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公开(公告)号:DE69936175T2
公开(公告)日:2008-01-24
申请号:DE69936175
申请日:1999-10-25
Applicant: LUCENT TECHNOLOGIES INC
Inventor: ARCHER VANCE DOLVAN , BELK NATHAN , CARROLL MICHAEL SCOTT , COCHRAN WILLIAM THOMAS , DENNIS DONALD C , FREI MICHEL RANJIT , GREGOR RICHARD WILLIAM , LIN WEN , MOINIAN SHAHRIAR , NAGY WILLIAM JOHN , NG KWOK K , PINTO MARK RICHARD , RICH DAVID ARTHUR , XIE YA-HONG , GOLDTHORP DAVID CLAYTON
IPC: H01L21/02 , H01L21/822 , H01L21/77 , H01L23/522 , H01L23/64 , H01L27/04 , H01L27/08
Abstract: The present invention provides for a method of manufacturing a simplified high Q inductor substrate and a semiconductor device having that substrate. The method for manufacturing the simplified high Q inductor substrate preferably comprises forming a base substrate over a semiconductor wafer, wherein the base substrate has a given dopant concentration and then forming an epitaxial (EPI) layer over the base substrate. The EPI layer includes epitaxially forming a first doped region in the EPI layer over the base substrate and then epitaxially forming a second doped region in the EPI layer over the first doped region. The first doped region has a dopant concentration greater than the given dopant concentration of the base substrate, and the second doped region has a dopant concentration less than the first doped region.
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公开(公告)号:DE69936175D1
公开(公告)日:2007-07-12
申请号:DE69936175
申请日:1999-10-25
Applicant: LUCENT TECHNOLOGIES INC
Inventor: ARCHER VANCE DOLVAN , BELK NATHAN , CARROLL MICHAEL SCOTT , COCHRAN WILLIAM THOMAS , DENNIS DONALD C , FREI MICHEL RANJIT , GREGOR RICHARD WILLIAM , LIN WEN , MOINIAN SHAHRIAR , NAGY WILLIAM JOHN , NG KWOK K , PINTO MARK RICHARD , RICH DAVID ARTHUR , XIE YA-HONG , GOLDTHORP DAVID CLAYTON
IPC: H01L21/02 , H01L21/822 , H01L21/77 , H01L23/522 , H01L23/64 , H01L27/04 , H01L27/08
Abstract: The present invention provides for a method of manufacturing a simplified high Q inductor substrate and a semiconductor device having that substrate. The method for manufacturing the simplified high Q inductor substrate preferably comprises forming a base substrate over a semiconductor wafer, wherein the base substrate has a given dopant concentration and then forming an epitaxial (EPI) layer over the base substrate. The EPI layer includes epitaxially forming a first doped region in the EPI layer over the base substrate and then epitaxially forming a second doped region in the EPI layer over the first doped region. The first doped region has a dopant concentration greater than the given dopant concentration of the base substrate, and the second doped region has a dopant concentration less than the first doped region.
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