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公开(公告)号：JP2000339988A
公开(公告)日：2000-12-08
申请号：JP2000138714
申请日：2000-05-11
Applicant: INFINEON TECHNOLOGIES AG
Inventor： KAISER ROBERT , SCHAMBERGER FLORIAN
Abstract: PROBLEM TO BE SOLVED: To obtain a circuit device that can read stored information while leaving the stored information as it is, furthermore, examines based on the information whether information that should have been originally assigned to a volatile storage element can be restored from the state of an assigned programmable element or not, and inspects the state of a storage. SOLUTION: The circuit device is equipped with one programmable element 2 and a storage 10 with a volatile storage element 1. In order to store the state of the programmable element, the programmable element 2 is connected to the volatile storage element 1 for each storage 10. Each storage 10 has at least one of output sides Q1 and Q2 for inspecting each state of the programmable element 2 and the volatile storage element 1. In the storage 10, at the time when the state of the programmable element 2 and the volatile storage element 1 is outputted via a selection circuit, an address can be individually specified. Information stored into the volatile storage element remains as it is saved.
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公开(公告)号：JP2003036698A
公开(公告)日：2003-02-07
申请号：JP2002118452
申请日：2002-04-19
Applicant: Infineon Technologies Ag , インフィネオン テクノロジーズ アクチエンゲゼルシャフト
Inventor： KAISER ROBERT , SCHAMBERGER FLORIAN
CPC classification number: G11C29/40
Abstract: PROBLEM TO BE SOLVED: To realize a method for a self-test of constitution elements of a semiconductor memory.
SOLUTION: This invention relates to a method for testing constitution elements of a semiconductor memory. Data is accumulated in a bank having matrix structure, and the matrix structure is provided with rows and columns to which addresses can be specified. In this method, an error address is transmitted for an external test layer in a compressed form from an error position in a bank. Rows or columns are divided into regions, error caused in each region are counted for each row or column, the number of errors in each region are compared with a threshold value for each row or column, and the comparison result is transmitted to a test device with an error address as additional information for each row or column.
COPYRIGHT: (C)2003,JPOAbstract translation: 要解决的问题：实现半导体存储器的构成元件的自检的方法。 解决方案：本发明涉及一种用于测试半导体存储器的构成元件的方法。 数据被存储在具有矩阵结构的存储体中，并且矩阵结构被提供有可以指定地址的行和列。 在该方法中，从银行的错误位置以压缩形式发送用于外部测试层的错误地址。 将行或列划分为区域，对每个行或列计数每个区域中引起的错误，将每个区域中的错误数与每行或列的阈值进行比较，并将比较结果发送到测试设备 将错误地址作为每行或列的附加信息。
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公开(公告)号：JP2000339989A
公开(公告)日：2000-12-08
申请号：JP2000140404
申请日：2000-05-12
Applicant: INFINEON TECHNOLOGIES AG
Inventor： KAISER ROBERT , SCHAMBERGER FLORIAN , SCHNEIDER HELMUT
Abstract: PROBLEM TO BE SOLVED: To allow a programmable element to be programmed with a high voltage and allow an area of a circuit element of a readout circuit to be saved by connecting a second terminal of the programmable element, to which a first terminal of a protective circuit is connected, to an input side of the readout circuit and by limiting a voltage at the second terminal. SOLUTION: A terminal al of a protective circuit 1 is connected to a terminal AF of a programmable element F, while a terminal a2 is connected to a terminal EA on an input side of a readout circuit A. During a programming process of the programming element F, an electrical potential V1 has a positive burn- voltage value. When a switchable element is switched so as to be conducting, the programmable element F is transferred into a low ohm condition and an electrical potential at a node K increases to the burn-voltage value. At this time, an electrical potential at a node N does not increase to exceed a sum of an electrical potential V3 corresponding to a normal positive operating voltage and a forward voltage of a diode D.
