Method to control sequence of measurement steps for aligning a semiconductor wafer in exposure system
    1.
    发明专利
    Method to control sequence of measurement steps for aligning a semiconductor wafer in exposure system 审中-公开
    控制接触系统中半导体波形的测量步骤顺序的方法

    公开(公告)号:JP2005101534A

    公开(公告)日:2005-04-14

    申请号:JP2004197152

    申请日:2004-07-02

    CPC classification number: G03F9/7046

    Abstract: PROBLEM TO BE SOLVED: To reduce a percentage of time used to move a wafer stage during an alignment.
    SOLUTION: The method to control the sequence of measurement steps for aligning a semiconductor wafer includes steps of: (a) preparing a semiconductor wafer in exposure equipment; (b) starting a first alignment measurement step; (c) selecting the first number of exposure fields to determine the first sequence; (d) moving the semiconductor wafer to an alignment position; (e) storing the alignment position of the exposure field last moved; (f) terminating the first alignment measurement step, starting a second alignment measurement step, selecting the exposure field whose position was stored, further selecting an exposure field to determine a second sequence, and repeating the steps (d) to (f) for the alignment measurement step.
    COPYRIGHT: (C)2005,JPO&NCIPI

    Abstract translation: 要解决的问题:减少在对准期间移动晶片台的时间百分比。 解决方案:控制用于对准半导体晶片的测量步骤的顺序的方法包括以下步骤:(a)在曝光设备中制备半导体晶片; (b)开始第一对准测量步骤; (c)选择第一数目的曝光场以确定第一序列; (d)将半导体晶片移动到对准位置; (e)存储最后移动的曝光场的对准位置; (f)终止第一对准测量步骤,开始第二对准测量步骤,选择存储位置的曝光区域,进一步选择曝光区域以确定第二序列,并重复步骤(d)至(f) 对准测量步骤。 版权所有(C)2005,JPO&NCIPI

    RESISTIVE MEMORY
    2.
    发明申请
    RESISTIVE MEMORY 审中-公开
    电阻式工作记忆

    公开(公告)号:WO2006013160A3

    公开(公告)日:2006-10-05

    申请号:PCT/EP2005053546

    申请日:2005-07-21

    Abstract: The invention relates to novel memory cells, comprising two electrodes and a layer arranged between the same, made from an active material, comprising (a) a compound of the structure given in general formula (I), where R 1 to R 2 independently = -H, -(CH 2 ) m CH 3 , -phenyl, -O-(CH 2 ) m CH 3 , -O-phenyl, -S(CH 2 ) m CH 3 , -S-aryl, -NR 3 R 4 , -SR or a halide, where R 1 and R 2 can together form a ring and where R 3 and R 4 independently = -H, preferably 1-10 C alkyl, -aryl, -heteroaryl, m = 0 or a whole number from 1-10 and n = a whole number from 2 to 1000 and (b) a compound of general formula (II): where R 5 to R 12 independently = -H, -(CH 2 ) m CH 3 , -phenyl, -0-(CH 2 ) m CH 3 , -O-phenyl, -CO(CH 2 ) m CH 3 , -halogen, -CN and/or -NO 2 , where R 5 and R 6 , or R 6 and R 7 , R 7 and R 8 , R 9 and R 10 , R 10 and R 11 and/or R 11 and R 12 can together form a ring, m having the meaning already given. The invention further relates to a method for production of said cells and the novel application of a composition which may be used as active material for the memory cells.

    Abstract translation: 有提供具有两个电极新存储单元和活性物质的包含(a)通式(I)的化合物所示结构的插层:(I)其中R 1 至R 2 彼此独立地可以具有下列含义:-H, - (CH 2 CH 3 , - 苯基,-O-(CH 2 CH 3 ,-O-苯基,-S(CH 2 CH 3 ,-S-芳基,-NR 3 - [R 4 ,-SR或 卤素原子,其中R 1 和R 2 可一起形成环,和其中R 3 和R 4 独立地 -H,烷基,优选表示具有1-10个碳原子,芳基,杂芳基,m为0或在1-10范围内的整数,n = a是整数2至1000 ; 和(b)通式(II)化合物:其中R 5 至R 12 彼此独立地可以具有下列含义:-H, - (CH 2 CH 3 ,苯基,-O-(CH 2 CH < SUB> 3 ,-O-苯基, - CO(CH 2 CH 3 , - 卤素,-CN,和 /或-NO 2 其中R 5 和R 6 或R 6 和R 7 < / SUB>,R 7 和R 8 ,R 9 和R 10 ,R 10 < / SUB>和R 11 和/或R 11 和R 12 可以一起形成一个环,其中m具有上面给出的含义,其包括 , 此外,提供了用于制备本发明的细胞的方法和新的使用,其可被用作用于存储单元中的活性物质的组合物。

    METHOD FOR LITHOGRAPHICALLY STRUCTURING A SUBSTRATE, AND LACQUER SYSTEM
    3.
    发明申请
    METHOD FOR LITHOGRAPHICALLY STRUCTURING A SUBSTRATE, AND LACQUER SYSTEM 审中-公开
    一种基材和涂料系统的光刻结构的方法

    公开(公告)号:WO2004025369A3

    公开(公告)日:2004-07-15

    申请号:PCT/DE0302880

    申请日:2003-08-27

    CPC classification number: G03F1/26 G03F7/093 G03F7/094

    Abstract: The invention relates to a method for lithographically structuring a substrate (10) by means of an electron beam, particularly for producing photomasks. Said method is characterized by the fact that first at least one electrically conductive, water-insoluble lower lacquer layer (1) is applied to the substrate (10), followed by at least one upper lacquer layer (2) made of electron beam-sensitive photoresist so as to create a lacquer system (1, 2). Such a lacquer system allows negative charges to discharge, whereby the electron beam is prevented from being deflected due to charging effects.

    Abstract translation: 发明的名称:本发明通过电子束的手段涉及一种衬底(10)的光刻图案化的方法,特别是用于生产光掩模的,其特征在于,在所述基板上建立的涂布系统的(1,2)(10)第一至少一个电 导电的不溶于水的下层漆层(1),然后涂覆至少一层电子束敏感的光刻胶的上漆层(2)。 利用这种涂料系统,负电荷可以流走,从而避免了电子束的偏转。

    10.
    发明专利
    未知

    公开(公告)号:DE102004037150B4

    公开(公告)日:2006-08-24

    申请号:DE102004037150

    申请日:2004-07-30

    Abstract: An integrated circuit having resistive memory is disclosed. In one embodiment, the memory includes novel memory cells which have two electrodes and a layer arranged in between and including an active material which contains [1,2]dithiolo[4,3-[c]-1,2-dithiol-3,6-dithione, (2,4,7-trinitro-9-fluorenylidene)malonodinitrile and a polymer are disclosed. In one embodiment, a process for the production of the cells according to the invention is provided, as well as the novel use of a composition which can be used as active material for the memory cells.

Patent Agency Ranking