Method for manufacturing non-volatile semiconductor memory cell having separate tunnel window
    1.
    发明专利
    Method for manufacturing non-volatile semiconductor memory cell having separate tunnel window 审中-公开
    制造具有分离式隧道窗的非挥发性半导体存储单元的方法

    公开(公告)号:JP2006319362A

    公开(公告)日:2006-11-24

    申请号:JP2006197022

    申请日:2006-07-19

    CPC classification number: H01L29/66825 H01L29/7883

    Abstract: PROBLEM TO BE SOLVED: To provide a method for manufacturing a non-volatile semiconductor memory cell (SZ) having a separate tunnel window cell (TF).
    SOLUTION: The method includes the step for forming the window cell (TF) having a tunnel zone (TG), a tunnel layer (4), a tunnel window memory layer (T5), a dielectric tunnel window layer (T6), and a tunnel window control electrode layer (T7), and the step for forming a transistor memory cell (TZ) having a channel zone (KG), a gate layer (3), a memory layer (5), a dielectric layer (6), and a control electrode layer (7). By the manufacturing method, the tunnel zone (TG) is formed in a late implantation step by tunnel implantation (I
    T ) using the window cell (TF) as a mask. The resulting memory cell has a small area requirement and a high number of program/clear cycles.
    COPYRIGHT: (C)2007,JPO&INPIT

    Abstract translation: 要解决的问题:提供一种制造具有单独的隧道窗口单元(TF)的非易失性半导体存储单元(SZ)的方法。 解决方案:该方法包括用于形成具有隧道区(TG),隧道层(4),隧道窗口存储层(T5),电介质隧道窗口层(T6)的窗口单元(TF) ,和隧道窗口控制电极层(T7),以及用于形成具有沟道区(KG)的晶体管存储单元(TZ),栅极层(3),存储层(5),电介质层 6)和控制电极层(7)。 通过制造方法,使用窗口单元(TF)作为掩模,通过隧道注入(I SB> T SB)在后期注入步骤中形成隧道区(TG)。 所得到的存储单元具有小的面积要求和大量的编程/清除周期。 版权所有(C)2007,JPO&INPIT

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