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公开(公告)号：JP2001257568A
公开(公告)日：2001-09-21
申请号：JP2001031274
申请日：2001-02-07
Applicant: INFINEON TECHNOLOGIES AG
Inventor： KAISER ROBERT , KRASSER HANS-JURGEN , SCHAMBERGER FLORIAN , SCHNEIDER HELMUT
IPC: G01R31/28 , G01R31/3183 , G01R31/3185 , H03K5/13 , H03K5/131 , H03K5/133
Abstract: PROBLEM TO BE SOLVED: To provide a simply structured device capable of forming a signal pulse having a prescribed pulse length by a module itself by improving the device. SOLUTION: A variable delay element consists of the serial circuit of an inverter, and a signal section free from delay for writing to each register and a signal section free from delay for reading from the register are arranged in parallel in this inverter.
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公开(公告)号：JP2000353749A
公开(公告)日：2000-12-19
申请号：JP2000133724
申请日：2000-05-02
Applicant: INFINEON TECHNOLOGIES AG
Inventor： SCHAMBERGER FLORIAN , SCHNEIDER HELMUT
IPC: H01L21/82 , G11C16/02 , G11C17/16 , H03K19/173
Abstract: PROBLEM TO BE SOLVED: To obtain a circuit device, which can supervise patterning process of an element capable of being electrically programmed in a programming process and is used for programming the electrically programmable element. SOLUTION: Resistance of a conductor path of an element, capable of being programmed in a circuit device has an element T1, which can be continuously changed by a current or a voltage and can be switched for programming the programmable element. Both of the elements are series-connected and are connected with a first feeder potential or a second feeder potential. A supervisory circuit 1 is series-connected with a series circuit, connecting the programmable element with the element T1 which is capable of being switched between a terminal for the first feeder potential and a terminal for the second feeder potential for making the measurement of the amount of electrical characteristics to characterize a programming process. Hereby, the operating process of an electrically programmable element can be supervised in the programming process.
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Patent Agency Ranking
公开(公告)号：WO0250841A3
公开(公告)日：2003-03-13
申请号：PCT/DE0104540
申请日：2001-12-04
Applicant: INFINEON TECHNOLOGIES AG , KAISER ROBERT , SCHAMBERGER FLORIAN
Inventor： KAISER ROBERT , SCHAMBERGER FLORIAN
Abstract: The invention relates to a circuit arrangement for controlling a programmable connection (1), comprising a volatile memory cell (5), which is coupled to the fuse (1) for permanently memorising the data that is stored in the volatile memory (5) and a shift register (3), which permits data to be read from the volatile memory cell (5) and data to be written to the memory cell (5). To control several fuses (1), several shift registers (3) can be interconnected to form a shift register chain. Said shift register chain (3) enables the rapid reading from and writing to the volatile memory (4), using a circuit of low complexity.
Abstract translation: 本发明涉及一种电路装置，用于驱动一个可编程链路（1），包括连接到（1），其耦合在所述易失性存储器（5）存储的数据永久地存储所述熔丝的非易失性存储单元（5），以及一个移位寄存器（3 ），这使得能够从所述易失性存储单元（5）和写入数据的数据的读出到存储单元（5）。 在这种情况下，用于控制多个熔断器（1）的可以被连接以形成一个移位寄存器链多个移位寄存器（3）。 这个移位寄存器链（3）因此允许低电路复杂性快速写和从非易失性存储器（4）读出到/。
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公开(公告)号：WO0250839A2
公开(公告)日：2002-06-27
申请号：PCT/DE0104787
申请日：2001-12-18
Applicant: INFINEON TECHNOLOGIES AG , KAISER ROBERT , SCHAMBERGER FLORIAN
Inventor： KAISER ROBERT , SCHAMBERGER FLORIAN
Abstract: A circuit arrangement for triggering a programmable connection (1), for example a fuse, is disclosed, comprising a trigger circuit (2) for triggering the fuse (1), dependent upon a signal applied to the data input (11), and a volatile memory (4), the output of which is preferably directly connected to the data input (11) of the trigger circuit. A trigger circuit for the particularly rapid and simple programming of fuses, in particular electrical programmable fuses is thus disclosed.
