Abstract:
PROBLEM TO BE SOLVED: To reduce a percentage of time used to move a wafer stage during an alignment. SOLUTION: The method to control the sequence of measurement steps for aligning a semiconductor wafer includes steps of: (a) preparing a semiconductor wafer in exposure equipment; (b) starting a first alignment measurement step; (c) selecting the first number of exposure fields to determine the first sequence; (d) moving the semiconductor wafer to an alignment position; (e) storing the alignment position of the exposure field last moved; (f) terminating the first alignment measurement step, starting a second alignment measurement step, selecting the exposure field whose position was stored, further selecting an exposure field to determine a second sequence, and repeating the steps (d) to (f) for the alignment measurement step. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
The invention relates to novel memory cells, comprising two electrodes and a layer arranged between the same, made from an active material, comprising (a) a compound of the structure given in general formula (I), where R 1 to R 2 independently = -H, -(CH 2 ) m CH 3 , -phenyl, -O-(CH 2 ) m CH 3 , -O-phenyl, -S(CH 2 ) m CH 3 , -S-aryl, -NR 3 R 4 , -SR or a halide, where R 1 and R 2 can together form a ring and where R 3 and R 4 independently = -H, preferably 1-10 C alkyl, -aryl, -heteroaryl, m = 0 or a whole number from 1-10 and n = a whole number from 2 to 1000 and (b) a compound of general formula (II): where R 5 to R 12 independently = -H, -(CH 2 ) m CH 3 , -phenyl, -0-(CH 2 ) m CH 3 , -O-phenyl, -CO(CH 2 ) m CH 3 , -halogen, -CN and/or -NO 2 , where R 5 and R 6 , or R 6 and R 7 , R 7 and R 8 , R 9 and R 10 , R 10 and R 11 and/or R 11 and R 12 can together form a ring, m having the meaning already given. The invention further relates to a method for production of said cells and the novel application of a composition which may be used as active material for the memory cells.
Abstract:
The invention relates to a method for lithographically structuring a substrate (10) by means of an electron beam, particularly for producing photomasks. Said method is characterized by the fact that first at least one electrically conductive, water-insoluble lower lacquer layer (1) is applied to the substrate (10), followed by at least one upper lacquer layer (2) made of electron beam-sensitive photoresist so as to create a lacquer system (1, 2). Such a lacquer system allows negative charges to discharge, whereby the electron beam is prevented from being deflected due to charging effects.
Abstract:
The invention relates to compositions for memory applications, a memory cell comprising said composition along with two electrodes, a method for producing microelectronic components, and the use of the inventive composition during the production of said microelectronic components.
Abstract:
The present invention relates to compositions for storage applications, relates to a memory cell which comprises the abovementioned composition and two electrodes and furthermore relates to a process for the production of microelectronic components and the use of the composition according to the invention in the production of these microelectronic components.
Abstract:
An integrated circuit having resistive memory is disclosed. In one embodiment, the memory includes novel memory cells which have two electrodes and a layer arranged in between and including an active material which contains [1,2]dithiolo[4,3-[c]-1,2-dithiol-3,6-dithione, (2,4,7-trinitro-9-fluorenylidene)malonodinitrile and a polymer are disclosed. In one embodiment, a process for the production of the cells according to the invention is provided, as well as the novel use of a composition which can be used as active material for the memory cells.