公开(公告)号：DE50112519D1

公开(公告)日：2007-07-05

申请号：DE50112519

申请日：2001-02-05

Applicant: INFINEON TECHNOLOGIES AG

Inventor： FLECK ROD ,  IENNE PAOLO ,  OBERLAENDER KLAUS ,  RANDHAWA SABEEN ,  GAZIELLO LAURENT ,  MARTELLONI YANNICK ,  PAUL STEFFEN ,  SCHOEBER VOLKER

IPC: G01R31/28 ,  G11C29/00 ,  G11C29/04 ,  G11C29/24

Abstract: The testable read-only memory for data memory redundant logic has read-only memory units for storage of determined fault addresses of faulty data memory units. The serviceability of each read-only memory unit can be checked by application of input test data and by comparison of read output test data with expected nominal output test data.