Abstract:
Apparatus and method for modifying an object with electrons are provided, by which the object can be uniformly and efficiently modified with the electrons under a pressure substantially equal to atmospheric pressure even when having a relatively wide surface area to be treated. This method uses a cold-cathode electron emitter having the capability of emitting electrons from a planar electron emitting portion according to tunnel effect, and preferably comprising a pair of electrodes, and a strong field drift layer including nanocrystalline silicon disposed between the electrodes. The object is exposed to electrons emitted from the planar electron emitting portion by applying a voltage between the electrodes. It is preferred that an energy of the emitted electrons is selected from a range of 1 eV to 50 keV, and preferably 1 eV to 100 eV.
Abstract:
A field emission-type electron source has a plurality of electron source elements (10a) formed on the side of one surface (front surface) of an insulative substrate (11) composed of a glass substrate. Each of electron source elements (10a) includes a lower electrode (12), a buffer layer (14) composed of an amorphous silicon layer formed on the lower electrode (12), a polycrystalline silicon layer (3) formed on the buffer layer (14), a strong-field drift layer (6) formed on the polycrystalline silicon layer (3), and a surface electrode (7) formed on the strong-field drift layer (6). The field emission-type electron source can achieved reduced in-plain variation in electron emission characteristics.
Abstract:
A field emission-type electron source has a plurality of electron source elements ( 10 a) formed on the side of one surface (front surface) of an insulative substrate ( 11 ) composed of a glass substrate. Each of electron source elements ( 10 a) includes a lower electrode ( 12 ), a buffer layer ( 14 ) composed of an amorphous silicon layer formed on the lower electrode ( 12 ), a polycrystalline silicon layer ( 3 ) formed on the buffer layer ( 14 ), a strong-field drift layer ( 6 ) formed on the polycrystalline silicon layer ( 3 ), and a surface electrode ( 7 ) formed on the strong-field drift layer ( 6 ). The field emission-type electron source can achieved reduced in-plain variation in electron emission characteristics.
Abstract:
A field emission-type electron source has a plurality of electron source elements ( 10 a) formed on the side of one surface (front surface) of an insulative substrate ( 11 ) composed of a glass substrate. Each of electron source elements ( 10 a) includes a lower electrode ( 12 ), a buffer layer ( 14 ) composed of an amorphous silicon layer formed on the lower electrode ( 12 ), a polycrystalline silicon layer ( 3 ) formed on the buffer layer ( 14 ), a strong-field drift layer ( 6 ) formed on the polycrystalline silicon layer ( 3 ), and a surface electrode ( 7 ) formed on the strong-field drift layer ( 6 ). The field emission-type electron source can achieved reduced in-plain variation in electron emission characteristics.
Abstract:
A field emission type electron source (10) is provided with a lower electrode (8) comprising a conductive layer, a high-field drift layer (6) including a drift part (6a) comprising oxidized or nitride porous semiconductor, and a surface electrode (7) comprising an Au thin film on a glass insulation substrate (11). A voltage is impressed so that the surface electrode (7) may be positive to the lower electrode (8), and electrons injected from the lower electrode (8) into the high-field drift layer (6) drift this layer (6) and are emitted outside through the surface electrode (7). A pn-junction semiconductor layer consisting of an n-layer (21) and a p-layer (22) is provided between the lower electrode (8) and the high-field drift layer (6). Thus, a leakage current is prevented from flowing from the lower electrode (8) to the surface electrode (7), and a power consumption is reduced.
Abstract:
PROBLEM TO BE SOLVED: To provide a manufacturing method of a sensor device, having high reliability even if its miniaturization or height lowering is realized. SOLUTION: This method has a process A for manufacturing a cover substrate 1; a process B for bonding the cover substrate 1 to a through hole wiring formation substrate 11 in the further depressurized state than an atmospheric pressure, storing a sensor element 3 in a recessed part airtightly, and manufacturing the sensor device 100A; and a process C for deforming the cover substrate 1 so that a recessed part inner bottom surface approaches the sensor element 3, by arranging the sensor device 100A in the air. In the process A, the recessed part is formed with the inner bottom surface being separated from the sensor element 3, as going toward the center. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an acceleration sensor capable of easily recognizing operation in each of a plurality of directions where the acceleration can be detected. SOLUTION: The acceleration sensor comprises a sensor substrate 1 that has gauge resistors Rx1-Rx4, Ry1-Ry4 and Rz1-Rz4 disposed in a movable section formed of a weight section 12 and four bending sections 13 and can detect accelerations in three directions, a first cover substrate 2 joined to one surface side of the sensor substrate 1, and a second cover substrate 3 joined to the other surface side of the sensor substrate 1. A package is constituted by the cover substrates 2 and 3 and a frame section 11 of the sensor substrate 1. The acceleration sensor has, as a driving means for operation recognition for forcibly moving the movable section with an electromagnetic force, a plurality of pairs of excitation sections 26 formed of coils and disposed on the first cover substrate 2 and magnetic coupling sections 15 that are disposed in the weight section 12 and can magnetically couple to the excitation sections 26, and can generate the electromagnetic force for operation recognition independently every pair of excitation section 26 and magnetic coupling section 15. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a sensor device capable of improving the manufacturing yield of the sensor device manufactured by using at least a sensor substrate, where a sensor and an IC cooperating with the sensor are formed at the side of the main surface of a semiconductor substrate, and a substrate for packages where a plurality of through-hole wires connected to the sensor electrically are formed; and to provide a manufacturing method of the sensor device. SOLUTION: A metal layer 18 for sealing and a metal layer 19 for electrical connection are formed on a surface insulating film 16 by etching back a part formed at a region E3 for junction in a multilayer insulating film, comprising a surface insulating film 16 and a multilayer structure section 41 formed at the side of the main surface of an SOI semiconductor substrate 10. A weight 12, a deflector 13, and the like of a sensor E1 are formed, the sensor substrate 1 is joined to a second substrate 3 for packages at normal temperatures, and the metal layers 18, 28 for sealing of the sensor substrate 1 and the first substrate 2 for packages, and the metal layers 19, 29 for electrical connection are joined directly. COPYRIGHT: (C)2008,JPO&INPIT