Abstract:
A method of programming a semiconductor memory includes forming a multiplicity of fuse links in at least two mutually parallel planes in a semiconductor body, and separating the fuse links from one another with an electrical insulator. It also includes irradiating a selected fuse link with at least two laser beams and melting the selected fuse link by crossing the laser beams at the selected fuse link.
Abstract:
The status is read out from or stored in the ferroelectrical transistor. During the reading out or storing of the status, at least one further ferroelectrical transistor in the memory matrix is controlled such as to be operated in the depletion region thereof.
Abstract:
The fuse device has a number of fuses (1), e.g. of polycrystalline silicon, applied to a semiconductor body, each programmed for providing or interrupting an electrical connection in response to a respective energy surge. The fuses are arranged on the semiconductor body in at least two planes (2,3), which are separated from one another via a silicon dioxide insulation layer.
Abstract:
The state is read out from the ferroelectric transistor or stored in the ferroelectric transistor. During the read-out or storage of the state, at least one further ferroelectric transistor in the memory matrix is driven in such a way that it is operated in its depletion region.
Abstract:
The state is read out from the ferroelectric transistor or stored in the ferroelectric transistor. During the read-out or storage of the state, at least one further ferroelectric transistor in the memory matrix is driven in such a way that it is operated in its depletion region.