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公开(公告)号：DE10330593A1
公开(公告)日：2005-02-10
申请号：DE10330593
申请日：2003-07-07
Applicant: INFINEON TECHNOLOGIES AG
Inventor： PROELL MANFRED , TASKIN NAZIF , RESCH GERALD , DOBLER MANFRED
IPC: G11C7/22 , G11C11/4076 , G11C29/14 , G11C29/00
Abstract: An integrated clock-pulse supply module has a clock-pulse input (1.1) for applying a first clock signal (clk1) and a clock signal output (1.2-1.5), a phase control loop (2) connected on the input-side to the clock signal input (1.1) and generating a second clock signal (clk2), a multiplexer (MUX) for selective switching the clock signals (clk1,clk2) to the clock signal output, and a unit for frequency monitoring connected on the input side to the clock signal input (1.1) and with under-achieving of a threshold frequency (fmin) the multiplexer is made to switch the first clock signal (clk1) on to the clock signal output (1.2-1.5). Independent claims are included for (a) application of the integrated clock-pulse supply and for (b) a memory module and for (c) a method of driving a memory module under test conditions.
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公开(公告)号：DE10301480A1
公开(公告)日：2004-08-05
申请号：DE10301480
申请日：2003-01-16
Applicant: INFINEON TECHNOLOGIES AG
Inventor： STOCKEN CHRISTIAN , DOBLER MANFRED , EGGERS GEORG
IPC: H01L23/495 , H05K3/34 , H01L23/50 , H01L21/60 , H01L21/50
Abstract: The method involves one or more stamping process steps in which at least one pin is stamped out of a base body, especially a lead frame. The pin or a section of the pin is coated with a separate metal coating only after final stamping out of the pin. The end face of the outer end section of the pin is also coated with the metal coating. Independent claims are also included for the following: (a) a housing, especially for semiconducting components (b) and a semiconducting component pin.
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公开(公告)号：DE10259300A1
公开(公告)日：2004-07-15
申请号：DE10259300
申请日：2002-12-18
Applicant: INFINEON TECHNOLOGIES AG
Inventor： STOCKEN CHRISTIAN , DOBLER MANFRED
Abstract: Semiconductor component testing method, especially for testing stacked chip modules, has the following steps: writing of a first value to a memory cell of a first semiconductor component; writing of a different value to a memory cell of a second semiconductor component and simultaneous application of a first valve corresponding to the first signal to a pin of the first component and a second value corresponding to the second signal to a pin of the second component. The invention also relates to a corresponding semiconductor test unit and test system.
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公开(公告)号：DE10223726A1
公开(公告)日：2003-12-24
申请号：DE10223726
申请日：2002-05-28
Applicant: INFINEON TECHNOLOGIES AG
Inventor： DOBLER MANFRED , SCHROEDER STEPHAN
IPC: G11C7/10
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公开(公告)号：DE10220138A1
公开(公告)日：2003-11-27
申请号：DE10220138
申请日：2002-05-06
Applicant: INFINEON TECHNOLOGIES AG
Inventor： DOBLER MANFRED , STOCKEN CHRISTIAN , HUBER THOMAS
Abstract: A memory device has a carrier substrate (6) with a terminal for supplying a system clock signal (CLK), a number of clock-controlled integrated memory elements (11-18), a sync. device (7) coupled on the input-side with the system clock signal terminal, and a phase-shifter circuit (2-4) as an element of the sync. device (7) by which a phase-shift between the input-side supplied system clock signal (CLK) and the output-side prepared sync. clock signal (Q) is adjusted depending on a control signal (S,S1,S2), the latter being adjusted via an externally programmable memory device (8), coupled with the phase-shifter device. An Independent claim is given for a method of calibrating a memory arrangement.
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Patent Agency Ranking
公开(公告)号：DE10061243A1
公开(公告)日：2002-06-27
申请号：DE10061243
申请日：2000-12-08
Applicant: INFINEON TECHNOLOGIES AG
Inventor： ROHLEDER MARKUS , DOBLER MANFRED
Abstract: The data propagatiom time determination method has a signal sequence supplied to the semiconductor memory, for transfer of test data written into at least one memory cell to an output buffer via the databus, with subsequent transfer of the data in the output buffer to the memory output and comparison of the output data with the original test data. The process is repeated with the interval between transfer of the test data to the buffer and transfer to the memory output extended until no fault is indicated between the compared data. An Independent claim for a device for determining the propagation time of data along a databus in a semiconductor memory is also included.
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公开(公告)号：DE10259300B4
公开(公告)日：2004-10-07
申请号：DE10259300
申请日：2002-12-18
Applicant: INFINEON TECHNOLOGIES AG
Inventor： STOCKEN CHRISTIAN , DOBLER MANFRED
Abstract: Semiconductor component testing method, especially for testing stacked chip modules, has the following steps: writing of a first value to a memory cell of a first semiconductor component; writing of a different value to a memory cell of a second semiconductor component and simultaneous application of a first valve corresponding to the first signal to a pin of the first component and a second value corresponding to the second signal to a pin of the second component. The invention also relates to a corresponding semiconductor test unit and test system.
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公开(公告)号：DE10130785C2
公开(公告)日：2003-04-30
申请号：DE10130785
申请日：2001-06-26
Applicant: INFINEON TECHNOLOGIES AG
Inventor： DOBLER MANFRED , FINTEIS THOMAS
Abstract: The present invention provides a memory chip ( 100 ) which can be operated in a normal mode and in a test mode (TM) and which has a device ( 102 ) for outputting data from the memory chip ( 100 ) and a device ( 104 ) for enabling the device ( 102 ) for outputting data when the test mode (TM) has been activated. The device ( 104 ) for enabling the device ( 102 ) for outputting data has a device for masking data so that only particular portions of the data are output when a data masking state (DQM) has been activated.
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公开(公告)号：DE10125798A1
公开(公告)日：2002-12-12
申请号：DE10125798
申请日：2001-05-26
Applicant: INFINEON TECHNOLOGIES AG
Inventor： MARX THILO , DIETRICH STEFAN , MAYER PETER , DOBLER MANFRED
Abstract: The imaging system provides assistance during the positioning of a measuring tip as it is placed onto a contact region of a microchip, in order to measure an on-chip signal. The contact region is imaged in a magnified fashion. An insertion device is provided that is suitable for providing a display of the on-chip signal in the imaging plane.
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公开(公告)号：DE10057275C1
公开(公告)日：2002-06-06
申请号：DE10057275
申请日：2000-11-18
Applicant: INFINEON TECHNOLOGIES AG
Inventor： DOBLER MANFRED , ROHLEDER MARKUS
IPC: G11C11/406
Abstract: The refreshing device (1) has a control device (12) supplying a periodic sequence of control signals for initiating information refreshing of the memory cells, which is variable in dependence on the storage time of the information held in each memory cell. A test circuit (13) coupled to the control device provides the maximum storage time of the individual memory cells, for controlling the refresh control signal periodic sequence. An Independent claim for a method for controlling information refreshing for the memory cells of a dynamic random-access memory is also included.
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