Abstract:
PROBLEM TO BE SOLVED: To provide a method for manufacturing a layer having a locally-adapted or predetermined layer thickness characteristics. SOLUTION: (a) At least one layer (7) is formed on a substrate. (b) A removing shape for the formed layer is determined. (c) Irradiation of the upside of the layer, with at least one ion beam (9), is performed at least once so that the layer (7) is locally etched at the place of the ion beam according to the removal characteristics. As a result, the layer having the locally-adapted or predetermined layer thickness characteristic can be formed. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
The invention relates to a method for producing a layer with a locally adapted or predefined layer thickness profile. Said method comprises the following steps: a) at least one layer (7) is applied to a substrate, b) a removal profile is determined for the applied layer and c) at least one ion beam (9) is guided over the layer at least once, in such a way that the layer (7) is etched locally at the site of the ion beam, in accordance with the removal profile, thus creating a layer with a locally adapted or predefined layer thickness profile.
Abstract:
A filter circuit comprising an unsymmetrical gate (202) and a substrate (S). A series circuit consisting of a filter stage (206) and a balancing member (208) is arranged between the symmetrical gate (204) the unsymmetrical gate (202). The balancing member (208) and the filter stage (206) are formed on the substrate (S).
Abstract:
The invention relates to a method for producing a housing, whereby a base comprising first contacts is provided with a layer which can be photolithographically structured in such a way as to uncover the contacts. A chip which has a micromechanical structure located between second contacts on said chip is provided with a layer which can be photolithographically structured in such a way as to create a recess in the region of the micromechanical structure and in the region of the second contacts. Once the base and the chip have been joined, the base is etched off.
Abstract:
Ein Verfahren zur Verarbeitung einer Mehrzahl von gehäusten elektronischen Chips, die in einem gemeinsamen Substrat miteinander verbunden sind, wird vorgesehen, wobei das Verfahren umfasst: Ätzen der elektronischen Chips, Detektieren von Informationen, welche eine wenigstens teilweise Entfernung einer Indikatorstruktur nach einer Freilegung der Indikatorstruktur anzeigen, die innerhalb wenigstens eines Teils der elektronischen Chips eingebettet ist und freigelegt wird, nachdem das Ätzen Chipmaterial über der Indikatorstruktur entfernt hat, und Einstellen der Verarbeitung beim Detektieren der Informationen, welche die wenigstens teilweise Entfernung der Indikatorstruktur anzeigen.
Abstract:
In a method for manufacturing a piezoelectric oscillating circuit in thin film technology, wherein the oscillating circuit includes a predetermined natural frequency and a plurality of layers, first of all at least a first layer of the piezoelectric oscillating circuit is generated. Subsequently, by processing the first layer a frequency correction is performed. Subsequently, at least a second layer of the piezoelectric oscillating circuit is generated and processed for performing a second frequency correction.
Abstract:
A temperature control apparatus for single wafer etching tools comprising a cathode electrode, an isolation layer, and chuck means, respectfully, which are vertically stacked to support a wafer to be etched. A layer of thermoelectric elements is disposed between the isolation layer and the chuck means. The layer of thermoelectric elements comprises a center area closed loop of connected Peltier elements and an outer area closed loop of connected Peltier elements. The center area closed loop is coupled to a power source and is arranged to correspond to the center area of the wafer. The outer area closed loop is coupled to a power source and is arranged to correspond to the outer area of the wafer. Accordingly, the temperatures associated with each of the specific areas of the wafer are individually controlled by one of the closed loops.
Abstract:
The method involves connecting the chip(s) (10) of the device to a bearer (20), so that an active element(s) (12) of the device on the chip is opposite the bearer with an intermediate space between them, and applying a protective cover (28) to the housing of the chip with the active element between the cover and the bearer, whereby the intermediate space is retained. AN Independent claim is also included for the following: a housing with a surface acoustic wave or SAW or a bulk acoustic wave or BAW device within it.
Abstract:
Gemäß einem Ausführungsbeispiel der vorliegenden Erfindung umfasst ein Spin-Bauelement eine Zwischenhalbleiterregion, die zwischen einem ersten Anschluss und einem zweiten Anschluss angeordnet ist, wobei der erste Anschluss angepasst ist, um einen Strom mit einem ersten Grad einer Spin-Polarisation an die Zwischenhalbleiterregion zu liefern, und wobei der zweite Anschluss angepasst ist, um den Strom mit einem zweiten Grad einer Spin-Polarisation auszugeben. Das Spin-Bauelement umfasst ferner eine spinselektive Streustruktur, die an die Zwischenhalbleiterregion angrenzt, wobei die spinselektive Streustruktur derart angepasst ist, dass der erste Grad einer Spin-Polarisation zu dem zweiten Grad verändert wird, wobei die spinselektive Streustruktur eine Steuerelektrode aufweist, die elektrisch von der Zwischenhalbleiterregion isoliert ist, und wobei die Steuerelektrode angepasst ist, um ein elektrisches Feld, das senkrecht zu einer Richtung des Stroms durch die Zwischenhalbleiterregion ist, anzulegen, um einen Betrag des Stroms zu steuern.