中的多个微反射镜元件的微反射镜阵列。 每个微镜元件具有倾斜轴线，并且在倾斜轴线的两个相对侧的每一侧上包括（i）至少一个致动电极，（ii）至少一个测量电极，和（iii）至少一个止动器。 此外，第一部分中的每个微镜元件具有第一倾斜轴范围，并且第二部分中的每个微镜元件具有第二倾斜轴范围，其中第一倾斜轴范围小于第二倾斜轴范围。
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公开(公告)号：US20140175265A1
公开(公告)日：2014-06-26
申请号：US14135872
申请日：2013-12-20
Applicant: IMEC
Inventor： Pilar Gonzalez , Murali Jayapala , Andy Lambrechts , Klaas Tack
IPC: H01L27/146
CPC classification number: H01L27/14625 , G01B7/08 , G01J3/0297 , G01J3/26 , G01J3/2823 , G01J3/36
Abstract: A solid-state spectral imaging device is described. The device includes an image sensor and a plurality of optical filters directly processed on top of the image sensor. Each optical filter includes a first mirror and a second mirror defining an optical filter cavity having a fixed height. Each optical filter also includes a first electrode and a second electrode having a fixed position located opposite to each other and positioned to measure the height of the optical filter cavity. Further, a method to calibrate spectral data of light and a computer program for calibrating light is described.
Abstract translation: 描述了固态光谱成像装置。 该装置包括在图像传感器的顶部直接处理的图像传感器和多个光学滤波器。 每个滤光器包括第一反射镜和限定具有固定高度的光学滤光腔的第二反射镜。 每个滤光器还包括第一电极和第二电极，所述第一电极和第二电极具有彼此相对定位并固定以测量光学滤光器空腔的高度的固定位置。 此外，描述了校准光的光谱数据的方法和用于校准光的计算机程序。
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公开(公告)号：US11307533B2
公开(公告)日：2022-04-19
申请号：US16648987
申请日：2018-09-19
Applicant: IMEC VZW
Inventor： Abdulkadir Yurt , Richard Stahl , Murali Jayapala , Geert Vanmeerbeeck
Abstract: Example embodiments relate to imaging devices for in-line holographic imaging of objects. One embodiment includes an imaging device for in-line holographic imaging of an object. The imaging device includes a set of light sources configured to output light in confined illumination cones. The imaging device also includes an image sensor that includes a set of light-detecting elements. The set of light sources are configured to output light such that the confined illumination cones are arranged side-by-side and illuminate a specific part of the object. The image sensor is arranged such that the light-detecting elements detect a plurality of interference patterns. Each interference pattern is formed by diffracted light from the object originating from a single light source and undiffracted light from the same single light source. At least a subset of the set of light-detecting elements is arranged to detect light relating to not more than one interference pattern.
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公开(公告)号：US20180046139A1
公开(公告)日：2018-02-15
申请号：US15727832
申请日：2017-10-09
Applicant: IMEC VZW
Inventor： Richard Stahl , Murali Jayapala , Andy Lambrechts , Geert Vanmeerbeeck
CPC classification number: G03H1/0443 , G01N15/1404 , G01N15/1429 , G01N15/1434 , G01N15/147 , G01N2015/1006 , G01N2015/1454 , G01N2015/1472 , G01N2015/1486 , G03H1/0465 , G03H1/2645 , G03H2001/0447 , G03H2001/0452 , G03H2001/266 , G03H2210/62 , G03H2222/16
Abstract: Embodiments described herein relate to lens-free imaging. One example embodiment may include a lens-free imaging device for imaging a moving sample. The lens-free imaging device may include a radiation source configured to emit a set of at least two different wavelengths towards the moving sample. The lens-free imaging device is configured to image samples for which a spectral response does not substantially vary for a set of at least two different wavelengths. The lens-free imaging device may also include a line scanner configured to obtain a line scan per wavelength emitted by the radiation source and reflected by, scattered by, or transmitted through the moving sample. The line scanner is configured to regularly obtain a line scan per wavelength. Either the radiation source or the line scanner is configured to isolate data of the at least two different wavelengths.
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公开(公告)号：US09811051B2
公开(公告)日：2017-11-07
申请号：US15039549
申请日：2014-12-02
Applicant: IMEC VZW
Inventor： Richard Stahl , Murali Jayapala , Andy Lambrechts , Geert Vanmeerbeeck
CPC classification number: G03H1/0443 , G01N15/1429 , G01N15/1434 , G01N15/147 , G01N2015/1454 , G03H1/0404 , G03H1/0465 , G03H1/0486 , G03H1/0493 , G03H1/0866 , G03H2001/0212 , G03H2001/0428 , G03H2001/0447 , G03H2001/0452 , G03H2001/0497 , G03H2001/266 , G03H2210/12 , G03H2210/13 , G03H2222/14 , G03H2226/11 , G03H2240/62 , H04N5/332 , H04N9/045
Abstract: The present disclosure relates to apparatuses and methods for performing in-line lens-free digital holography of objects. At least one embodiment relates to an apparatus for performing in-line lens-free digital holography of an object. The apparatus includes a point light source adapted for emitting coherent light. The apparatus also includes an image sensing device adapted and arranged for recording interference patterns resulting from interference from light waves directly originating from the point light source and object light waves. The object light waves originate from light waves from the point light source that are scattered or reflected by the object. The image sensing device comprises a plurality of pixels. The point light source comprises a broad wavelength spectrum light source and a pinhole structure. The image sensing device comprises a respective narrow band wavelength filter positioned above each pixel that filters within a broad wavelength spectrum of the point light source.
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