Abstract:
PROBLEM TO BE SOLVED: To provide a method for manufacturing a layer having a locally-adapted or predetermined layer thickness characteristics. SOLUTION: (a) At least one layer (7) is formed on a substrate. (b) A removing shape for the formed layer is determined. (c) Irradiation of the upside of the layer, with at least one ion beam (9), is performed at least once so that the layer (7) is locally etched at the place of the ion beam according to the removal characteristics. As a result, the layer having the locally-adapted or predetermined layer thickness characteristic can be formed. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
The sequence of layers has a lower electrode (U), an upper electrode (O) and a piezoelectric or pyroelectric layer (S) which is located between them. An auxiliary layer (H) is located between the lower electrode (U) and said layer (S), said auxiliary layer ensuring that the orientation of the layer (S) is homogenous as it grows during the production process. The auxiliary layer (H) preferably consists essentially of amorphous silicon, amorphous silicon oxide or amorphous silicon nitride.
Abstract:
The invention relates to a method for producing a layer with a locally adapted or predefined layer thickness profile. Said method comprises the following steps: a) at least one layer (7) is applied to a substrate, b) a removal profile is determined for the applied layer and c) at least one ion beam (9) is guided over the layer at least once, in such a way that the layer (7) is etched locally at the site of the ion beam, in accordance with the removal profile, thus creating a layer with a locally adapted or predefined layer thickness profile.
Abstract:
At least one bottom electrode (U), a piezoelectric or pyroelectric layer (S) over said bottom electrode and a top electrode (O) over said layer are produced as parts of the layer sequence. The bottom electrode (U) is produced by depositing a conductive material and then chemically-mechanically polished in order to smooth out surface roughness. The thickness of the deposited conductive material is preferably reduced by 10 nm to 100 nm by the chemical-mechanical polishing process.
Abstract:
In a method for manufacturing a piezoelectric oscillating circuit in thin film technology, wherein the oscillating circuit includes a predetermined natural frequency and a plurality of layers, first of all at least a first layer of the piezoelectric oscillating circuit is generated. Subsequently, by processing the first layer a frequency correction is performed. Subsequently, at least a second layer of the piezoelectric oscillating circuit is generated and processed for performing a second frequency correction.
Abstract:
The resonator comprises a first electrode (E1), a second electrode (E2) and a piezoelectric layer (P) arranged between the above. A first acoustic compression layer (V1) is arranged between the piezoelectric layer (E1) and the first electrode (E1) with a higher acoustic impedance than the first electrode (E1).
Abstract:
An acoustic mirror is described which is formed of at least one first insulating layer, a first metal layer disposed thereon, a second insulating layer disposed thereon and a second metal layer disposed thereon. An auxiliary layer is produced on the first insulating layer whereby a recess extending as far as the first insulating layer is created therein. The first metal layer is substantially deposited and removed by chemical/mechanical polishing until the parts of the first metal layer disposed outside the recess are no longer present. The second metal layer is also produced in a recess with the aid of chemical/mechanical polishing. More than two insulating layers and two metal layers can be provided. The first metal layer and the second metal layer can be produced in the same recess.
Abstract:
In a method for manufacturing a piezoelectric oscillating circuit in thin film technology, wherein the oscillating circuit includes a predetermined natural frequency and a plurality of layers, first of all at least a first layer of the piezoelectric oscillating circuit is generated. Subsequently, by processing the first layer a frequency correction is performed. Subsequently, at least a second layer of the piezoelectric oscillating circuit is generated and processed for performing a second frequency correction.
Abstract:
Procedimiento para la producción de un componente de semiconductores con una secuencia de capas para la conversión de señales acústicas o térmicas y de modificaciones de la tensión eléctrica las unas en las otras, en el que como partes de la secuencia de capas se genera al menos un electrodo inferior (U), encima una capa (S) que es piezoeléctrica o piroeléctrica, y encima un electrodo superior (O), caracterizado porque el electrodo inferior (U) es generado depositando un material conductor y puliéndolo a continuación con medios químico - mecánicos para el alisamiento de rugosidades de la superficie.
Abstract:
In a method of producing an electrode for a resonator in thin-film technology, the electrode of the resonator is embedded in an insulating layer such that a surface of the electrode is exposed, and that a surface defined by the electrode and the insulating layer is substantially planar.