Process for fabricating tapered microstructured fiber system and resultant system
    2.
    发明公开
    Process for fabricating tapered microstructured fiber system and resultant system 有权
    Ff系统和结果系统Verfahren zum Herstellen vonverjüngtemmikrostrukturiertem Fasersystem und resultierendes System

    公开(公告)号:EP1199582A1

    公开(公告)日:2002-04-24

    申请号:EP01304127.2

    申请日:2001-05-08

    Abstract: The invention involves providing a microstructured fiber having a core region, a cladding region, and one or more axially oriented elements (e.g., capillary air holes) in the cladding region. A portion of the microstructured fiber is then treated, e.g., by heating and stretching the fiber, such that at least one feature of the fiber microstructure is modified along the propagation direction, e.g., the outer diameter of the fiber gets smaller, the axially oriented elements get smaller, or the axially oriented elements collapse. The treatment is selected to provide a resultant fiber length that exhibits particular properties, e.g., mode contraction leading to soliton generation, or mode expansion. Advantageously, the overall fiber length is designed to readily couple to a standard transmission fiber, i.e., the core sizes at the ends of the length are similar to a standard fiber, which allows efficient coupling of light into the microstructured fiber length.

    Abstract translation: 本发明涉及提供在包层区域中具有芯区域,包层区域和一个或多个轴向取向元件(例如,毛细管气孔)的微结构纤维。 然后,例如通过加热和拉伸纤维来处理部分微结构纤维,使得纤维微结构的至少一个特征沿着传播方向被改变,例如,纤维的外径变小,轴向定向 元件变小,或轴向取向的元件塌陷。 选择该处理以提供显示特定性质的所得纤维长度,例如导致孤立生成的模式收缩或模式扩张。 有利地,整个光纤长度被设计成容易地耦合到标准传输光纤,即,长度端部处的芯尺寸类似于标准光纤,其允许光有效地耦合到微结构化光纤长度。

    Method and apparatus for imaging semiconductor devices
    3.
    发明公开
    Method and apparatus for imaging semiconductor devices 失效
    用于半导体器件的曝光方法及装置

    公开(公告)号:EP0878841A3

    公开(公告)日:2000-02-23

    申请号:EP98303500.7

    申请日:1998-05-05

    CPC classification number: H01L22/12 G01R31/311

    Abstract: Semiconductor devices are imaged using two-photon absorption. The method is similar to conventional optical beam induced imaging except that the light beams used have frequencies (f 2 ) (photon energies hf 2 ) insufficient to excite electrons across the semiconductor bandgap (30). Rather the instantaneous intensity of the lower frequency light is increased, as by using a pulsed laser source, so that electron transitions occur by two-photon absorption (35,36) predominately in the localized region where the beam is focused. The result is minimal absorption during passage through the substrate and maximal absorption in the component-rich active layer where the beam is focused. This enhances imaging of fine-detail semiconductor devices. Specifically, the quadratic dependence of free carrier generation on the excitation intensity both enhances the resolution and provides a three-dimensional sectioning capability.

    Optical time-division-multiplex system
    4.
    发明公开
    Optical time-division-multiplex system 审中-公开
    光时分解复用装置

    公开(公告)号:EP0971500A3

    公开(公告)日:2005-12-07

    申请号:EP99304472.6

    申请日:1999-06-08

    CPC classification number: H04J14/08

    Abstract: In a time-division-multiplex system, a relatively high-rate optical signal stream comprising multiple interleaved signal sequences is applied to one end of an elongated waveguide that includes multiple photodetectors disposed along the longitudinal extent of the waveguide. Probe pulses at a relatively low rate are applied to the other end of the waveguide in a synchronized fashion to cause two-photon non-linear absorption in successive respective photodetectors as each propagating probe pulse overlaps successive different signals of each sequence. In that way, electrical output signals are provided from each photodetector at the relatively low probe-pulse rate.

    Method and apparatus for imaging semiconductor devices
    5.
    发明公开
    Method and apparatus for imaging semiconductor devices 失效
    Verfahren zur Abbildung Halbleiteranordnungen

    公开(公告)号:EP0878841A2

    公开(公告)日:1998-11-18

    申请号:EP98303500.7

    申请日:1998-05-05

    CPC classification number: H01L22/12 G01R31/311

    Abstract: Semiconductor devices are imaged using two-photon absorption. The method is similar to conventional optical beam induced imaging except that the light beams used have frequencies (f 2 ) (photon energies hf 2 ) insufficient to excite electrons across the semiconductor bandgap (30). Rather the instantaneous intensity of the lower frequency light is increased, as by using a pulsed laser source, so that electron transitions occur by two-photon absorption (35,36) predominately in the localized region where the beam is focused. The result is minimal absorption during passage through the substrate and maximal absorption in the component-rich active layer where the beam is focused. This enhances imaging of fine-detail semiconductor devices. Specifically, the quadratic dependence of free carrier generation on the excitation intensity both enhances the resolution and provides a three-dimensional sectioning capability.

    Abstract translation: 使用双光子吸收成像半导体器件。 除了使用的光束具有不足以激发穿过半导体带隙(30)的电子的频率(f2)(光子能量hf2)之外,该方法类似于常规的光束诱导成像。 相反,通过使用脉冲激光源,较低频率的光的瞬时强度增加,使得电子跃迁通过双光子吸收(35,36)主要在束聚焦的局部区域中发生。 结果是通过衬底的最小吸收和在束聚焦的富含部件的有源层中的最大吸收。 这增强了精细细节半导体器件的成像。 具体地说,自由载流子产生对激发强度的二次依赖性增强了分辨率并提供了三维切片能力。

    Optical time-division-multiplex system
    7.
    发明公开
    Optical time-division-multiplex system 审中-公开
    Optische Zeitmultiplexvorrichtung

    公开(公告)号:EP0971500A2

    公开(公告)日:2000-01-12

    申请号:EP99304472.6

    申请日:1999-06-08

    CPC classification number: H04J14/08

    Abstract: In a time-division-multiplex system, a relatively high-rate optical signal stream comprising multiple interleaved signal sequences is applied to one end of an elongated waveguide that includes multiple photodetectors disposed along the longitudinal extent of the waveguide. Probe pulses at a relatively low rate are applied to the other end of the waveguide in a synchronized fashion to cause two-photon non-linear absorption in successive respective photodetectors as each propagating probe pulse overlaps successive different signals of each sequence. In that way, electrical output signals are provided from each photodetector at the relatively low probe-pulse rate.

    Abstract translation: 在时分复用系统中,将包括多个交错信号序列的相对高速率的光信号流施加到细长波导的一端,该波长包括沿着波导的纵向延伸部布置的多个光电探测器。 以相对较低的速率的探针脉冲以同步方式施加到波导的另一端,以在连续的各个光电检测器中引起双光子非线性吸收,因为每个传播的探针脉冲与每个序列的连续的不同信号重叠。 以这种方式,以相对低的探针脉冲速率从每个光电检测器提供电输出信号。

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