公开(公告)号：WO2013052642A9

公开(公告)日：2014-06-05

申请号：PCT/US2012058716

申请日：2012-10-04

Applicant: MICROCHIP TECH INC

Inventor： LUNDSTRUM ZEKE ,  CURTIS KEITH ,  DAVISON BURKE ,  STEEDMAN SEAN ,  LEFAOU YANN

IPC: H03K17/96

CPC classification number: H03K17/9622 ,  H03K2217/960705 ,  H03K2217/960725 ,  H03K2217/960765

Abstract: An analog-to-digital (ADC) controller is used in combination with a digital processor of a microcontroller to control the operation of capacitance measurements using the capacitive voltage division (CVD) method. The ADC controller handles the CVD measurement process instead of the digital processor having to run additional program steps for controlling charging and discharging of a capacitive touch sensor and sample and hold capacitor, then coupling these two capacitors together, and measuring the resulting voltage charge thereon in determining the capacitance thereof. The ADC controller may be programmable and its programmable parameters stored in registers.

Abstract translation: 模拟数字（ADC）控制器与微控制器的数字处理器组合使用，以使用电容分压（CVD）方法控制电容测量的操作。 ADC控制器处理CVD测量过程，而不是数字处理器必须运行额外的程序步骤，用于控制电容式触摸传感器和采样和保持电容器的充电和放电，然后将这两个电容器耦合在一起，并测量其上产生的电压电荷 确定其电容。 ADC控制器可以是可编程的，其可编程参数存储在寄存器中。