Abstract translation: 用于驱动的可编程链路的电路装置（1），例如，熔丝，-任选地与控制电路（2），用于触发所述熔断器（1）响应于数据输入端（11）信号施加到以及一个 其输出（23）易失性存储器（4）优选地直接与驱动电路的数据输入（11）连接。 以这种方式，熔断器的一个特别快速和容易编程的电路装置，电可编程熔丝特别指示。
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公开(公告)号：WO0250838A2
公开(公告)日：2002-06-27
申请号：PCT/DE0104786
申请日：2001-12-18
Applicant: INFINEON TECHNOLOGIES AG , KAISER ROBERT , SCHAMBERGER FLORIAN
Inventor： KAISER ROBERT , SCHAMBERGER FLORIAN
Abstract: The invention relates to a circuit arrangement for controlling a programmable connection (1), which comprises a trigger circuit (2) for selecting and burning the fuse (1), and which comprises a shift register (3), with which an activating signal (B, B') can be supplied to the trigger circuit (2). In a preferred embodiment, a volatile memory location (5) can be provided in order to provide the data that initiates the burning. The circuit arrangement enables a burning of fuses (1) and thus permits the repair of defective memory locations in bulk storage devices even after a chip having the bulk storage device has been embedded. In addition, the aforementioned shift register (3) effectively prevents the occurrence of impermissibly high currents due to the simultaneous burning of too many fuses (1).
Abstract translation: 提供了一种用于驱动一可编程链路提供了一种电路装置（1），其包含（2）的驱动电路，用于选择和烧制熔丝（1）和一个移位寄存器（3）与该驱动电路（2）（活化乙 ，B“）可以被供给。 以提供可以提供一种非易失性存储单元（5）的优选实施例要烧制的数据。 本电路允许熔丝的燃烧（1），因此修复故障存储单元中的大容量存储甚至一个芯片，它具有大容量存储的铸造后。 另外，由过多的熔丝的同时烧成（1）有效地与所描述的移位寄存器（3）防止，可发生不可接受的高电流。
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公开(公告)号：DE102005020055A1
公开(公告)日：2006-11-09
申请号：DE102005020055
申请日：2005-04-29
Applicant: INFINEON TECHNOLOGIES AG
Inventor： SCHAMBERGER FLORIAN , SCHNIEDER RALF
Abstract: The module has a data bit buffer (2A-0) for buffering a data bit to be stored, where the data bit is copied into a data bit buffer (2B-0). An electrically programmable fuse component is burned according to the buffered data bit and is overwritten onto one of the two data bit buffers depending on a logical condition of the burned fuse component. A comparison logic (2D-0) compares the data bit buffered in the overwritten data bit buffer with the data bit buffered in the other data bit buffer for verifying, whether the burning of the fuse component takes place in an error-free manner. An independent claim is also included for a method for durable and secure storage of a data bit in an electrically programmable fuse component.
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公开(公告)号：DE102004062885A1
公开(公告)日：2006-07-06
申请号：DE102004062885
申请日：2004-12-27
Applicant: INFINEON TECHNOLOGIES AG
Inventor： SCHAMBERGER FLORIAN , SOMMER MICHAEL BERNHARD , BAENISCH ANDREAS
Abstract: Fastener (1) has a carrier element (2) and multitude of fastening elements (3). The fastening elements are arranged on the carrier element and comprises in each case an oblong body, which protrudes from carrier element and possesses a suitable form between further fastening elements for engaging and/or hooking. Fastening elements and carrier element are electrically conductive on their surface. Independent claims are also included for the following: (A) Electronic component; (B) Arrangement with an electronic conductor board and a semiconductor unit; and (C) Procedure for fastening semiconductor unit on an electronic conductor board.
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