公开(公告)号：DE10330593A1

公开(公告)日：2005-02-10

申请号：DE10330593

申请日：2003-07-07

Applicant: INFINEON TECHNOLOGIES AG

Inventor： PROELL MANFRED ,  TASKIN NAZIF ,  RESCH GERALD ,  DOBLER MANFRED

IPC: G11C7/22 ,  G11C11/4076 ,  G11C29/14 ,  G11C29/00

Abstract: An integrated clock-pulse supply module has a clock-pulse input (1.1) for applying a first clock signal (clk1) and a clock signal output (1.2-1.5), a phase control loop (2) connected on the input-side to the clock signal input (1.1) and generating a second clock signal (clk2), a multiplexer (MUX) for selective switching the clock signals (clk1,clk2) to the clock signal output, and a unit for frequency monitoring connected on the input side to the clock signal input (1.1) and with under-achieving of a threshold frequency (fmin) the multiplexer is made to switch the first clock signal (clk1) on to the clock signal output (1.2-1.5). Independent claims are included for (a) application of the integrated clock-pulse supply and for (b) a memory module and for (c) a method of driving a memory module under test conditions.

公开(公告)号：DE10258199B4

公开(公告)日：2005-03-10

申请号：DE10258199

申请日：2002-12-12

Applicant: INFINEON TECHNOLOGIES AG

Inventor： STOCKEN CHRISTIAN ,  PROELL MANFRED ,  DOBLER MANFRED ,  RESCH GERALD

IPC: G11C29/02 ,  G11C29/00

Abstract: A circuit arrangement can have a number of integrated circuit components, which are arranged on a carrier substrate. A reception circuit for receiving a control signal can be coupled to one of the connection pads on the input side and can be connected to each of the circuit components on the output side. A bridging circuit controlled by a test mode signal can electrically bridge the reception circuit. In a testing method, a plurality of connection pads can be connected to a first potential and at least one of the connection pads can be connected to a second potential. The bridging circuit can be activated and the current measured, by a test arrangement, at the at least one of the connection pads. Inspection for leakage currents in connections between input-side reception circuits and the circuit components can be measured.

公开(公告)号：DE10258199A1

公开(公告)日：2004-07-15

申请号：DE10258199

申请日：2002-12-12

Applicant: INFINEON TECHNOLOGIES AG

Inventor： STOCKEN CHRISTIAN ,  PROELL MANFRED ,  DOBLER MANFRED ,  RESCH GERALD

IPC: G11C29/02 ,  G11C29/00

Abstract: A circuit arrangement can have a number of integrated circuit components, which are arranged on a carrier substrate. A reception circuit for receiving a control signal can be coupled to one of the connection pads on the input side and can be connected to each of the circuit components on the output side. A bridging circuit controlled by a test mode signal can electrically bridge the reception circuit. In a testing method, a plurality of connection pads can be connected to a first potential and at least one of the connection pads can be connected to a second potential. The bridging circuit can be activated and the current measured, by a test arrangement, at the at least one of the connection pads. Inspection for leakage currents in connections between input-side reception circuits and the circuit components can be measured.